Patent classifications
G01R27/32
Millimeter wave active load pull using low frequency phase and amplitude tuning
A load pull system for making measurements on a DUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control of each signal at low frequency before being upconverted to the millimeter wave measurement frequencies. The measured signals at the DUT plane may be down-converted for measurement with a low frequency analyzer.
Millimeter wave active load pull using low frequency phase and amplitude tuning
A load pull system for making measurements on a DUT at millimeter wave frequencies using active tuning. The system uses phase and amplitude control of each signal at low frequency before being upconverted to the millimeter wave measurement frequencies. The measured signals at the DUT plane may be down-converted for measurement with a low frequency analyzer.
System for vector network analysis of a device under test as well as method for vector network analysis of a device under test
A system for vector network analysis of a device under test, comprising at least two measurement receivers, at least one signal generator device formed separately from the at least two measurement receivers, and at least one data processing unit connected with the measurement receivers. The connection between the data processing unit and at least one of the measurement receivers is flexible so that the position of the measurement receiver is adjustable. Further, a method for vector network analysis of a device under test is described.
Low frequency active load pull tuner
A low frequency active load pull tuner allows creating and controlling the reflection factor in a different frequency range than the operation frequency. It includes an active feedback loop and a remotely controlled digital electronic tuner, wherein the electronic tuner operates at an ordinary octave wide (Fmax/Fmin=2) frequency range (i.e. as an example 1-2 GHz), which leads to a low intermediate frequency band of 6 octaves or more. All required MHz range components for the tuner, except the custom-made digital electronic tuner, are readily available.
Low frequency active load pull tuner
A low frequency active load pull tuner allows creating and controlling the reflection factor in a different frequency range than the operation frequency. It includes an active feedback loop and a remotely controlled digital electronic tuner, wherein the electronic tuner operates at an ordinary octave wide (Fmax/Fmin=2) frequency range (i.e. as an example 1-2 GHz), which leads to a low intermediate frequency band of 6 octaves or more. All required MHz range components for the tuner, except the custom-made digital electronic tuner, are readily available.
Simple directional coupler
Low loss high directivity wire couplers use a wire over ground transmission airline structure and a low diameter coaxial cable ending in a wire loop sensor, which is inserted into ground wall of the transmission line leading into a coupled and an isolated port. Higher, capacitively induced, electrical current, because of the confined zone between signal conductor and ground wall, compares favorably with the antiphase magnetically induced current component in the wire loop sensor and leads to increased coupling and directivity over a frequency range up to at least 70 GHz.
Simple directional coupler
Low loss high directivity wire couplers use a wire over ground transmission airline structure and a low diameter coaxial cable ending in a wire loop sensor, which is inserted into ground wall of the transmission line leading into a coupled and an isolated port. Higher, capacitively induced, electrical current, because of the confined zone between signal conductor and ground wall, compares favorably with the antiphase magnetically induced current component in the wire loop sensor and leads to increased coupling and directivity over a frequency range up to at least 70 GHz.
SYSTEMS AND METHODS FOR VECTOR-SHORT-OPEN-CALIBRATION DE-EMBEDDING OF MICROWAVE CIRCUITS
A method of de-embedding a feed line is shown. The method includes measuring network parameters of a multilayered planar substrate and obtaining network parameters of a feed line using a short-open-calibration (SOC) according to an ABCD-matrix. An “a” block of the ABCD-matrix includes a first matrix multiplied by a transpose of a first short-circuit current. The first matrix is an inverse of a difference of an open-circuit current and a second short-circuit current. A “c” block of the ABCD-matrix includes the open-circuit current multiplied by the “a” block. The method includes de-embedding the network parameters of the feed line from the network parameters of the multilayered planar substrate to obtain microwave circuit network parameters and, responsive to the microwave circuit network parameters being within or not within a specified range, respectively approving or rejecting customer shipment of the microwave circuit.
Two-port on-wafer calibration piece circuit model and method for determining parameters
The present application provides two-port on-wafer calibration piece circuit models and a method for determining parameters. The method includes: measuring a single-port on-wafer calibration piece circuit model corresponding to a first frequency band to obtain a first S parameter; calculating, according to the first S parameter, an intrinsic capacitance value of a two-port on-wafer calibration piece circuit model corresponding to the single-port on-wafer calibration piece circuit model; measuring the two-port on-wafer calibration piece circuit model corresponding to the terahertz frequency band to obtain a second S parameter; and calculating a parasitic capacitance value and a parasitic resistance value of the two-port on-wafer calibration piece circuit model according to the second S parameter and the intrinsic capacitance value.
Load pull system using two-probe waveguide tuner
A new load-pull tuner system using two-probe waveguide slide screw tuners of which the probes share the same waveguide section; they are inserted diametrically at fixed depth facing each other into slots on opposite broad walls of the waveguide. An adjustable broadband attenuator made using a resistive septum is inserted between the test port and the tuning probes. The tuner does not have cumbersome adjustable vertical axes controlling the penetration of the probes and its low profile is optimized for on-wafer operations. The carriages holding the probes are moved along the waveguide using electric stepper motors or linear actuators.