An X-ray detector includes an N-channel digital-analogue converter controllable with K+L bits. In an embodiment, the digital-analogue converter includes a first voltage source to provide a plurality of first voltage values at tapping points; and a switch unit with N switch matrices, 2.sup.K inputs of the switch matrices being electrically conductively connected to 2.sup.K tapping points of the first voltage source. The digital-analogue converter also includes a second voltage source including N subunits. The X-ray detector further includes a discriminator unit including N comparators, at least one input of the comparators being electrically conductively connected to the associated output of the switch matrix and/or to the associated output of the subunit, so that the associated first voltage value and the associated second voltage value are associable with each comparator. A signal of an output of a pre-amplifier, and the associated first and second voltage values are comparable in the comparator.

Aspects of the subject disclosure may include, a system having an absorber and a coupling device. The absorber includes absorbent material that absorbs radiation. The coupling device is positioned in and surrounded by the absorber. The coupling device facilitates transmitting or receiving of an electromagnetic wave along a transmission medium, where the electromagnetic wave propagates along the transmission medium without requiring an electrical return path. Other embodiments are disclosed.

An example waveguide connector is for making a blind-mate electrical connection between a first waveguide and a second waveguide. The waveguide connector includes a male part connected to the first waveguide, where the first waveguide includes a first conductive channel, and a female part connected to the second waveguide, where the second waveguide includes a second conductive channel. The female part includes a receptacle into which the male part slides to create the blind-mate electrical connection between the first conductive channel and the second conductive channel. A self-alignment feature is on at least one of the male part or the female part. The self-alignment feature is configured to guide the male part into the receptacle while correcting for misalignment of the male part and the female part.

An example waveguide connector is for making a blind-mate electrical connection between a first waveguide and a second waveguide. The waveguide connector includes a male part connected to the first waveguide, where the first waveguide includes a first conductive channel, and a female part connected to the second waveguide, where the second waveguide includes a second conductive channel. The female part includes a receptacle into which the male part slides to create the blind-mate electrical connection between the first conductive channel and the second conductive channel. A self-alignment feature is on at least one of the male part or the female part. The self-alignment feature is configured to guide the male part into the receptacle while correcting for misalignment of the male part and the female part.

An over-the-air (OTA) wireless test system includes a container, a machine plate disposed on the container, a supporter disposed on the machine plate, a load board disposed on the supporter, a socket disposed on the load board, a device under test (DUT) installed in the socket, and a wave-guiding feature in the socket and the load board configured to pass and guide electromagnetic waves to and/or from an antenna structure of the DUT. The wave-guiding feature comprises a wave-guiding channel in the socket defined by a plurality of pogo pins surrounding the antenna structure of the DUT. The wave-guiding feature may further comprise a radiation passage in the load board defined by rows of via fence extending through an entire thickness of the load board.

A test cable and a test method using the same are provided. The test cable includes a universal serial bus (USB) connector, a test terminal connector and a switch circuit. The USB connector is coupled to an electronic device and has a first pair of data pins and a second pair of data pins. The test terminal connector is coupled to a test fixture and has a pair of test data pins and a first control pin, and the test fixture is used for outputting a first control signal to the first control pin. The switch circuit is coupled to the first pair and second pair of data pins, the pair of test data pins and the first control pin, and couples the pair of test data pins to the first pair or second pair of data pins according to the first control signal.

A test cable and a test method using the same are provided. The test cable includes a universal serial bus (USB) connector, a test terminal connector and a switch circuit. The USB connector is coupled to an electronic device and has a first pair of data pins and a second pair of data pins. The test terminal connector is coupled to a test fixture and has a pair of test data pins and a first control pin, and the test fixture is used for outputting a first control signal to the first control pin. The switch circuit is coupled to the first pair and second pair of data pins, the pair of test data pins and the first control pin, and couples the pair of test data pins to the first pair or second pair of data pins according to the first control signal.

A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing, the housing further comprises a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.

A PIM test bench including a first duplexer, having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at first and second frequencies. A spectrum analyzer is connected to the second port. A device under test is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer is connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing, the housing further comprises a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.

Methods and devices suitable for monitoring the frequency of microwave tunable filters in real time. The frequency readout relies on the natural response of such a filter when excited by a pulse. Methods of measuring an operating frequency of a pole in a tunable filter include measuring a number of cycles in a natural response in the filter when the filter is excited by an electric current pulse, and determining a resonance frequency based on the number of cycles measured in the natural response. Such a method can provide the operating frequency information in a binary digital format, making it relatively easy to read and process. A measuring resonator may be mounted to the filter resonator and connected by a common actuator.