A signal analyzing circuit is described, with at least a first channel, the first channel comprising a digitizer configured to digitize an input signal into a time-and-value-discrete signal; a switching unit coupled to the digitizer, the switching unit being adapted to receive the time-and-value-discrete signal and an acquisition memory coupled to the switching unit. The switching unit is adapted to selectively activate a decimator unit in a time-domain operation mode, the decimator unit decimating the time-and-vale-discrete signal to a decimated time-and-value-discrete signal or a digital down converter unit in a spectrum view operation mode, the digital down converter unit down-converting the time-and-value-discrete signal to a down-converted time-and-value-discrete signal. The aid acquisition memory is coupled to the decimator unit in the time-domain operation mode to store the decimated time-and-value-discrete signal, the acquisition memory being not coupled to the digital down converter unit in the time-domain operation mode. The acquisition memory is coupled to the digital down converter unit in the spectrum view operation mode to store the down-converted time-and-value-discrete signal, the acquisition memory being not coupled to the decimator unit in the spectrum view operation mode. In addition, an oscilloscope and a method for auto setting an oscilloscope are described.

This invention relates to an apparatus, a method and a computer program for calculating one or more scattering parameters of a linear network, the network including a number of N ports adapted to provide electric connections. The apparatus is configured to calculate, and the method includes calculating, one or more scattering parameters of the linear network, which are related to a reference impedance, on the basis of a measured electrical response at one or more ports of the linear network to an incident wave applied at a port of the linear network, measured under the condition that one or more of other ports of the linear network face a reflection coefficient with an amplitude of 0.5 or larger. The computer program is adapted to perform such a method and runs on a computer.

A system for non-invasive microwave testing a bottle of wine may include an emission probe for emitting a microwave signal through a wall of the bottle into the wine and a detection probe for receiving at least a portion of the microwave signal from the wine via the wall.

A system for non-invasive microwave testing a bottle of wine may include an emission probe for emitting a microwave signal through a wall of the bottle into the wine and a detection probe for receiving at least a portion of the microwave signal from the wine via the wall.

A signal generating method for generating a visible light signal is provided. The method includes determining, as a method for transmitting a visible light signal from a transmitter, one of a single-frame transmitting method for transmitting data as one frame and a multiple-frame transmitting method for transmitting the data while dividing the data into a plurality of frames. The method further includes, when the multiple-frame transmitting method is determined, generating partition type information indicating a type of data to be transmitted, and generating combination data by adding the partition type information to the data to be transmitted. Further, the method includes generating the plurality of frames each of which includes each of a plurality of data parts by dividing the combination data into the plurality of data parts, and generating the visible light signal by adding a preamble to a head of each of the plurality of frames.

A signal generating method for generating a visible light signal is provided. The method includes determining, as a method for transmitting a visible light signal from a transmitter, one of a single-frame transmitting method for transmitting data as one frame and a multiple-frame transmitting method for transmitting the data while dividing the data into a plurality of frames. The method further includes, when the multiple-frame transmitting method is determined, generating partition type information indicating a type of data to be transmitted, and generating combination data by adding the partition type information to the data to be transmitted. Further, the method includes generating the plurality of frames each of which includes each of a plurality of data parts by dividing the combination data into the plurality of data parts, and generating the visible light signal by adding a preamble to a head of each of the plurality of frames.

A thermal abnormality detection system includes: a first heat dissipation system having a first temperature sensor for measuring an actual temperature of the first heat dissipation system; a second heat dissipation system having a second temperature sensor for measuring an actual temperature of the second heat dissipation system. Assuming that a difference between the actual temperature of the first heat dissipation system and an upper limit temperature of the first heat dissipation system is d1, and a difference between the actual temperature of the second heat dissipation system and an upper limit temperature of the second heat dissipation system is d2, when a value of d1d2 is greater than an error threshold value Error1_level, the first heat dissipation system is determined to be abnormal, and when the value of d1d2 is less than an error threshold value Error2_level, the second heat dissipation system is determined to be abnormal.

The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.

A system for measuring and mapping sheet resistivity of the film on flat-panel has a frame, a collection of leveling chucks, a probe-mounting assembly, and a collection of four-point probes. The probe-mounting assembly is a frame that holds the four-point probes in place. The leveling chucks and the probe-mounting assembly are mounted onto the frame, within the probe chamber. The flat panel is positioned in between the probe-mounting assembly and the leveling chucks. The sheet resistivity measurement by each of the collection of four-point probes can be done by electrical switching instead of mechanical repositioning and the flat panel transportation to and from the measurement position only needs to be done in one round trip instead of two, thus much time is saved. Also, the leveling chuck's speed in pressing the flat panel against the collection of four-point probes can be well controlled to avoid damaging of the flat panel.

A calculation method includes acquiring N matrices corresponding to N sets, each of N matrices being a matrix of a circuit network including first and second terminals, each of N sets being a set of first voltage applied to first terminal and second voltage applied to second terminal, and extracting values of L parameters based on N matrices using a first model of an intrinsic circuit and a second model of a distributed constant circuit. First model is represented by a function of at least one of first voltage and second voltage, each of L/2 impedance elements includes first end connected to one of first to sixth terminals, and second end connected to terminal other than the one of first to sixth terminals, and second model is represented by values of L parameters including two real number parameters related to impedance of each of L/2 impedance elements.