Patent classifications
G01R23/17
SYSTEM FOR ANALYZING ELECTROMAGNETIC RADIATION
The inventive system for analyzing electromagnetic radiation comprises: an enclosure filled with gas containing atoms of a known type, at least one light source emitting light capable of exciting the atoms of the known type in the gas, a source of the electromagnetic radiation to be analyzed arranged such that the emitted electromagnetic radiation acts on the atoms of the known type in the gas, and a sensor for capturing light emitted by and/or passed through the gas. Further, the system comprises an electrical field source and/or magnetic field source configured to establish a predefined electrical field and/or magnetic field acting on the atoms of the known type in the gas. The light captured by the sensor reflects a response of the atoms of the known type in the gas on the electrical field and/or the magnetic fields, the light from the at least one light source, and the electromagnetic radiation to be analyzed.
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
A reconfigurable optic probe is used to measure signals from a device under test. The reconfigurable optic probe is positioned at a target probe location within a cell of the device under test. The cell including a target net to be measured and non-target nets. A test pattern is applied to the cell and a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: i) configuring the reconfigurable optic probe to produce a ring-shaped beam having a relatively low-intensity region central to the ring-shaped beam; (ii) re-applying the test pattern to the cell at the target probe location with the relatively low-intensity region applied to the target net and obtaining a cross-talk LP waveform in response; (iii) normalizing the cross-talk LP waveform; and (iv) determining a target net waveform by subtracting the normalized cross-talk LP waveform from the LP waveform.
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
A reconfigurable optic probe is used to measure signals from a device under test. The reconfigurable optic probe is positioned at a target probe location within a cell of the device under test. The cell including a target net to be measured and non-target nets. A test pattern is applied to the cell and a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: i) configuring the reconfigurable optic probe to produce a ring-shaped beam having a relatively low-intensity region central to the ring-shaped beam; (ii) re-applying the test pattern to the cell at the target probe location with the relatively low-intensity region applied to the target net and obtaining a cross-talk LP waveform in response; (iii) normalizing the cross-talk LP waveform; and (iv) determining a target net waveform by subtracting the normalized cross-talk LP waveform from the LP waveform.
DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL
The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.
DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL
The invention relates to a device for the frequency analysis of a signal, comprising a diamond crystal having NV centers defining sub-regions, an excitation unit for optically or electrically exciting each sub-region, an injection unit for injecting a signal so that the sub-region is in the presence of the signal, a magnetic field generator designed so as to generate a magnetic field on each sub-region, the magnetic field having a spatial variation of amplitude in a first direction, and a detector for detecting the resonance frequency of each sub-region of the region, the detector comprising an electrical contact for detecting the charges created in a sub-region, and a reading circuit.
FREQUENCY SPECTRUM DETECTION SYSTEM
A frequency spectrum detection system including: a frequency-scan light source, a phase modulator, an optical filter, an optical fiber, a photodetector, a power divider, an electric amplifier, a combiner, an electric filter, and an oscilloscope. The frequency-scan light source, the phase modulator, the optical filter, the photodetector, and the electric amplifier form a ring-shaped optoelectronic oscillator resonant cavity, which is configured to generate a frequency-scan signal. The combiner is configured to receive a signal to be measured. The phase modulator is configured to modulate the combined electrical signal onto a frequency-scan optical signal. The optical filter is configured to selectively attenuate or amplify one sideband of double sidebands of the double-sideband phase-modulated optical signal. The photodetector is configured to detect a signal filtered by the optical filter.
FREQUENCY SPECTRUM DETECTION SYSTEM
A frequency spectrum detection system including: a frequency-scan light source, a phase modulator, an optical filter, an optical fiber, a photodetector, a power divider, an electric amplifier, a combiner, an electric filter, and an oscilloscope. The frequency-scan light source, the phase modulator, the optical filter, the photodetector, and the electric amplifier form a ring-shaped optoelectronic oscillator resonant cavity, which is configured to generate a frequency-scan signal. The combiner is configured to receive a signal to be measured. The phase modulator is configured to modulate the combined electrical signal onto a frequency-scan optical signal. The optical filter is configured to selectively attenuate or amplify one sideband of double sidebands of the double-sideband phase-modulated optical signal. The photodetector is configured to detect a signal filtered by the optical filter.
Optical RF spectrum analyser
This disclosure relates to optical RF spectrum analysers and methods for analysing an input RF signal. An optical modulator modulates an input RF signal onto a carrier frequency and an optical spectral weight with a spectral weight function modifies the modulated optical signal. The spectral weight defines a frequency relationship between the spectral weight function and the carrier frequency. A frequency control module modifies the frequency relationship between the spectral weight function and the carrier frequency over time. An optical sensor senses the modified optical signal over time and to generates an RF signal over time. A signal recovery module calculates the RF spectrum based on the RF signal over time. Shifting the spectral weight against the carrier frequency over time results in a high spectral resolution even if the spectral weight is relatively broad band. The result is an increased spectral resolution at a reduced price/complexity and increased robustness.
Optical RF spectrum analyser
This disclosure relates to optical RF spectrum analysers and methods for analysing an input RF signal. An optical modulator modulates an input RF signal onto a carrier frequency and an optical spectral weight with a spectral weight function modifies the modulated optical signal. The spectral weight defines a frequency relationship between the spectral weight function and the carrier frequency. A frequency control module modifies the frequency relationship between the spectral weight function and the carrier frequency over time. An optical sensor senses the modified optical signal over time and to generates an RF signal over time. A signal recovery module calculates the RF spectrum based on the RF signal over time. Shifting the spectral weight against the carrier frequency over time results in a high spectral resolution even if the spectral weight is relatively broad band. The result is an increased spectral resolution at a reduced price/complexity and increased robustness.
ANALYSIS OF ELECTRO-OPTIC WAVEFORMS
An optic probe is used to measure signals from a device under test. The optic probe is positioned at a target probe location within a cell of the device under test, the cell including a target net to be measured and a plurality of non-target nets. A test pattern is applied to the cell with the optic probe a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: (i) simulating a combinational logic analysis (CLA) cross-talk waveform to model cross-talk from selected non-target nets by simulating an optical response of the cell to the test pattern with the target net masked; (ii) estimating a cross-talk weight; and (iii) determining a target net waveform by weighting the CLA cross-talk waveform according to the cross-talk weight and subtracting the weighted CLA cross-talk waveform from the LP waveform.