A measurement system including a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner The measurement device includes a control circuit. The first probe unit includes an interface module being configured to receive a user input, to generate an input data signal based on the received user input, and to provide the input data signal to the control circuit. The control circuit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. At least the second probe unit is configured to adjust an operational parameter based on the control signal, wherein the operational parameter relates to a measurement parameter to be measured Moreover, a method for operating a measurement system is disclosed.

An analysis apparatus, which is for analyzing a state of inspection of an object to be inspected having inspection target devices formed on the object to be inspected by using a probe card having probes formed on the probe card and configured to be brought into contact with the inspection target devices, includes a display part configured to display an image and an image creator configured to create the image to be displayed on the display part, wherein the image creator creates, based on a result of detecting at least one of heights of the probes in portions of the probe card and heights of the inspection target devices in portions of the inspection object, a height map image showing a distribution of the heights of at least one of the probes and the inspection target devices.

The present disclosure provides a switching matrix system and an operating method thereof for semiconductor characteristic measurement. The switching matrix system is configured to: detect an assembly of at least one switching matrix module inserted into a plurality of slots of the switching matrix system; determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes an operable object corresponding to the assembly; and provide the user interface.

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.

Described herein are techniques related to a semiconductor fabrication process that facilitates the enhancement of systemic conformities of patterns of the fabricated semiconductor wafer. A semiconductor wafer with maximized systemic conformities of patterns will maximize the electrical properties and/or functionality of the electronic devices formed as part of the fabricated semiconductor wafer. This Abstract is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

The present disclosure provides for improving security in a meter or an intelligent electronic device (IED) through the use of a security key which is unique to each meter or IED. Such a key may be used to prevent password reuse among multiple meters. Such a key may also be used to encrypt critical components of the software, such that only when running on the correct meter can the components of the software be decrypted. Such a key may also be used to uniquely identify the device in a larger data collection and management system. The security key can also be used to prevent the direct copying of meters. The present disclosure also provides for a meter or IED that stores functional software separately from core software.

Systems, devices, and operating methods thereof provide for operation of a display based on detection of defined electrical conditions. Measurement devices may include a housing sized and shaped to be held in a hand, a set of sensor devices for sensing a set of electrical characteristics, processing circuitry, and a display supported by the housing. The measurement devices receive measurements obtained from the sensor devices and determine whether the measurements satisfy criteria for detecting defined electrical conditions in an element under test. Operating modes of the display having different corresponding illumination characteristics are controlled as a result of determining the presence of defined electrical conditions in the element under test.

A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.

A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

A calibrator having an enhanced user interface (UI) is provided. The calibrator outputs, over an output terminal of the calibrator, an electrical signal. The calibrator presents, on a display of the calibrator, a graphical indication associated with an electrical quantity of the electrical signal. The calibrator or a controller thereof synchronizes a color of the graphical indication with a color emitted by a light indicator associated with the output terminal. The calibrator presents, together with the graphical indication, a signal property GUI element that is selectable and representative of a signal property associated with the electrical signal. In response to user selection of the signal property GUI element, the calibrator displays an editable GUI element permitting user modification of the signal property and the calibrator modifies the electrical signal according to user input.