A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.

An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.

A phantom for use in quality control of tomographic images, the phantom including a cylindrical plate made of a uniform material having a density d1, with two cylinders being inserted in the plate, the cylinders being made out of uniform materials having different densities d2, d3, the density of one of the cylinders being greater than the density d1 of the plate, and the density of the other cylinder being less than the density d1 of the plate, and including a first series of pairs of holes of different diameters drilled in the plate, the axes of the holes of the first series being oriented axially relative to an axis of revolution of the plate, and the holes in a given pair being spaced apart from each other by a distance equal to their diameter.

Provided is a portable XRF data screening method for heavy metal contaminated soil, relating to the technical field of heavy metal contamination test. The method includes the following steps: (1) laboratory test; (2) XRF test; and (3) calculation of a recheck interval: dividing test data into four areas by a contaminant screening value X.sub.c as a horizontal line and a correlation-derived site screening value as a vertical line to calculate the recheck interval. The method is simple and efficient, and is beneficial to saving investigation costs and shortening a project cycle.

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

Regarding to a fiber-reinforced material formed by deforming a reinforcing material composed of a plurality of fiber layers from an initial shape and molding into a predetermined shape, an identification device, an identification method, and an identification program generate a first data in which a physical quantity distribution inside the fiber-reinforced material is mapped to the initial shape, perform binarization of the first data to generate a second data in which a label identifying the fiber layer is mapped to the initial shape, and map the second data to a predetermined shape, based on a deformation data.

A compression moulding machine comprises: an extrusion unit configured to extrude a rod of pasty polymeric material; a cutting element, configured to portion the rod into individual charges; a rotary carousel, including a plurality of moulds, each mould being configured to receive a respective charge and to form a corresponding object from the charge; a feeder, configured to convey each charge to a respective mould at a feed position; an inspecting device, configured to capture inspection data, representing a composition of the rod or of the charges.

There is described a method for inspecting a structure across a cover layer covering the structure. The method generally has emitting a high energy photon beam along a photon path extending across said cover layer and leading to a target point within said structure, resulting in scattering along at least first and second scatter paths originating from said target point and extending across said cover layer and away therefrom, said first and second scatter paths forming a respective angle relative to said cover layer and defining an inspection plane comprising at least the target point; simultaneously detecting a first scatter signal incoming from said first scatter path and detecting a second scatter signal incoming from said second scatter path, and generating first and second values indicative therefrom; comparing said first and second values to one another; and inspecting said structure based on said comparing.

A measurement system is provided that includes a radiographic source, a detector, and at least one processor. The at least one processor is operably coupled to the detector and configured to: position the radiographic source in a first position relative to the object to image a first portion of the object, with the first position configured to maintain parallax for the first portion within a predetermined amount; obtain first imaging information of the first portion of the object in the first position; adjust the position of the radiographic source relative to the object to a second position, with the second position configured to maintain parallax for the second portion within a predetermined amount; obtain second imaging information of the second portion of the object in the second position; and generate an image of the object using the first imaging information and the second imaging information.