An apparatus and a method for indirectly cooling a superconducting quantum interference device (SQUID) are provided. The apparatus includes an outer container extending in a vertical direction; a metallic inner container inserted into the outer container to store a liquid coolant, the metal inner container including a top plate; a SQUID sensor module disposed between a bottom surface of the outer container and a bottom surface of the inner container; a heat transfer pillar adapted to cool the SQUID sensor module, the heat transfer pillar having one end connected to the bottom surface of the inner container and the other end directly or indirectly connected to the SQUID sensor module; a magnetic shield part formed of a superconductor covering a top surface of the SQUID sensor module; and a heat conduction plate being in thermal contact with the other end of the heat transfer pillar.

The invention relates to a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor. The test block comprises a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be assembled in a dismountable manner with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving by plugging a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. A test appliance is also described.

The invention relates to a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor. The test block comprises a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be assembled in a dismountable manner with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving by plugging a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. A test appliance is also described.

There is described a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor, the test block comprising a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be removably assembled with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving, by plugging, a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. The base and the protective cover comprise electrically conductive elements linked to each other and configured so as to ensure a continuity and magnetic shielding closure such that the enclosure delimited by the base and the protective cover is a Faraday cage protecting the inner electric circuits relative to the magnetic fields external to the enclosure delimited by the base and the protective cover.

There is described a test block intended to be implanted in the circuit connecting an apparatus to be tested such as an electricity meter or a protective relay and a power source supplying the apparatus to be tested such as an intensity sensor and/or a voltage sensor, the test block comprising a base including a plurality of inner electric circuits capable of allowing the transmission of information from the power source to the apparatus to be tested and a protective cover intended to be removably assembled with the base in order to form a closed enclosure in which the inner electric circuits are housed. The base and the protective cover are configured such that the removal of the protective cover gives access to a receiving site delimited by the base and capable of receiving, by plugging, a test plug independent of the test block and electrically linked to a test equipment, in particular a voltmeter and/or an ammeter and/or a dummy current source. The base and the protective cover comprise electrically conductive elements linked to each other and configured so as to ensure a continuity and magnetic shielding closure such that the enclosure delimited by the base and the protective cover is a Faraday cage protecting the inner electric circuits relative to the magnetic fields external to the enclosure delimited by the base and the protective cover.

Shielded probe systems are disclosed herein. The shielded probe systems are configured to test a device under test (DUT) and include an enclosure that defines an enclosure volume, a translation stage with a stage surface, a substrate-supporting stack extending from the stage surface, an electrically conductive shielding structure, an isolation structure, and a thermal shielding structure. The substrate-supporting stack includes an electrically conductive support surface and a temperature-controlled chuck. The electrically conductive shielding structure defines a shielded volume. The isolation structure electrically isolates the electrically conductive shielding structure from the enclosure and from the translation stage. The thermal shielding structure extends within the enclosure volume and at least partially between the enclosure and the substrate-supporting stack.

Shielded probe systems are disclosed herein. The shielded probe systems are configured to test a device under test (DUT) and include an enclosure that defines an enclosure volume, a translation stage with a stage surface, a substrate-supporting stack extending from the stage surface, an electrically conductive shielding structure, an isolation structure, and a thermal shielding structure. The substrate-supporting stack includes an electrically conductive support surface and a temperature-controlled chuck. The electrically conductive shielding structure defines a shielded volume. The isolation structure electrically isolates the electrically conductive shielding structure from the enclosure and from the translation stage. The thermal shielding structure extends within the enclosure volume and at least partially between the enclosure and the substrate-supporting stack.

A resistor assembly can include a resistor having a first end and a second end, and a conductive member, where the conductive member is coupled to the first end of the resistor. The resistor assembly can also include a shield cup and a housing, where the housing includes at least one housing wall having at least one aperture, and where the housing encloses at least a portion of the resistor and at least a portion of the shield cup. A volume of space between the at least one housing wall of the housing and the resistor can be substantially filled with an insulating material and at least the outside of the housing is substantially covered with the insulating material.

The present invention relates to a signal measurement system (100, 200, 300) for measuring a signal, the system comprising a signal detection unit (41) for detecting a raw signal, a signal processing unit (42) and a signal cable (10) electrically connecting the signal detection unit (41) with the signal processing unit (42). The signal cable (10) comprises a signal conductor (1, 2) for electrically conducting a first signal from the signal detection unit (41) to the signal processing unit (42), which first signal comprises at least the raw signal, a reference conductor (11, 12) for detecting and electrically conducting to the signal processing unit (42) only a noise signal induced by a movement of the signal cable (10) or by electromagnetic interference. In this way the effect of noise on the signal quality is reduced caused by movement of the signal cable (10) or other sources of noise that induce a noise signal in the signal cable (10), such as electromagnetic interference, while at the same time not increasing the power usage or power loss.

The present invention relates to a signal measurement system (100, 200, 300) for measuring a signal, the system comprising a signal detection unit (41) for detecting a raw signal, a signal processing unit (42) and a signal cable (10) electrically connecting the signal detection unit (41) with the signal processing unit (42). The signal cable (10) comprises a signal conductor (1, 2) for electrically conducting a first signal from the signal detection unit (41) to the signal processing unit (42), which first signal comprises at least the raw signal, a reference conductor (11, 12) for detecting and electrically conducting to the signal processing unit (42) only a noise signal induced by a movement of the signal cable (10) or by electromagnetic interference. In this way the effect of noise on the signal quality is reduced caused by movement of the signal cable (10) or other sources of noise that induce a noise signal in the signal cable (10), such as electromagnetic interference, while at the same time not increasing the power usage or power loss.