A non-intrusive power quality sensor for to provide a simple solution for monitoring the quality of the power behind the meter. 80% of the quality issues happen behind the meter. Current power quality monitoring solutions are intrusive: they require the intervention of an electrical qualified person. The non-intrusive power quality sensor generally includes a device that can be plugged into a regular power outlet and acts as a power quality sensor.

Electrical structures, methods, and computer program products for radio frequency (RF) de-embedding are provided. A structure includes a first test device, a first through structure corresponding to the first test device, and a first open structure corresponding to the first test device. The structure also includes a second test device having at least one different physical dimension than the first test device but otherwise identical to the first test device, a second through structure corresponding to the second test device, and a second open structure corresponding to the second test device. A method includes determining a first electrical parameter of the first test device in a first DUT structure and a second electrical parameter of the second test device in a second DUT structure based on measured electrical parameters of the first and the second DUT structures, through structures, and open structures.

Electrical structures, methods, and computer program products for radio frequency (RF) de-embedding are provided. A structure includes a first test device, a first through structure corresponding to the first test device, and a first open structure corresponding to the first test device. The structure also includes a second test device having at least one different physical dimension than the first test device but otherwise identical to the first test device, a second through structure corresponding to the second test device, and a second open structure corresponding to the second test device. A method includes determining a first electrical parameter of the first test device in a first DUT structure and a second electrical parameter of the second test device in a second DUT structure based on measured electrical parameters of the first and the second DUT structures, through structures, and open structures.

A signal adjustment device includes a frequency adjustment circuit, a filter circuit, and a power estimation circuit. The frequency adjustment circuit is configured to receive a two-tone signal from a signal generator and to generate a first signal according to the two-tone signal, wherein the signal generator generates the two-tone signal according to a first coefficient and a second coefficient. The filter circuit is configured to filter the first signal, in order to generate a second signal. The power estimation circuit is configured to detect a power of an intermodulation distortion from the third order signal component, which is associated with the two-tone signal, in the second signal, and to adjust at least one of the first coefficient and the second coefficient according to the power, in order to reduce the power.

An apparatus, method and work product is disclosed. The method comprises measuring plural transmit signals and corresponding receive signals and determining, using a model describing a relation between each of the plural transmit signals and a respective passive intermodulation signal, a standardized passive intermodulation signal as one or more nth order intermodulation products for a standardized transmit signal consisting of two tones each of a power of substantially 20 Watts. The method may also comprise identifying in the model one or more n.sup.th order cross-intermodulation products resulting from three or more transmit signals having different respective carrier frequencies. Responsive to the identification, the method may comprise adapting the standardized two-tone passive intermodulation signal by determining an offset for producing an adapted two-tone standardized passive intermodulation signal, n is an odd integer greater than two.

An apparatus, method and work product is disclosed. The method comprises measuring plural transmit signals and corresponding receive signals and determining, using a model describing a relation between each of the plural transmit signals and a respective passive intermodulation signal, a standardized passive intermodulation signal as one or more nth order intermodulation products for a standardized transmit signal consisting of two tones each of a power of substantially 20 Watts. The method may also comprise identifying in the model one or more n.sup.th order cross-intermodulation products resulting from three or more transmit signals having different respective carrier frequencies. Responsive to the identification, the method may comprise adapting the standardized two-tone passive intermodulation signal by determining an offset for producing an adapted two-tone standardized passive intermodulation signal, n is an odd integer greater than two.

Systems, methods, and computer program products for sinusoidal nulling are provided. Aspects include transmitting, by a controller, an excitation signal to a first sensor, determining, by the controller, a target harmonic based at least on one or more characteristics of the excitation signal, receiving a return signal from the first sensor, sampling the return signal at a first sample rate based on the target harmonic, and adjusting a phase of the sampled return signal to null the target harmonic amplitude to form an adjusted return signal.

Systems, methods, and computer program products for sinusoidal nulling are provided. Aspects include transmitting, by a controller, an excitation signal to a first sensor, determining, by the controller, a target harmonic based at least on one or more characteristics of the excitation signal, receiving a return signal from the first sensor, sampling the return signal at a first sample rate based on the target harmonic, and adjusting a phase of the sampled return signal to null the target harmonic amplitude to form an adjusted return signal.

A method, an apparatus and a system to measure nonlinear related parameters of a nonlinear device. The apparatus comprises a memory and a processor coupled to the memory to control execution of a process to: generate a first signal according to a signal to be measured, the first signal and the signal to be measured having a signal probability distribution that is same, and the first signal having at least one notch frequency; and calculate, according to an output signal of the nonlinear device when the first signal is input into the nonlinear device, nonlinear related parameters of the nonlinear device when the signal to be measured is transmitted.

A method, an apparatus and a system to measure nonlinear related parameters of a nonlinear device. The apparatus comprises a memory and a processor coupled to the memory to control execution of a process to: generate a first signal according to a signal to be measured, the first signal and the signal to be measured having a signal probability distribution that is same, and the first signal having at least one notch frequency; and calculate, according to an output signal of the nonlinear device when the first signal is input into the nonlinear device, nonlinear related parameters of the nonlinear device when the signal to be measured is transmitted.