Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.

A testing system includes a load board that includes a first circuit board, a first external connector attached to the first circuit board, and a thermal module configured to hold a system-on-wafer structure including a connector and a socket, a connector structure including a second circuit board, wherein the second circuit board is electrically connected to the first external connector, and a second external connector configured to connect to the connector of the system-on-wafer structure, and a test structure configured to connect to the socket of the system-on-wafer structure, the test structure including a third circuit board and pins, wherein adjacent pairs of pins of the test structure are electrically coupled through the third circuit board to form a continuous conductive path extending alternately between the system-on-wafer structure and the adjacent pairs of pins of the test structure.

A portable probe stand assembly including a hand-held frame, a gravity tilt unit, and a probe holder. The hand-held frame includes a frame body with a cut-out and two gripping handles. The gravity tilt unit includes a movable part that has a pivot portion rotatably connected to the hand-held frame. The movable part tends to pivot due to gravity to turn the portable probe stand assembly to a hand-held state where a portion of an underside abutting surface of the movable part is disposed out of the cut-out. The portable probe stand assembly is convertible from the hand-held state to a usage state where the movable part is leveled via a pivot movement of the movable part upon engaging the underside abutting surface with a surface of an object.

In one example, an apparatus comprises a backplane to attach an array of light emitting diodes (LED), the backplane comprising an array of display driver circuits, each display driver circuit of the array of display driver circuits corresponding to an LED of the array of LEDs and comprising: a current driver circuit configured to supply to a current to the corresponding LED; a control signal generator circuit configured to supply a driver control signal to the current driver circuit to control the current; and one or more monitor circuits controllable to provide access to at least one of: the current, or an internal voltage of at least one of the current driver circuit or the control signal generator circuit.

Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.

Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.

A flexible monitoring system and corresponding methods of use are provided. The system can include a base containing backplane, and one or more circuits communicatively coupled to the backplane. The circuits can be designed with a common architecture that is programmable to perform different predetermined functions, such as input, output, and processing. By separating functions of the flexible monitoring system into different circuits, new implementations of the flexible monitoring system can be rapidly developed by arranging already created components in different combinations. Multiple bases can also be communicatively coupled in a manner that establishes a common backplane between respective bases. Accordingly, implementations of the flexible monitoring system distribute combinations of circuits across different bases, providing flexible deployment options.

Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.

A test data integration system and a method thereof are provided. The method includes: collecting, by each of a plurality of client devices, a plurality of test information obtained from coupled automatic test equipment when performing a test operation, and transmitting the plurality of test information to a server; receiving, by the server, the plurality of test information, and generating a graphical user interface according to the plurality of test information and displaying an integration analysis result corresponding to the plurality of test information.

A flexible monitoring system and corresponding methods of use are provided. The system can include a base containing backplane, and one or more monitoring circuits. The monitoring circuits can be designed with a common architecture that is programmable to perform different predetermined functions. As a result, monitoring circuits can be shared between different implementations of the flexible monitoring system. Multiple bases that can be communicatively coupled in a manner that establishes a common backplane between respective bases that is formed from the individual backplanes of each base. Each monitoring circuit is not limited to sending data to and/or receiving data from the backplane to which it is physically coupled but can instead can communicate along the common backplane. Computational processing capacity can be increased or decreased independently of input signals received by addition or removal of processing circuits from the monitoring system.