A system includes a surge protection circuit electrically connected via a signal transmission line between a source and an oscilloscope, and including a diode configured to be reverse biased, responsive to a voltage of the source being less than a threshold, to decouple an impedance of the circuit from the transmission line and forward biased, responsive to the voltage being greater than the threshold, to couple the impedance to absorb excess energy of the voltage.

A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.

A digital sampling oscilloscope (DSO) includes a housing, an analog measurement input interface arranged in a housing wall of the housing and a measurement acquisition system having a digitizer and an acquisition memory coupled to the digitizer. The measurement acquisition system is integrated into the housing and coupled to the analog measurement input interface. The DSO further includes a signal generator integrated into the housing. An operation mode control signal output interface is arranged in a housing wall of the housing. The signal generator is coupled to the operation mode control signal output interface and is configured to output an operation mode control signal to a device under test (DUT) connected to both the operation mode control signal output interface and the analog measurement input interface for controlling a test operation mode of the DUT.

The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

A waveform display device includes: an operation accepting unit for accepting operation by a user; and a display controller for generating waveform display screen including a program pattern waveform for program control and an actual measurement waveform based on measurement data obtained as a result of the program control, with the program pattern waveform and the actual measurement waveform being superimposed on each other, and a cursor indicating a section between a past time area showing a program pattern waveform and an actual measurement waveform in the past time and a future time area showing a future program pattern waveform. The operation accepting unit is configured to accept scroll operation for changing a position of the cursor in the waveform display screen. The display controller is configured to change the position of the cursor in the waveform display screen in accordance with the scroll operation.

A voltage measurement system has a voltage measuring device connected to a device under test by a voltage divider to drop high voltages (e.g., peaking at or above 100 kilovolts) at a measurement point to lower levels for processing by a voltage measurement and wireless printed circuit board. The voltage measuring device communicates raw measurement data wirelessly (e.g., via Bluetooth) to a remote device such as a mobile phone, laptop or portable meter head having a display and processing device programmed to calculate voltage measurements such has absolute average (ABS AVG), AC root mean square (RMS), +/peak voltage, and AC or DC coupling. The remote device can wirelessly communicate with multiple voltage measuring devices to capture raw measurement data therefrom for voltage measurement applications with multiple measurement points (e.g., three-phase measurement, and transformer testing).

A test and measurement instrument has an acquisition system to receive and digitize a batch of waveforms into a batch of digitized waveforms, a memory configured as a raster plane having rows and columns, a graphics processing unit (GPU) capable of processing multiple threads to rasterize the batch of digitized waveforms to the raster plane to form a batch histogram and to group multiple threads into groups of a first type of group, assign each thread group of the first type of group to one column in the raster plane, execute a common instruction per thread group of the first type to populate the raster plane, and transfer the batch histogram upon completion, and a central processing unit (CPU) to receive the batch histogram from the GPU, and display a map of the batch histogram on a display.

A method measures a characteristic of a SUT using a signal measurement device having multiple input channels. The method includes digitizing first and second copies of the SUT in first and second input channels to obtain first and second digitized waveforms; repeatedly determining measurement values of the SUT characteristic in the first and second digitized waveforms to obtain first and second measurement values, respectively, each second measurement value being paired with a first measurement value to obtain measurement value pairs; multiplying the first and second measurement values in each of the measurement value pairs to obtain measurement products; determining a mean-squared value (MSV) of the SUT characteristic measurement; and determining a square root of the MSV to obtain a root-mean-squared (RMS) value of the measured SUT characteristic, which substantially omits variations not in the SUT, which are introduced by only one of the first or second input channel.

A noise source monitoring apparatus includes: an imaging unit for capturing an image of multiple switch units; an event time acquisition unit for acquiring a noise event time of a noise occurring in a control device; a switching time recognition unit for recognizing an on/off switching time of each of the multiple switch units; a correlation calculation unit for calculating, for every switch unit, the degree of correlation between occurrence of the noise and the on/off switching of the switch unit; and a display control unit for causing a display unit to display information indicating the degree of correlation for every switch unit.

The present disclosure provides a measurement application device, comprising a signal interface that is configured to receive a signal that comprises at least two characterizing signal levels, a signal analyzer that is coupled to the signal interface and that is configured to analyze the received signal to determine individual sub-diagrams for the received signal, wherein each one of the sub-diagrams comprises a predetermined diagram type, a diagram processor coupled to the signal analyzer and a display, and arranges the sub-diagrams in a diagram arrangement where each one of the sub-diagrams is assigned a predetermined position in the diagram arrangement, and to control the display to display at least one of the sub-diagrams, and a user interface that receives user input with regard to the diagram arrangement where the diagram processor controls the displaying of the diagram arrangement by the display according to the user input.