G01R1/24

Signal measuring system, method for electrically conducting signals and a signal cable

The present invention relates to a signal measurement system (100, 200, 300) for measuring a signal, the system comprising a signal detection unit (41) for detecting a raw signal, a signal processing unit (42) and a signal cable (10) electrically connecting the signal detection unit (41) with the signal processing unit (42). The signal cable (10) comprises a signal conductor (1, 2) for electrically conducting a first signal from the signal detection unit (41) to the signal processing unit (42), which first signal comprises at least the raw signal, a reference conductor (11, 12) for detecting and electrically conducting to the signal processing unit (42) only a noise signal induced by a movement of the signal cable (10) or by electromagnetic interference. In this way the effect of noise on the signal quality is reduced caused by movement of the signal cable (10) or other sources of noise that induce a noise signal in the signal cable (10), such as electromagnetic interference, while at the same time not increasing the power usage or power loss.

Signal measuring system, method for electrically conducting signals and a signal cable

The present invention relates to a signal measurement system (100, 200, 300) for measuring a signal, the system comprising a signal detection unit (41) for detecting a raw signal, a signal processing unit (42) and a signal cable (10) electrically connecting the signal detection unit (41) with the signal processing unit (42). The signal cable (10) comprises a signal conductor (1, 2) for electrically conducting a first signal from the signal detection unit (41) to the signal processing unit (42), which first signal comprises at least the raw signal, a reference conductor (11, 12) for detecting and electrically conducting to the signal processing unit (42) only a noise signal induced by a movement of the signal cable (10) or by electromagnetic interference. In this way the effect of noise on the signal quality is reduced caused by movement of the signal cable (10) or other sources of noise that induce a noise signal in the signal cable (10), such as electromagnetic interference, while at the same time not increasing the power usage or power loss.

MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TESTING
20170229753 · 2017-08-10 ·

Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.

MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TESTING
20170229753 · 2017-08-10 ·

Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. As such, embodiments of the present disclosure allow more waveguides to be packed into a small area by providing a single structure that houses many waveguides and share only a single flange connection element that can be sized appropriately.

WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TESTING
20170229754 · 2017-08-10 ·

Embodiments of the present disclosure utilize customizable waveguide fabrication technologies (e.g., 3D printer technology) and patch antenna arrays to create adaptable wave interfaces that can provide efficient signal routing for an ATE system. In this fashion, embodiments of the present disclosure allow for arbitrary waveguide routing from port to port and create high density port spacing at the PCB level and which specifically eliminates the large flange required of prior art waveguides. Furthermore, embodiments include the ability to integrate different waveguide components, including power splitters, couplers, terminations, etc., into a single structure. Thus, embodiments of the present disclosure can reduce signal path losses and simplify the mechanical construction of ATE systems while eliminating the need for coax cables and minimizing the length of PCB microstrips.

WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUCTOR TESTING
20170229754 · 2017-08-10 ·

Embodiments of the present disclosure utilize customizable waveguide fabrication technologies (e.g., 3D printer technology) and patch antenna arrays to create adaptable wave interfaces that can provide efficient signal routing for an ATE system. In this fashion, embodiments of the present disclosure allow for arbitrary waveguide routing from port to port and create high density port spacing at the PCB level and which specifically eliminates the large flange required of prior art waveguides. Furthermore, embodiments include the ability to integrate different waveguide components, including power splitters, couplers, terminations, etc., into a single structure. Thus, embodiments of the present disclosure can reduce signal path losses and simplify the mechanical construction of ATE systems while eliminating the need for coax cables and minimizing the length of PCB microstrips.

ORTHOGONAL FIELD PROBES
20170219630 · 2017-08-03 ·

Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.

ORTHOGONAL FIELD PROBES
20170219630 · 2017-08-03 ·

Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.

Quantum power sensor and method of measuring power in transmission lines

A quantum power sensor has a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line includes coupling a two-level quantum system to the transmission line; and determining the coupling and the Rabi frequency of the two-level system.

Quantum power sensor and method of measuring power in transmission lines

A quantum power sensor has a two-level quantum system strongly coupled to a transmission line that supports a propagating wave. A method of measuring power in a transmission line includes coupling a two-level quantum system to the transmission line; and determining the coupling and the Rabi frequency of the two-level system.