An inspection device includes: an electromagnetic wave irradiator that irradiates, with a predetermined electromagnetic wave from a first film side, the package that is conveyed along a predetermined direction and that has the spaces at a plurality of positions in a width direction; an imaging device that is disposed opposed to the electromagnetic wave irradiator across the package, includes an electromagnetic wave detector including a plurality of detection elements that is arrayed along the width direction and that detects the electromagnetic wave radiated from the electromagnetic wave irradiator and transmitted through the package, and sequentially outputs an obtained electromagnetic wave transmission image every time the package is conveyed by a predetermined amount; and an image processing device that processes an image signal output from the imaging device.

A ball-mapping system connectable to an X-ray diffraction apparatus, for collecting X-ray diffraction data at measurement points located on a ball-shaped sample is provided. The system includes a sample stage, including a sample-contacting surface and a guide assembly cooperating with the sample-contacting surface for guiding the sample-contacting surface along a first axis and along a second axis unparallel to the first axis. The system includes a sample holder for keeping the ball-shaped sample in contact with the sample stage and a motor assembly in driving engagement with the guide assembly, the motor assembly driving the sample-contacting surface in translational movement along the first axis and the second axis, the translational movement of the sample-contacting surface causing the ball-shaped sample to rotate, on the sample-contacting surface along the first axis and the second axis. A method for mapping the ball-shaped sample is also provided.

The wood tracking system for a production line generally has a wood product optimizer; a wood product trimmer downstream from the optimizer in the production line; a conveyor for moving wood products from the optimizer to the trimmer and across a handling area therebetween, the optimizer being configured to scan each of the wood products in a given order and to generate optimization data for each wood product; and a computer vision system positioned proximate the handling area along the production line, the computer vision system having a camera, a processor in communication with the optimizer and with the trimmer and a computer-readable memory for storing the optimization data, the processor being configured to acquire images of the handling area from the camera, the processor being configured to associate the optimization data of a given wood product across each of the images until it arrives at the trimmer.

A system for non-destructive examination of three-dimensional (3D) printed objects includes a muon source directs muon particles at and through the 3D object and a muon detector receives the muon particles from the muon source to produce a muon signal which is representative of the 3D object. A first computing device executes an algorithm to analyze the muon signal. The analysis comprises creating a 3D rendering of the 3D object based upon the muon signal; preparing a physics-based digital model of the 3D object; and comparing the 3D rendered object to the digital model to identify defects within the 3D object. An augmented reality (AR) device and a second computing device may communicate with the first computing device and receive the 3d rendered object and the digital model. This can used on earth, in space, on a moon or asteroid or another planet as muons occur naturally in these environments.

An apparatus (20) for carrying out a quality control on industrial production lines (10), comprising one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (10), which supply respective one or more measurement signals, the apparatus (20) comprising a processing module configured for processing the one or more measurement signals and obtaining properties of the product sample (C), the quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) comprising: an x-ray fluorescence apparatus (30) that comprises an x-ray source (331), which emits a first x-ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a particle detector (335), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received signal supplied within the set of said respective one or more measurement signals. The apparatus (20) further comprises an optical-spectroscopy apparatus, preferably operating in the near infrared (40), which comprises a radiation source operating in the near infrared (NIR), which emits a first optleal-radiation beam towards a product sample (C), and an optical sensor for receiving a second optleal-radiation beam scattered by the product sample (C) and generating a second received signal supplied within the set of said respective one or more measurement signals.

An inspection line comprises: at a finish inspection station, a finish inspection installation capable of detecting without contact, by light rays, check-type defects in the neck of the containers; at a base inspection station, a base inspection installation capable of detecting without contact, by light rays, check-type defects in the base of the containers; and at a radiographic measuring station, a radiographic installation for automatically measuring linear dimensions of at least one region to be inspected of containers. The three installations are each arranged at stations distinct from each other along a trajectory of displacement of the containers. In each installation, a section of the transport device ensures, in the inspection area of the installation, the transport of the containers along a rectilinear portion of the trajectory (T) in a horizontal conveying plane (Pc) perpendicular to the central axis of the containers.

Methods and systems for improved monitoring of tool drift and tool-to-tool matching across large fleets of measurement systems employed to measure semiconductor structures are presented herein. One or more Quality Control (QC) wafers are measured by each of a fleet of measurement systems. Values of system variables are extracted from the QC measurement data associated with each measurement system using a trained QC encoder. The extracted values of the system variables are employed to condition the corresponding measurement model employed by each measurement tool to characterize structures under measurement having unknown values of one or more parameters of interest. Accurate tool-to-tool matching across a fleet of conditioned measurement systems is achieved by extracting values of system variables from measurement data collected from the same set of QC wafers. Tool health is monitored based on changes in values of system variables extracted from measurements performed at different times.

An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).

Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.

A method for producing a layer structure for the production of thin-film solar cells including: providing a carrier substrate, depositing a rear electrode layer on the carrier substrate, producing a rear-electrode-layer-free region, creating a measurement layer over the rear electrode layer such that the measurement layer is situated at least over the rear-electrode-layer-free region, wherein the measurement layer is a photoactive absorber layer or a precursor layer of the photoactive absorber layer, and determining a quantity or a relative share of a component of the measurement layer in a region of the measurement layer that is situated over the rear-electrode-layer-free region of the rear electrode layer.