An X-ray inspection apparatus includes a conveyance unit configured to convey articles, an X-ray irradiation unit configured to irradiate the articles conveyed by the conveyance unit with X-rays, an X-ray detection unit configured to detect X-rays transmitted through the articles, an image generation unit configured to generate an X-ray transmission image based on a detection result by the X-ray detection unit, and a calculation unit configured to calculate, based on the X-ray transmission image, the total amount of the articles conveyed per predetermined time by the conveyance unit.

A real-time inline digital tomosynthesis system according to an embodiment of the present disclosure includes a subject moving rail configured to move a subject in a preset direction and at a preset speed, a pair of an X-ray generator and an X-ray detector fixedly provided to face each other in a first direction of the subject moving rail, a subject position identifier configured to identify and notify a current position of the subject based on an image or a sensor, and an image reconstructor configured to obtain a plurality of X-ray images having different subject positions through the X-ray detector based on the current position of the subject, and then reconstruct and output the plurality of X-ray images as at least one of a tomographic image for each section and one three-dimensional (3D) image.

Scanning systems and related methods are provided. The scanning systems and methods may be computed tomography (CT) based scanning systems and methods. According to some aspects, the scanning systems have a reduced size compared to conventional scanning systems and may have similar throughput to some conventional scanning systems. According to some aspects, the scanning systems are reconfigurable into at least two scanning arrangements. Reduced size and/or reconfigurable scanning systems can allow an operator to dispose a scanning system in an environment that would not accommodate a conventional scanning system. Accordingly, the scanning systems described herein can provide enhanced security in some environments.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.

Various tray inserts, methods and algorithm for certifying candidate trays for use in an X-ray scanner system are discussed. The tray insert includes at least a body having multiple parts positioned for generation of image quality metrics for tray impact evaluation in; a first cover and a second cover disposed at opposite ends to fix and secure the body. The method including running an algorithm to control an X-ray system to collect baseline image data from certified trays, collecting candidate tray image data, extracting image quality metrics for both the baseline image data and the candidate tray image data, and performing statistical analysis using and comparing image quality metrics from the baseline image data and the candidate tray image data to certify the candidate tray based on the statistical and comparison results.

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy includes an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by the product sample and generating a signal received that can be analysed to determine a chemical composition of the product sample and selecting a type of product corresponding to said chemical composition of the product sample. The apparatus includes a first vacuum chamber located between an output of the apparatus facing the product sample and the X-ray source, and a second vacuum chamber located between the output of the apparatus facing the product sample and the detector. The apparatus also includes an optical module with polycapillary lens located downstream of the X-ray source, which is configured for focusing the X-ray beam and is associated in a vacuum-tight way to the first vacuum chamber.

A scanner comprises an electromagnetic wave source; a collimator positioned to alter the electromagnetic waves emitted from the electromagnetic wave source into an electromagnetic beam; and a detector positioned to measure one or more levels of electromagnetic energy of the electromagnetic beam, wherein a collimator element is spatially adjustable in at least one axis via one or more adjusting mechanisms to change the one or more levels of electromagnetic energy measured the detector.

Described herein is a high-energy x-ray imaging system including a stationary gantry, a conveyor assembly configured to convey an object to be imaged through the gantry, a plurality of linear accelerators, a detector array, and a control system. The linear accelerators are arranged in an array within the gantry and are configured to generate high-energy x-ray fan beams to be transmitted through the object. The detector array is positioned opposite the linear accelerators and is configured to collect the high-energy x-ray fan beams transmitted through the object. The control system is configured to energize the linear accelerators according to a predetermined control sequence to generate the high-energy x-ray fan beams, and construct a 3-D image of the object based on data received from the detector array and representative of the high-energy x-ray fan beams transmitted through the object.

The present invention relates to an apparatus and a method for inspecting battery cells for automation of total inspection. To this end, the present invention is configured such that test objects are sequentially stacked on a test object casing provided on an upper portion of a mounting stage of a main stage, images of the test objects are obtained by radiography after the test object casing is moved to a test object inspection unit, and the test objects stacked on the test object casing are unloaded to the outside after the images are obtained. Accordingly, the present invention enables total inspection to be performed on battery cells, which are the test objects, in order to quickly divide good and defective products, and solves a delay of a flow rate caused by X-ray inspection of the test object inspection unit in order to improve productivity and efficiency.

The present invention provides a method of inspecting a surface including detecting a presence or absence of a defect derived from a surface irregularity part of a planar inspection object to be conveyed in a predetermined direction, using a change in intensity of inspection light, the inspection light including at least two inspection lights that are parallel to a surface of the inspection object in a side view of the inspection object and pass over the surface of the inspection object or through the inspection object in a direction intersecting the conveyance direction in a plan view of the inspection object, the two inspection lights being non-parallel to each other in the plan view.