The present invention refers to a method for modifying a scanning probe microscope (SPM) tip, a modified SPM tip obtainable by the method, a modified SPM tip, to the use of the modified SPM tip, to a scanning probe comprising the modified SPM tip and to the use of the scanning probe.

The present invention refers to a method for modifying a scanning probe microscope (SPM) tip, a modified SPM tip obtainable by the method, a modified SPM tip, to the use of the modified SPM tip, to a scanning probe comprising the modified SPM tip and to the use of the scanning probe.

A detection apparatus used for detecting an object includes a first platform, a second platform and a plurality of screws. The first platform includes a plurality of first circuit boards that are joggle jointed and combined with each other, at least part of the first circuit boards are electrically connected to each other, and a carrying table for carrying the object to be detected is disposed on the first platform. The second platform includes at least one second circuit board, a detection module being disposed on the second platform for detecting the object, and the detection module is electrically connected to at least a part of the second circuit board. The screws are connected between the first platform and the second platform. The detection apparatus is mainly made by joggle jointing the circuit boards, so that the manufacturing is easy, costs are low, and the detection apparatus is easy to assemble, has small volume and light weight, and is convenient to carry.

A detection apparatus used for detecting an object includes a first platform, a second platform and a plurality of screws. The first platform includes a plurality of first circuit boards that are joggle jointed and combined with each other, at least part of the first circuit boards are electrically connected to each other, and a carrying table for carrying the object to be detected is disposed on the first platform. The second platform includes at least one second circuit board, a detection module being disposed on the second platform for detecting the object, and the detection module is electrically connected to at least a part of the second circuit board. The screws are connected between the first platform and the second platform. The detection apparatus is mainly made by joggle jointing the circuit boards, so that the manufacturing is easy, costs are low, and the detection apparatus is easy to assemble, has small volume and light weight, and is convenient to carry.

Provided are an apparatus and a method for identifying a target position in an atomic microscope. An apparatus is configured to acquire result data identifying the cantilever from an image using an identification model learned to identify the cantilever based on the image photographed by a photographing unit, and calculate a target position from the cantilever using the acquired result data, in which the result data include at least one of bounding box data representing a bounding box including a boundary of the cantilever and segmentation data obtained by segmenting the cantilever and an object other than the cantilever.

Provided are an apparatus and a method for identifying a target position in an atomic microscope. An apparatus is configured to acquire result data identifying the cantilever from an image using an identification model learned to identify the cantilever based on the image photographed by a photographing unit, and calculate a target position from the cantilever using the acquired result data, in which the result data include at least one of bounding box data representing a bounding box including a boundary of the cantilever and segmentation data obtained by segmenting the cantilever and an object other than the cantilever.

A detection device having an attached probe, the detection device including a base body (100) and a probe (200). The base body (100) is provided with a stage (140), the probe (200) is provided with a probe base body (210) and a tip (220) extending from a side surface of one end of the probe base body (210), another end of the probe base body (210) is adhered to the base body (100) via an adhesion piece (230), the probe base body (210) can be removed from the base body (100), and the tip (220) is close to the stage (140) and deployed in the direction thereof. The probe base body (210) is directly attached to the base body (100) and easily removed therefrom. It is therefore easy to replace the probe (200).

A detection device having an attached probe, the detection device including a base body (100) and a probe (200). The base body (100) is provided with a stage (140), the probe (200) is provided with a probe base body (210) and a tip (220) extending from a side surface of one end of the probe base body (210), another end of the probe base body (210) is adhered to the base body (100) via an adhesion piece (230), the probe base body (210) can be removed from the base body (100), and the tip (220) is close to the stage (140) and deployed in the direction thereof. The probe base body (210) is directly attached to the base body (100) and easily removed therefrom. It is therefore easy to replace the probe (200).

The method for detecting mechanical and magnetic features comprises the steps of: aiming a probe of the sensor at a sample; defining several detected points for detection on the sample; detecting one of points and comprising the steps of: approaching the probe to the detected point from a predetermined height; contacting the probe with the detected point and applying a predetermined force on the detected point; making the probe far away from the detected point until to the predetermined height; shifting the probe to the next point for detection and repeating the detection; collecting the data of each of the detected points while the probe rapidly approaches to the points from the predetermined height; using a signal decomposition algorithm to transform the collected data to a plurality of data groups; and choosing a part of the data groups to be as data of feature distributions of the sample.

The method for detecting mechanical and magnetic features comprises the steps of: aiming a probe of the sensor at a sample; defining several detected points for detection on the sample; detecting one of points and comprising the steps of: approaching the probe to the detected point from a predetermined height; contacting the probe with the detected point and applying a predetermined force on the detected point; making the probe far away from the detected point until to the predetermined height; shifting the probe to the next point for detection and repeating the detection; collecting the data of each of the detected points while the probe rapidly approaches to the points from the predetermined height; using a signal decomposition algorithm to transform the collected data to a plurality of data groups; and choosing a part of the data groups to be as data of feature distributions of the sample.