A method for determining at least one lineal parameter of a transmission line comprises the following steps: determining at least one measurement of the complex propagation factor γ as a function of frequency on the basis of at least one measurement carried out on the transmission line, determining at least one measurement of the lineal attenuation α of the transmission line equal to the real part of the measurement of the complex propagation factor γ and/or at least one measurement of the phase factor β of the transmission line equal to the imaginary part of the measurement of the complex propagation factor γ, filtering the measurement of the lineal attenuation α and/or the measurement of the phase factor β on the basis of a polynomial frequency regression model dependent on the physical characteristics of the transmission line.

Described herein is a method and apparatus for measuring the potential on a modern shielded high-voltage cable such as those used in medium-voltage distribution networks. A capacitive sensor arrangement (100) is constructed on a cable (110) using pre-existing structures (114, 116, 118, 120) within the cable (110). The use of implicit guarding methods is also described that allows the use of the semiconductor layer (116) present in modern cable design to be retained and to form part of the capacitive sensor arrangement (100). Performance of the sensor arrangement (100) can also be improved using temperature compensation techniques.

Described herein is a method and apparatus for measuring the potential on a modern shielded high-voltage cable such as those used in medium-voltage distribution networks. A capacitive sensor arrangement (100) is constructed on a cable (110) using pre-existing structures (114, 116, 118, 120) within the cable (110). The use of implicit guarding methods is also described that allows the use of the semiconductor layer (116) present in modern cable design to be retained and to form part of the capacitive sensor arrangement (100). Performance of the sensor arrangement (100) can also be improved using temperature compensation techniques.

A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received. In the case of generating the digital instruction signal by the signal source, the device under test includes circuitry configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module. The analysis module includes circuitry configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test. Moreover, a measurement method for characterizing a device under test is described.

Provided herein are systems, methods and apparatuses for a Biomarker sensor.

An S-parameter of a reference impedance is determined and converted to a desired mode of operation. Example modes of operation include a single-ended input output mode, a differential input output mode, and a common input output mode. The complex values of the impedance at each port as a function of frequency can be computed using the novel closed-form quadratic S-parameter equation which utilizes the concept of matched networks by setting the reflections and re-reflections to zero through S-parameter renormalization. Using the S-parameter renormalization, the insertion loss corresponding to zero reflections and re-reflections is calculated. Based on the determination of the matching impedance used to reduce the reflections and re-reflections to zero, a parameter of a circuit comprising the network may be modified to reduce noise.

An S-parameter of a reference impedance is determined and converted to a desired mode of operation. Example modes of operation include a single-ended input output mode, a differential input output mode, and a common input output mode. The complex values of the impedance at each port as a function of frequency can be computed using the novel closed-form quadratic S-parameter equation which utilizes the concept of matched networks by setting the reflections and re-reflections to zero through S-parameter renormalization. Using the S-parameter renormalization, the insertion loss corresponding to zero reflections and re-reflections is calculated. Based on the determination of the matching impedance used to reduce the reflections and re-reflections to zero, a parameter of a circuit comprising the network may be modified to reduce noise.

A measurement system and a method of removing effects of instability of the measurement system while measuring at least one S-parameter of a device under test (DUT) are provided. The method includes initially determining a characteristic of the measurement system, including identifying a location of an instability in the time domain of the measurement system; determining a change of the characteristic of the measurement system while connected to the DUT; and compensating for the determined change of the characteristic of the measurement system while connected to the DUT by removing effects of the determined change on measurements of the at least one S-parameter of the DUT.

A first radio frequency scan of a plurality of electronic circuit devices fixed to a structural component of a physical structure can be initiated. Data can be received from each electronic circuit device that is scanned, the data received from each electronic circuit device indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices that are scanned, the received data can be stored to a first memory. The data for the electronic circuit devices forms a baseline measurement of the electronic circuit devices to which impedance data gathered from subsequent radio frequency scans of the electronic circuit devices is compared to determine whether any of the conductors of the electronic circuit devices have deformed or broken.

Provided is a technique for specifying a medium more simply. A medium sensor device includes an antenna, a storage unit that stores a medium identification table in which a medium corresponding to an antenna impedance has been determined beforehand, and a medium specification unit that specifies the impedance of the antenna and specifies a medium in the vicinity of the antenna by referring to the medium identification table.