A method and an apparatus for a shunt measurement are provided. In one embodiment a measurement unit includes an input for a source device, the source device configured to provide a first analog voltage level to be measured in a first operating mode of the source device and a second analog voltage level to be measured in a second operating mode of the source device, a control input configured to detect the operating mode of the source device and an input stage configured to minimize a reaction time of the measurement unit after a change of the operating mode of the source device.

The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

The invention is based on an electrical current measuring device for measuring at least one alternating current, with at least one inductive coupling unit, which is intended to convert at least one electrical primary signal into at least one electrical secondary signal, and with a computing unit, which is intended to determine the primary signal from the secondary signal. The computing unit is intended to take into account at least one higher harmonic of the secondary signal when determining the primary signal.

Implementations of the present disclosure involve a system and/or method for measuring on-die voltage levels of an integrated circuit through a digital sampling circuit. In particular, the system and/or method utilizes a delay line based analog-to-digital sampling circuit that produces a voltage reading over time, such as at every high frequency clock cycle. The digitized samples are routed to either an on-die memory structure for later analysis or are transmitted to one or more pins of a chip for capture and analysis by an external analyzer.

The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.

Systems, devices, and methods for a high-voltage conversion circuit system comprising: an error detection and correction module configured to receive an analog input signal and a feedback signal and generate a correction signal; and an analog to pulse width modulation (PWM) module configured to receive the analog input signal and correction signal and generate a PWM output signal; where the generated PWM output signal is fed back to the error detection and correction module as said feedback signal.

According to some embodiments, system comprises a metrological device operative to collect and transmit measurement data; and a hands-free communication device operative to receive the collected data and communicate the data to a user. Numerous other aspects are provided.

A system and method for efficiently determining a diagnostic protocol used by a vehicle under service and instantiating service appropriately. The diagnostic protocol is checked for expected electrical behaviors exhibited at the pins of a diagnostic port of a vehicle. If the expected behaviors are observed, a first protocol is designated for use. If the expected behaviors are not observed, other protocols are test for appropriate designation.

The voltage hold circuit is a voltage hold circuit configured to operate every processing cycle, the processing cycle including a hold period and a reset period following the hold period, and hold a voltage value for an input voltage signal, the voltage hold circuit including: a first hold circuit configured to operate to hold a minimum voltage value for the input voltage signal in the hold period every the processing cycle; and a second hold circuit configured to operate to hold a maximum voltage value for the input voltage signal in the reset period every the processing cycle.

A system may include two input terminals, e.g., HI and LO, and a floating circuit that is physically separate from the input terminals and includes a gain amplifier. The floating circuit can be surrounded by a conductive enclosure that is electrically connected to the second input terminal. The floating circuit can further switch between input signals received from the first and second input terminals to the gain amplifier and the floating circuit ground.