A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a pin area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid is provided with a second magnetic attraction member. When the protective lid covers the probe pin area, and the second magnetic attraction member inserts into the bore hole, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other.

A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a pin area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid is provided with a second magnetic attraction member. When the protective lid covers the probe pin area, and the second magnetic attraction member inserts into the bore hole, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other.

A probe unit and a holder of a measurement apparatus that can be releasably connected to one another, particularly without tools, are disclosed. The probe unit includes a mounting device having a contact surface and the holder comprises a counter-contact surface assigned to the contact surface. The contact surface can be divided into multiple separate surface sections that respectively abut along a line or two-dimensionally against the assigned counter-contact surface, if the mounting device takes a contact position. The holding force is produced by at least one mounting magnet of the mounting device and/or at least one holding magnet of the holder. Thereby a magnetic axial force in an axial direction as well as a magnetic circumferential force in a circumferential direction around the axial direction is created, so that the mounting device and holder are urged relative to one another in a desired rotational position in the circumferential direction.

A probe unit and a holder of a measurement apparatus that can be releasably connected to one another, particularly without tools, are disclosed. The probe unit includes a mounting device having a contact surface and the holder comprises a counter-contact surface assigned to the contact surface. The contact surface can be divided into multiple separate surface sections that respectively abut along a line or two-dimensionally against the assigned counter-contact surface, if the mounting device takes a contact position. The holding force is produced by at least one mounting magnet of the mounting device and/or at least one holding magnet of the holder. Thereby a magnetic axial force in an axial direction as well as a magnetic circumferential force in a circumferential direction around the axial direction is created, so that the mounting device and holder are urged relative to one another in a desired rotational position in the circumferential direction.

The invention relates to a test contact (10) comprising a contact tip (11) and a contact body (12), the test contact (10) having an erecting direction (13) and the test contact (10) comprising a core (14) made of a ferromagnetic material, the core being disposed below a center of gravity (15) of the test contact (10) in the erecting direction (13). Furthermore, the invention relates to a table device (20) for handling a test contact (10) and to a method for handling a test contact (10) by means of the table device (20). The invention also relates to a test contact holding device comprising a test contact holder (40) for handling a test contact (10) and to a method for handling a test contact (10) by means of the test contact holding device comprising the test contact holder (40).

A wafer testing cassette is provided. The wafer testing cassette includes a first housing, a second housing and a magnetic force generating assembly. The first housing include a probe card, the probe card includes at least one probe having a paramagnetic property. The second housing is combined with the first housing and has a magnetic force generating assembly arranged corresponding to the at least one probe. A wafer located in the second housing, and the at least one probe electrically contacts at least one pad of the wafer with a predetermined contact force. When the magnetic force generating assembly is configured to generate a first magnetic attraction force, the magnetic force generating assembly attracts the at least one probe, so that the at least one probe electrically contacts the at least one pad with a first contact force which is greater than or equal to the predetermined contact force.

A wafer testing cassette is provided. The wafer testing cassette includes a first housing, a second housing and a magnetic force generating assembly. The first housing include a probe card, the probe card includes at least one probe having a paramagnetic property. The second housing is combined with the first housing and has a magnetic force generating assembly arranged corresponding to the at least one probe. A wafer located in the second housing, and the at least one probe electrically contacts at least one pad of the wafer with a predetermined contact force. When the magnetic force generating assembly is configured to generate a first magnetic attraction force, the magnetic force generating assembly attracts the at least one probe, so that the at least one probe electrically contacts the at least one pad with a first contact force which is greater than or equal to the predetermined contact force.