A current sense system may include a relay, a load conductor, and an integrator sub-circuit. Current may be provided to an electrical load via the load conductor and a latch of the relay. The current carried via the load conductor may induce a sense voltage in a coil of the relay. Based on the sense voltage induced in the relay coil, the integrator sub-circuit may determine a load sense voltage that indicates a level of the current carried via the load conductor. In some implementations, a current indication module may provide an indicator signal based on the load sense voltage. In addition, the indicator signal may be provided to additional components or devices, such as a relay controller configured to activate the latch. In some implementations, the relay controller may be configured to open the latch based on the current level described by the indicator signal.

A current sense system may include a relay, a load conductor, and an integrator sub-circuit. Current may be provided to an electrical load via the load conductor and a latch of the relay. The current carried via the load conductor may induce a sense voltage in a coil of the relay. Based on the sense voltage induced in the relay coil, the integrator sub-circuit may determine a load sense voltage that indicates a level of the current carried via the load conductor. In some implementations, a current indication module may provide an indicator signal based on the load sense voltage. In addition, the indicator signal may be provided to additional components or devices, such as a relay controller configured to activate the latch. In some implementations, the relay controller may be configured to open the latch based on the current level described by the indicator signal.

A semiconductor device includes an analog-digital conversion circuit that converts a voltage at a node between a reference resistor and a sensor resistor into output data, the reference resistor and the sensor resistor being connected in series. The semiconductor device calculates a resistance value of the sensor resistor using a first output data obtained in a first conversion phase and second output data obtained in a second conversion phase. In the first conversion phase, a high potential side voltage is applied to one end of the reference resistor and a low potential side voltage is applied to one end of the sensor resistor. In the second conversion phase, the low potential side voltage is applied to one end of the reference resistor and the high potential side voltage is applied to one end of the sensor resistor.

A semiconductor device includes an analog-digital conversion circuit that converts a voltage at a node between a reference resistor and a sensor resistor into output data, the reference resistor and the sensor resistor being connected in series. The semiconductor device calculates a resistance value of the sensor resistor using a first output data obtained in a first conversion phase and second output data obtained in a second conversion phase. In the first conversion phase, a high potential side voltage is applied to one end of the reference resistor and a low potential side voltage is applied to one end of the sensor resistor. In the second conversion phase, the low potential side voltage is applied to one end of the reference resistor and the high potential side voltage is applied to one end of the sensor resistor.

A method for and apparatus processing a measurement signal of a dynamic physical quantity is provided which includes acquiring a measurement signal representing the dynamic physical quantity over time; comparing the acquired measurement signal with a predefined signal characteristic of the respective physical quantity or with a signal characteristic of another physical quantity being dependent from the respective physical quantity to provide a comparison result; and adjusting a waveform representing the acquired measurement signal based upon the comparison result. A digital oscilloscope is also provided.

A method for and apparatus processing a measurement signal of a dynamic physical quantity is provided which includes acquiring a measurement signal representing the dynamic physical quantity over time; comparing the acquired measurement signal with a predefined signal characteristic of the respective physical quantity or with a signal characteristic of another physical quantity being dependent from the respective physical quantity to provide a comparison result; and adjusting a waveform representing the acquired measurement signal based upon the comparison result. A digital oscilloscope is also provided.

According to certain aspects, a predictive tracking scheme is provided for sampling inductor currents in a digital PWM controller used for high-bandwidth voltage regulation. In one or more embodiments, the predicted current derived from the PWM waveform is fed forward to the current sense ADC in order to reduce the required conversion range. These and other embodiments only need to convert a few of the LSB of the ADC in order to correct the largest error expected in the synthesizer.

According to certain aspects, a predictive tracking scheme is provided for sampling inductor currents in a digital PWM controller used for high-bandwidth voltage regulation. In one or more embodiments, the predicted current derived from the PWM waveform is fed forward to the current sense ADC in order to reduce the required conversion range. These and other embodiments only need to convert a few of the LSB of the ADC in order to correct the largest error expected in the synthesizer.

A current detection circuit, a semiconductor device and a semiconductor system which are capable of improving current detection accuracy are provided. According to one embodiment of the invention, a current detection circuit includes a resistive element to convert an input current supplied from outside into an input voltage, a constant-current source, a resistive element to convert an output current of the constant-current source into a reference voltage, and an AD converter to AD-convert the input voltage using the reference voltage.

A current detection circuit, a semiconductor device and a semiconductor system which are capable of improving current detection accuracy are provided. According to one embodiment of the invention, a current detection circuit includes a resistive element to convert an input current supplied from outside into an input voltage, a constant-current source, a resistive element to convert an output current of the constant-current source into a reference voltage, and an AD converter to AD-convert the input voltage using the reference voltage.