A visual display of the modulation envelope of an amplitude-modulated RF electric field produced by a field analyzer comprising a field sensor for generating sequential digital samples of the field, a field processor connected to the field sensor for generating a web page, and a personal computer for retrieving and displaying the web page. By using a web page and displaying the web page on a personal computer, it is possible to carry out tasks, such as correcting for nonlinearity of a detector in the field sensor, in the personal computer where they can be performed more efficiently. The sequential samples, which represent the amplitude of the field received by the antenna, are held in a buffer memory, and a bit alignment correction circuit, responsive to the buffer memory, detects and corrects misalignment of the data bits in the buffer memory.

An arrangement for signal analysis provides at least one central data-processing unit and a screen unit connected to the at least one central data-processing unit, wherein the central data-processing unit calculates a spectrum and a spectrogram from a digitized signal. The at least one central data-processing unit is embodied in such a manner that it controls the screen unit in such a manner that the spectrogram of the digitized signal, the characteristic of the spectrum of the digitized signal and the characteristic of the digitized signal present in the time domain can be displayed together on the screen unit.

A measurement instrument for testing a device under test is described. The device under test has at least two test points. The measurement instrument includes a first measurement channel, a second measurement channel, and a machine-learning circuit. The first measurement channel is configured to process a first input signal associated with one of the at least two test points, thereby generating a first measurement signal. The second measurement channel is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning circuit is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system and a signal processing method are described.

A scheme for noise floor de-embedding by identifying a link or relationship between noise floor from an oscilloscope and phase jitter impact on a toggling signal. The scheme uses phase or electrical spectrum and phase detection for noise floor recognition. The scheme de-embeds the impact from random noise and also removes deterministic noise or jitter from the oscilloscope. The scheme provides accurate jitter analysis for a circuit (e.g., clock data recovery circuit) after de-embedding noise floor for the oscilloscope

A system to classify signals includes an input to receive incoming waveform data; a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a ramp sweep signal from the incoming waveform data, locate a data burst in the incoming waveform data using a burst detector, receive a signal from the burst detector to cause the memory to store cyclic loop image data in the form of the incoming waveform data as y-axis data and the ramp sweep signal as x-axis data, and employ a machine learning system to receive the cyclic loop image data and classify the data burst. A method of classifying signals includes generating a ramp sweep signal from incoming waveform data, locating a data burst in the incoming waveform data, storing cyclic loop image data for the data burst in the form of the incoming waveform data as Y-axis data and the ramp sweep signal as X-axis data, and using a machine learning system to receive the cyclic loop image and classify the data burst.

The present invention discloses a waveform measuring method. It converts the waveform to be measured into two corresponding square waves by two comparators. When the hardware logic device receives the signal from the host computer software to start waveform acquisition, it acquires two square waves and simultaneously starts the counter to count with a fixed high frequency clock. When the waveform is flipped, if the count value is less than the set filter value, the waveform is filtered out; if the count value is greater than the set filter value, the hardware logic device saves the waveform and count value and clears the counter to zero. The number of waveform flips is judged whether the set value is reached, and if not, the count is recounted; if it is reached, the waveform acquisition is stopped, and then the waveform and count values saved by the hardware logic device are read and optimized by the host computer software. According to the test requirements, the corresponding algorithm is executed, and the calculation results are output. It improves the accuracy and precision of the measurement and increases the flexibility of the measuring method.

A method for displaying measurement results comprises the steps of: displaying a first measurement result in a first tab window; creating a second tab window; changing at least one measurement device setting to display a second measurement result in the second tab window; and storing the second tab window.

A test and measurement device has a communications port configured to connect the test and measurement device to a network, a memory, and one or more processors configured to execute code to cause the processors to receive an original waveform through the communications port, the original waveform having an identified file type, store the original waveform in the memory, the original waveform having an original file size, compress the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notify one or more users that the compressed waveform is available, and upon receiving a request, transmitting the compressed waveform to a user device. A method of providing waveform data across a network includes receiving an original waveform through a communications port, the original waveform having an identified file type, storing the original waveform in a memory, the original waveform having an original file size, compressing the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notifying one or more users that the compressed waveform is available, and upon receiving a request, transmit the compressed waveform to a user device.

The invention relates to a measurement instrument, such as an oscilloscope, comprising a measurement unit adapted to receive an input signal, and a processing unit adapted to classify the input signal, preferably based on signal parameters or characteristics of the input signal. wherein the processing unit is adapted to determine a signal analysis category for the input signal based on said classification of the input signal, and to match the determined signal analysis category to a control configuration, which defines settings and/or configurations of the measurement instrument, based on an adjustment function. The measurement instrument further comprises a user interface configured to display at least one graphical representation, in particular a waveform, of the input signal based on the control configuration, wherein the user interface is adapted to receive a user input to modify the settings and/or configurations of the measurement instrument, and wherein the processing unit is configured to dynamically adapt the adjustment function based on said user input.

A test and measurement instrument includes a first channel input for accepting a first input signal, a second channel input for accepting a second input signal, a spectrogram processor for producing a first spectrogram from the first input signal and for producing a second spectrogram from the second input signal, and a display for simultaneously showing the first spectrogram and the second spectrogram. Methods are also described.