A frequency characteristic measurement device that measures the frequency characteristic of a measurement target includes: a multi-sine signal generation unit that generates a multi-sine signal; a sweep sinusoidal wave generation unit that generates a plurality of sweep sinusoidal waves; an input signal switching unit that selects any one of the multi-sine signal and the sweep sinusoidal waves so as to input the selected one to the measurement target; a data acquisition unit that acquires, at a predetermined sampling frequency, sampling data of an input signal which is input to the measurement target and sampling data of an output signal which is output from the measurement target; and a characteristic calculation unit that calculates a frequency characteristic including the gain and the phase of the input and output signals in the measurement target from the sampling data of the input and output acquired.

A frequency characteristic measurement device that measures the frequency characteristic of a measurement target includes: a multi-sine signal generation unit that generates a multi-sine signal; a sweep sinusoidal wave generation unit that generates a plurality of sweep sinusoidal waves; an input signal switching unit that selects any one of the multi-sine signal and the sweep sinusoidal waves so as to input the selected one to the measurement target; a data acquisition unit that acquires, at a predetermined sampling frequency, sampling data of an input signal which is input to the measurement target and sampling data of an output signal which is output from the measurement target; and a characteristic calculation unit that calculates a frequency characteristic including the gain and the phase of the input and output signals in the measurement target from the sampling data of the input and output acquired.

A method of simulating an effect of interactions between a device under test and a scattering object by of a hybrid over-the-air (OTA) test system is described. The method includes the steps of determining at least one radiation parameter of the device under test, wherein the at least one radiation parameter is associated with electromagnetic waves emitted by the device under test; determining an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test; assigning material properties to a Huygens box confined by the Huygens surface, wherein the material properties are associated with at least one of reflection of electromagnetic waves and absorption of electromagnetic waves; and simulating an electromagnetic interaction between the device under test and the scattering object based on the determined equivalent source and based on the assigned material properties.

A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.

A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.

A layer arrangement for a phased array antenna comprises phase shifting units arranged between stacked dielectric layers with a tunable dielectric material sandwiched in-between. Each phase shifting unit comprises a transmission line with phase shifting capabilities that is electrically connected with bias lines to a biasing circuit. A dielectric layer is made from an optically transparent material. An overlapping section of the bias lines of each of the phase shifting units is made from an optically transparent and electroconductive material. The tunable dielectric material affects the transmission or reflection of light that illuminates the tunable dielectric material depending on the respective tuning state. Testing this layer arrangement comprises illuminating the layer arrangement by light while a predetermined electric bias potential is applied to at least some of the phase shifting units, and during which the light emission from the layer arrangement is detected and compared with an expected light emission.

Footwear scanning systems and associated methods are described. According to one aspect, a footwear scanning system includes a base, a shuttle configured to rotate beneath the base, wherein the shuttle comprises an antenna array configured to transmit electromagnetic waves through the base into footwear above the base during the rotation of the shuttle and to receive electromagnetic waves reflected from the footwear during the rotation of the shuttle, a transceiver coupled with the antenna array and configured to apply electrical signals to the antenna array to generate the transmitted electromagnetic waves and to receive electrical signals from the antenna array corresponding to the received electromagnetic waves, and processing circuitry configured to process an output of the transceiver corresponding to the received electromagnetic waves to provide information regarding contents within the footwear.

A multi-stage process for the production of an ISO 8217 Table 2 residual marine fuel Product Heavy Marine Fuel Oil from a Feedstock Heavy Marine Fuel Oil that is ISO 8217:2017 Table 2 compliant except for the Environmental Contaminants involves a Reaction System composed of one or more reactor vessels selected from a group reactor wherein said one or more reactor vessels contains one or more reaction sections configured to promote the transformation of the Feedstock Heavy Marine Fuel Oil to the Product Heavy Marine Fuel Oil. The Product Heavy Marine Fuel Oil has an Environmental Contaminant level less than 0.5 wt % and preferably a maximum sulfur content (ISO 14596 or ISO 8754) between the range of 0.05 mass % to 0.5 mass %. A process plant for conducting the process for conducting the process is also disclosed.

Accurately measuring bio-impedance is important for sensing properties of the body. Unfortunately, contact impedances can significantly degrade the accuracy of bio-impedance measurements. To address this issue, a method is provided for estimating an impedance matrix of parasitic network disposed between a first network and a second network of a bio-impedance measurement system, the method comprising determining an impedance matrix for the first network (Z.sub.MUX) based on an impedance matrix for the second network (Z.sub.LOAD) for at least one known load condition; fitting Z.sub.MUX values for Z.sub.LOAD for the at least one known load condition to estimate parameters of the impedance matrix of the intervening network.

Various aspects of the disclosure relate to evaluating the electromagnetic impedance characteristics of a material under test (MUT) over a range of frequencies. In particular aspects, a system includes: an electrically non-conducting container sized to hold the MUT, the electrically non-conducting container having a first opening at a first end thereof and a second opening at a second, opposite end thereof; a transmitting electrode assembly at the first end of the electrically non-conducting container, the transmitting electrode assembly having a transmitting electrode with a transmitting surface; and a receiving electrode assembly at the second end of the electrically non-conducting container, the receiving electrode assembly having a receiving electrode with a receiving surface, wherein the receiving electrode is approximately parallel with the transmitting electrode, and wherein the transmitting surface of the transmitting electrode is larger than the receiving surface of the receiving electrode.