Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicator 21 and an allowable lower limit value indicator 22 are disposed at display positions which are set in advance in a measurement result image 20 as positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicator 23 is disposed at a display position calculated from display positions of the allowable upper limit value indicator 21 and allowable lower limit value indicator 22 and a measurement value measured by the measurement unit 10.

Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicator 21 and an allowable lower limit value indicator 22 are disposed at display positions which are set in advance in a measurement result image 20 as positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicator 23 is disposed at a display position calculated from display positions of the allowable upper limit value indicator 21 and allowable lower limit value indicator 22 and a measurement value measured by the measurement unit 10.

The present disclosure relates to an electromagnetically induced grating-based electric field detection system and method and, more particularly, to an electric field detection system and method which enable the creation of an electromagnetically induced transparency grating using a low-wavelength laser and enables real-time electromagnetic wave measurement by avoiding the frequency reprocessing of the signal that is essential in the existing Rydberg atom-based electric field measurement technology.

An electromagnetically induced grating-based electric field detection system according to an embodiment of the present disclosure may include a vapor cell; an irradiation light source which irradiates irradiation light to be incident on one end of the vapor cell; a combined light source which irradiates combined light to be incident on another end of the vapor cell; a reflector which reflects the combined light that has passed through the vapor cell and makes it incident on the one end of the vapor cell; an electromagnetic wave generator which generates an electromagnetic wave to be incident on one side surface of the vapor cell; and a reflected light detector which detects a reflected light released from the vapor cell.

According to one embodiment of the present disclosure, in the Rydberg atom-based electric field measurement technology, there is an advantage in that real-time electric field measurement is possible without signal frequency reprocessing.

Systems and methods for precision phase noise measurements of radio frequency (RF) oscillators are provided. An RF signal under test can be modulated on a continuous wave (cw) laser carrier frequency via generation of modulation sidebands using an appropriate modulator. A photonic delay line can be implemented as a self-heterodyne detection system for the phase noise, allowing for photonic down-conversion of the phase noise measurement to direct current (DC). The self-heterodyne detection system allows detection outside of any 1/f noise issues. Ultra-low phase noise detection for RF frequencies in a range from below 1 GHz to beyond 100 GHz is enabled with a low noise floor in the whole frequency range. Higher-order modulation sidebands can further reduce the noise floor of the system. Ultra-low noise RF (microwave) output can be generated. The RF signal under test can be generated by a dielectric resonance oscillator or opto-electronic oscillator.

A failure location specifying device that can specify a failure location even if the spatial resolution is insufficient includes: an EOFM measurement unit that calculates a phase difference between a measurement signal on the basis of reflected light in accordance with the operation of a circuit element arranged in a semiconductor device and a reference signal, and generates a phase map of the circuit element in the semiconductor device. A circuit simulation unit calculates the operation waveform of a circuit element included in the field of view that is extracted by a circuit extraction unit by a simulation. A phase calculation unit calculates a phase on the basis of the operation waveform calculated by the circuit simulation unit; and a phase map generation unit generates a phase map of the circuit element on the basis of the phase calculated by the phase calculation unit.

A failure location specifying device that can specify a failure location even if the spatial resolution is insufficient includes: an EOFM measurement unit that calculates a phase difference between a measurement signal on the basis of reflected light in accordance with the operation of a circuit element arranged in a semiconductor device and a reference signal, and generates a phase map of the circuit element in the semiconductor device. A circuit simulation unit calculates the operation waveform of a circuit element included in the field of view that is extracted by a circuit extraction unit by a simulation. A phase calculation unit calculates a phase on the basis of the operation waveform calculated by the circuit simulation unit; and a phase map generation unit generates a phase map of the circuit element on the basis of the phase calculated by the phase calculation unit.

A method evaluates a frequency spectrum representative of at least one time-dependent signal, the at least one time dependent signal being derived from an output from a measuring device under predetermined measuring device operating conditions. The time-dependent signal, includes a portion being representative of a wanted signal, and a portion being representative of noise. The method includes the steps of determining, based on the frequency spectrum of the signal, a value representative of the noise floor, identifying, based on the frequency spectrum of the signal derived under the predetermined operating condition, a peak component, and if the peak component satisfies a relative peak criterion determined on the basis of the determined value representative of the noise floor, determining the wanted signal by applying a predetermined algorithm. The invention further relates to a method for determining flow of a vortex measuring device, and a vortex sensor.

A method for manufacturing a device including a diamond crystal, the method including making available a substrate, growing a crystalline diamond layer on the substrate, the layer having a crystal lattice, the layer including at least a first set of XV centers in the crystal lattice, each XV center having a quantification axis, a main direction being defined for the first set, the quantification axes of the XV centers of the first set being parallel to the main direction, the normal direction being distinct from the main direction of the first set, removing a first part of the diamond layer in order to reveal a first face perpendicular to the main direction of the first set, and removing of a second part of the diamond layer in order to reveal a second face perpendicular to the first face.

The invention relates to a device for detecting an electric arc based on an analog output signal (104) of at least one acoustic wave sensor (102), this device including: an analog-to-digital converter (106) capable of sampling and digitizing the output signal (104) of the sensor (102); a digital processing circuit (110) capable of implementing a frequency domain analysis of the digital output signal (108) of the converter (106) enabling to detect the possible presence of an arc based on its acoustic signature; and an analog circuit (118) for detecting the exceeding of a power threshold by the output signal (104) of the sensor (102), wherein the digital processing circuit (110) is configured to implement the frequency domain analysis only on detection of the exceeding of a threshold by the analog circuit (118).

A semiconductor device testing apparatus 1A includes a tester unit 16 that generates an operational pulse signal, an optical sensor 10 that outputs a detection signal as a response to the operational pulse signal, a pulse generator 17 that generates a reference signal containing a plurality of harmonics for the operational pulse signal in synchronization with the operational pulse signal, a spectrum analyzer 13 that receives the detection signal and acquires a phase and amplitude of the detection signal at a detection frequency, a spectrum analyzer 14 that receives the reference signal and acquires a phase of the reference signal at a detection frequency, and an analysis control unit 18 that acquires a time waveform of the detection signal based on the phase and the amplitude of the detection signal acquired by the spectrum analyzer 13 and the phase of the reference signal acquired by the spectrum analyzer 14.