Patent classifications
G01R23/163
METHOD AND MEASURING APPARATUS FOR TESTING A DEVICE UNDER TEST
The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.
Wireless threat detection device, system, and methods to detect signals in wideband RF systems and localize related time and frequency information based on deep learning
The present invention comprises a novel system and method to detect and estimate the time-frequency span of wireless signals present in a wideband RF spectrum. In preferred embodiments, the Faster RCNN deep learning architecture is used to detect the presence of wireless transmitters from the spectrogram images plotted by searching for rectangular shapes of any size, then localize the time and frequency information from the output of the FRCNN deep learning architecture.
MULTIRATE DATA FOR S-PARAMETER EXTRACTION
An apparatus configured to acquire S-parameters of a communications channel includes a physical interface configured to transmit and receive signals through a communications channel under test, a processor, configured to execute instructions that, when executed cause the processor to: send a first data pattern from the transmitter through the communications channel at a first data rate; acquire a first waveform corresponding to the first data pattern and determine a first pulse response; calculate a first transfer function from the first pulse response; send a second data pattern from the transmitter through the communications channel at a second data rate; acquire a second waveform corresponding to the second data pattern and determine a second pulse response; calculate a second transfer function from the second pulse response; and combine the first and second transfer functions to determine an S-parameter of the communications channel.
Automated analysis of RF spectrum
Systems and methods e to automatically analyze and display results of tests of a link include obtaining data from one or more tests of a link, wherein the data includes samples for Antenna Carriers (AxC) for one or more AxCs auto-detected on the link; processing the data to detect peaks on any of the auto-detected AxCs on the link; performing an analysis of any detected peaks to identify any issues on the link; and causing display of a user interface that includes a reporting of any identified issues with the user interface including a display of the identified issues and a spectrum graph.
DEVICE AND METHOD FOR DETERMINING A TEMPERATURE-DEPENDENT IMPEDANCE CURVE ALONG AN ELECTRICAL CONDUCTOR
The invention relates to a device for determining a temperature-dependent impedance curve along an electrical conductor, which device has a signal generator unit, which is arranged and designed to generate a multi-frequency electrical signal, which passes through an electrical conductor. The device also has a frequency spectrum sensing unit, which is arranged and designed to sense a frequency spectrum of a multi-frequency electrical signal leaving the conductor at least in a predefined frequency range. The device also has a frequency spectrum difference determination unit, which is arranged and designed to determine a frequency difference between the sensed frequency spectrum and a predefined frequency spectrum. The device also has a frequency difference conversion unit, which is designed and arranged to determine an amplitude curve of the determined frequency difference along the electrical conductor.
DEVICE AND METHOD FOR DETERMINING A TEMPERATURE-DEPENDENT IMPEDANCE CURVE ALONG AN ELECTRICAL CONDUCTOR
The invention relates to a device for determining a temperature-dependent impedance curve along an electrical conductor, which device has a signal generator unit, which is arranged and designed to generate a multi-frequency electrical signal, which passes through an electrical conductor. The device also has a frequency spectrum sensing unit, which is arranged and designed to sense a frequency spectrum of a multi-frequency electrical signal leaving the conductor at least in a predefined frequency range. The device also has a frequency spectrum difference determination unit, which is arranged and designed to determine a frequency difference between the sensed frequency spectrum and a predefined frequency spectrum. The device also has a frequency difference conversion unit, which is designed and arranged to determine an amplitude curve of the determined frequency difference along the electrical conductor.
Automated analysis of RF spectrum
Systems and methods e to automatically analyze and display results of tests of a link include obtaining data from one or more tests of a link, wherein the data includes samples for Antenna Carriers (AxC) for one or more AxCs auto-detected on the link; processing the data to detect peaks on any of the auto-detected AxCs on the link; performing an analysis of any detected peaks to identify any issues on the link; and causing display of a user interface that includes a reporting of any identified issues with the user interface including a display of the identified issues and a spectrum graph.
Expanded detail graphical display for spectrum analyzers
A graphical display for displaying spectrum analyzer data that represents detected signal levels for frequencies in an identified frequency span includes a signal level axis that represents a range of detected RF signal levels for the spectrum analyzer data and a frequency axis that represents an identified frequency spectrum span for the spectrum analyzer data. Frequency ranges in the identified frequency span having a high concentration of detected RF energy are automatically graphically expanded and displayed on the frequency axis of the graphical display while frequency ranges having a lower concentration of detected RF energy are simultaneously, automatically graphically condensed and displayed on the first frequency axis of the graphical display.
Expanded detail graphical display for spectrum analyzers
A graphical display for displaying spectrum analyzer data that represents detected signal levels for frequencies in an identified frequency span includes a signal level axis that represents a range of detected RF signal levels for the spectrum analyzer data and a frequency axis that represents an identified frequency spectrum span for the spectrum analyzer data. Frequency ranges in the identified frequency span having a high concentration of detected RF energy are automatically graphically expanded and displayed on the frequency axis of the graphical display while frequency ranges having a lower concentration of detected RF energy are simultaneously, automatically graphically condensed and displayed on the first frequency axis of the graphical display.
Measurement apparatus
A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).