A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

The present disclosure provides a system and method for a fiber-coupled, metal-tip chemical imaging spectroscopy. The system couples the electromagnetic radiation (EMR), such as laser light, through an optical fiber to a conductive tip for both EMR excitation to the sample through the conductive tip and EMR signal collection from the sample through the conductive tip. The system and method effectively eliminates the need for an optical alignment between the EMR source and the tip, and still offers the customary spatial resolution of a non-coupled system.

The present invention refers to a vibration damping connector (100) for reducing vibrations between a vibration prone system and an optical imaging system, said vibration damping connector comprising a first part (1) adapted to be connected to said optical imaging system, a second part (2) adapted to be connected to said vibration prone system, and at least one first shock absorbing element (3), a portion of said first part (1) is arranged inside a portion of said second part (2) along a central axis (A) or a portion of said second part (2) is arranged inside a portion of said first part (1) along a central axis (A) and said at least one flexible shock absorbing element (3) is arranged between said first part (1) and said second part (2), said vibration damping connector (100) further comprises at least one fastening device (4) for fastening said first part (1) to said second part (2) and said fastening device (2) presses said first part(1) to said second part (2) via a second shock absorbing element (5). Furthermore, use of the vibration damping. connector, in an optical system is disclosed.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.

The invention provides a nanoantenna scanning probe tip for microscropy or spectroscopy. The nanoantenna scanning probe tip includes a sharp probe tip covered with a contiguous film of predetermined sized and shaped plasmonic nanoparticles. A method for forming the nanoantenna scanning probe tip by trapping nanoparticles having a predetermined size and shape at a liquid surface using surface tension, forming a uniform and organized monolayer film on the liquid surface, and then transferring portions of the film to a sharp probe tip. In preferred embodiments, the sharp probe tip is one of a conductive STM (scanning tunneling microscopy) tip, a tuning fork tip or an AFM (atomic force microscopy) tip. The sharp tip can be blunted with an oxide layer.

Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 m or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip. The methods and apparatus also include the ability to analyze light reflected/scattered from the sample via a Raman spectrometer for complementary analysis by Raman spectroscopy. Using a UV/vis source or IR source at higher intensity it is possible to thermally desorb material from a sample for analysis by mass spectrometry. The AFM tip can also be heated to desorb material for mass spec analysis at even higher spatial resolution.

Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (TERS), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

Provided is a scanning probe microscope capable of performing observation with high accuracy even when a beam splitter is configured to be movable.

When checking positions of a sample and a cantilever in a scanning probe microscope, by disposing an optical microscope to face a first opening portion of a top surface of a housing, and by gripping and rotating an operating portion provided on a side surface of the housing, a user rotates and moves a beam splitter held by a holding portion in the housing, and retracts the beam splitter from the field of view of the optical microscope. Therefore, the beam splitter can always be disposed in the housing, and the user can be prevented from touching the beam splitter. As a result, it is possible to prevent the beam splitter from being damaged or stains from adhering to the beam splitter. Further, the moving distance of the bears splitter 6 can be shortened. Therefore, it is possible to suppress the occurrence of a deviation in the position of the beam splitter.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.