A method for performing a Bus autoset function is described. A maximum amplitude of an analog signal is detected. The analog signal is converted into a logical signal. A frame in the logical signal is detected. A scale of an output unit is set such that the whole frame is output. Further, a measurement device is described.

A method for performing a Bus autoset function is described. A maximum amplitude of an analog signal is detected. The analog signal is converted into a logical signal. A frame in the logical signal is detected. A scale of an output unit is set such that the whole frame is output. Further, a measurement device is described.

Embodiments include apparatuses, systems, and methods including a switching converter having an output stage including a power switch or first switching device to convert an input switching signal to an output switching signal and a sensor stage including a second switching device and a third switching device. In embodiments, the sensor stage may be coupled to receive the output switching signal from the first switching device and to substantially replicate a condition of the first switching device to generate a continuous signal rather than a switched signal. In embodiments, the continuous signal may allow detection of a current level. In some embodiments, the current level may indicate an overcurrent event. A digital post-processing circuit may be coupled to the switching device to count a number of overcurrent events according to various embodiments. Other embodiments may also be described and claimed.

The invention relates to a matching circuit for matching impedance values comprising an impedance element with an impedance value, which corresponds to a required total impedance value of the matching circuit, a structurally determined parasitic unit with a parasitic impedance value and a compensation unit with at least one first compensation element. The first compensation element provides a compensation impedance value which is the dual impedance value of the parasitic impedance value. Furthermore, a system comprising a first circuit unit and a second circuit unit with a matching circuit serving for the matching is provided. Also, a method for the compensation of parasitic units for matching purposes is provided.

A test and measurement instrument including a splitter configured to split an input signal into at least two split signals, at least two harmonic mixers configured to mix an associated split signal with an associated harmonic signal to generate an associated mixed signal, at least two digitizers configured to digitize the associated mixed signal, at least two MIMO polyphase filter arrays configured to filter the associated digitized mixed signal of an associated digitizer of the at least two digitizers, at least two pairs of band separation filters configured to receive the associated digitized mixed signals from each of the MIMO polyphase filter arrays and output a low band of the input signal and a high band of the input signal based on a time different between the at least two digitizers and a phase drift of a local oscillator, and a combiner configured to combine the low band of the input signal and the high band of the input signal to form a reconstructed input signal.

An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.

An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.

A method for reducing a number of bits used for a frequency value of a measuring signal stored in each memory cell of a display memory in a measuring device determines the frequency value in each memory cell by assigning the frequency of sampled values in several measuring portions of a measured signal within an update cycle of the display to a corresponding memory cell. It then displays each pixel of the display with a brightness or a color corresponding to the frequency value in the corresponding memory cell after each update cycle. The determined frequency value is a sum of a first frequency value, which is determined in a number of first measuring portions of the measured signal within the update cycle, and at least one compressed second frequency value, which is determined by compression of a corresponding compressed second frequency value with a compression factor. Each uncompressed second frequency value can be determined in a corresponding part of a number of second measuring portions of the measured signal within the update cycle.

A method for reducing a number of bits used for a frequency value of a measuring signal stored in each memory cell of a display memory in a measuring device determines the frequency value in each memory cell by assigning the frequency of sampled values in several measuring portions of a measured signal within an update cycle of the display to a corresponding memory cell. It then displays each pixel of the display with a brightness or a color corresponding to the frequency value in the corresponding memory cell after each update cycle. The determined frequency value is a sum of a first frequency value, which is determined in a number of first measuring portions of the measured signal within the update cycle, and at least one compressed second frequency value, which is determined by compression of a corresponding compressed second frequency value with a compression factor. Each uncompressed second frequency value can be determined in a corresponding part of a number of second measuring portions of the measured signal within the update cycle.

A spectrum analyzer triggering system includes a frequency select trigger (FST) configured to generate a power signal from an input digital signal, the input power signal including high or low transitions at given transmission intervals of the input digital signal. The triggering system further includes a hysteresis comparator configured to generate a trigger pulse at the high or low transitions of the input power signal, and a leaky peak detector (LPD) configured to inhibit errant high or low transitions of the input power signal from causing the hysteresis comparator to generate a trigger pulse.