A semiconductor device testing apparatus 1A includes a tester unit 16 that generates an operational pulse signal, an optical sensor 10 that outputs a detection signal as a response to the operational pulse signal, a pulse generator 17 that generates a reference signal containing a plurality of harmonics for the operational pulse signal in synchronization with the operational pulse signal, a spectrum analyzer 13 that receives the detection signal and acquires a phase and amplitude of the detection signal at a detection frequency, a spectrum analyzer 14 that receives the reference signal and acquires a phase of the reference signal at a detection frequency, and an analysis control unit 18 that acquires a time waveform of the detection signal based on the phase and the amplitude of the detection signal acquired by the spectrum analyzer 13 and the phase of the reference signal acquired by the spectrum analyzer 14.

A distributed spectrum analyzer and a method of spectrum analysis applying same. The spectrum analyzer adopts a separate design. A radio frequency receiver receives a signal, performs frequency conversion processing and AD conversion on the received signal, and sends the converted digital signal to a host. In such a structure, by a digital optical module, the radio frequency receiver is connected to a corresponding digital optical module on the host through an optical fiber, so as to implement a bidirectional data transmission. The host performs general control of the system as well as signal processing and spectrum analysis. Therefore, a multi-interface design is applied to the host of the spectrum analyzer, so as to support simultaneous access and control for a plurality of radio frequency receivers, thereby conveniently implementing multi-port measurement extension.

A distributed spectrum analyzer and a method of spectrum analysis applying same. The spectrum analyzer adopts a separate design. A radio frequency receiver receives a signal, performs frequency conversion processing and AD conversion on the received signal, and sends the converted digital signal to a host. In such a structure, by a digital optical module, the radio frequency receiver is connected to a corresponding digital optical module on the host through an optical fiber, so as to implement a bidirectional data transmission. The host performs general control of the system as well as signal processing and spectrum analysis. Therefore, a multi-interface design is applied to the host of the spectrum analyzer, so as to support simultaneous access and control for a plurality of radio frequency receivers, thereby conveniently implementing multi-port measurement extension.

Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.

The present disclosure relates to a sensor system for analyzing a spectrum of an electromagnetic, EM, signal. The system includes a vapor cell containing at least one species of atoms in a gaseous form, wherein the atoms in the vapor cell are exposed to the EM signal; at least one excitation source excites a number of atoms in the vapor cell to a Rydberg state, wherein at least a fraction of the excited atoms are ionized; a number of electrode pairs which are arranged along the vapor cell, and which generate a spatially and/or temporally varying electric field in the vapor cell; a current sense circuit detects a current between at least one of the number of electrode pairs, wherein the current is caused by ionized atoms in the vapor cell; and a processor determines spectral information of the EM signal based on the detected current.

An optoelectronic device for extracting characteristics in analog radiofrequency signals, forming an analog input signal, the device comprising: an input module generating an optical carrier wave and performing a modulation of this carrier by the analog input signal, to form a modulated optical signal; a network of linear optical cavities optically pumped and coupled by the modulated optical signal; an optical device for measuring the measured quantities of the optical fields, these optical fields being induced by the optical signal modulated by the analog input signal; a calculation module performing a linear transformation on the measured quantities of the optical fields; to make it possible to reconstruct and extract targeted characteristics contained in the spectrum of the radiofrequency input signal, the calculation module having performed machine learning on noisy analog radiofrequency drive signals having the same targeted characteristics in order to determine parameters.

An optoelectronic device for extracting characteristics in analog radiofrequency signals, forming an analog input signal, the device comprising: an input module generating an optical carrier wave and performing a modulation of this carrier by the analog input signal, to form a modulated optical signal; a network of linear optical cavities optically pumped and coupled by the modulated optical signal; an optical device for measuring the measured quantities of the optical fields, these optical fields being induced by the optical signal modulated by the analog input signal; a calculation module performing a linear transformation on the measured quantities of the optical fields; to make it possible to reconstruct and extract targeted characteristics contained in the spectrum of the radiofrequency input signal, the calculation module having performed machine learning on noisy analog radiofrequency drive signals having the same targeted characteristics in order to determine parameters.