Various technologies described herein pertain to a testing apparatus that enables an analog frequency response of a device under test to be analyzed. The testing apparatus includes a laser source and an optical resonator. The laser source is optically injection locked to the optical resonator. The testing apparatus also includes a modulator configured to apply a time-varying voltage to the optical resonator. The time-varying voltage causes the laser source optically injection locked to the optical resonator to generate a frequency modulated optical signal that can include time-varying chirps. The testing apparatus further includes an interferometer (e.g., variable delay, fixed length) configured to receive the frequency modulated optical signal from the laser source optically injection locked to the optical resonator. The interferometer outputs an optical test signal having a range of frequencies. The frequencies in the optical test signal are based at least in part on the time-varying chirps.

Various technologies described herein pertain to a testing apparatus that enables an analog frequency response of a device under test to be analyzed. The testing apparatus includes a laser source and an optical resonator. The laser source is optically injection locked to the optical resonator. The testing apparatus also includes a modulator configured to apply a time-varying voltage to the optical resonator. The time-varying voltage causes the laser source optically injection locked to the optical resonator to generate a frequency modulated optical signal that can include time-varying chirps. The testing apparatus further includes an interferometer (e.g., variable delay, fixed length) configured to receive the frequency modulated optical signal from the laser source optically injection locked to the optical resonator. The interferometer outputs an optical test signal having a range of frequencies. The frequencies in the optical test signal are based at least in part on the time-varying chirps.

An apparatus may include one or more measurement sensors, which may measure power coupled to one or more process stations of the apparatus. The apparatus may additionally include one or more analog-to-digital converters coupled to an output port of a corresponding one of the one or more measurement sensors, which may provide a digital representation of a RF signal measured by the one or more measurement sensors. A processor, coupled to a memory, may determine a crossing of the digital representation of the signal with a reference signal level and may thus determine a frequency content of the RF signal and the characteristic, which may permit the nulling out of phase lag of the one or more measurement sensors.

An apparatus may include one or more measurement sensors, which may measure power coupled to one or more process stations of the apparatus. The apparatus may additionally include one or more analog-to-digital converters coupled to an output port of a corresponding one of the one or more measurement sensors, which may provide a digital representation of a RF signal measured by the one or more measurement sensors. A processor, coupled to a memory, may determine a crossing of the digital representation of the signal with a reference signal level and may thus determine a frequency content of the RF signal and the characteristic, which may permit the nulling out of phase lag of the one or more measurement sensors.

A method for improving the accuracy of a final inspection (FI) test of an acoustic wave device includes gating the feedthrough/cross-coupling (e.g., electromagnetic (EM) path) signal of the FI test data response for the tested acoustic wave device and adding a feedthrough/cross-coupling signal (e.g., EM path signal) from an engineering (EVB) test data (e.g., for a similar or identical surface acoustic device). This results in FI test data with time domain recovery of EM path signal from an EVB test, which can be compared against EVB test data (e.g. for a similar or identical surface acoustic device) to determine if the tested acoustic wave device passes inspection.

A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.

The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.