An electronic monitoring circuit for detecting a variation in the power or current absorbed by an electronic circuit under test is disclosed. The circuit includes an input terminal adapted to receive a pulse-width modulation control signal, a resistor having a first terminal connected to the input terminal, and a capacitor having a first terminal connected to a second terminal of the resistor. The output terminal is adapted to generate an output signal as a function of the value of the voltage drop at the ends of the capacitor, said output signal being representative of a variation of the pulse width of the pulse-width modulation control signal. The variation of the pulse width is a function of the power or current absorbed by the electronic circuit under test.

Disclosed is a capability test method based on a joint test support platform. The method includes steps of describing an initial capability in a test, combining a capability to be developed based on the initial capability, and determining an evaluation strategy and a joint task background information of the test. Further, the method includes generating a logical shooting range for the joint test support platform according to the joint task background information, developing a test scenario according to the joint task background information and the logical shooting range, decomposing the test scenario, determining a test plan corresponding to the test scenario, executing the test according to the test plan, analyzing and evaluating a test result of the test, and generating one or more joint capability evaluation reports for the test.

A method of inspecting a temperature controlling system is provided. The method includes generating a measurement matrix based on current measurement values of the temperature controlling system, calculating a transformation matrix having the same dimensions as the measurement matrix based on the measurement matrix, calculating an auxiliary matrix having the same dimensions as the measurement matrix based on the transformation matrix, and calculating a defect matrix representing defective diodes among the plurality of diodes, based on a difference operation between the auxiliary matrix and the transformation matrix.

According to one embodiment, a method for evaluating a magnetic head is disclosed. The method can include measuring an electrical characteristic of a current path when an alternating-current magnetic field is applied to the magnetic head. The magnetic head includes the current path. The current path includes an oscillator. The method can include, based on the electrical characteristic, deriving a frequency value relating to an oscillation frequency of the oscillator.

A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.

Facilitating fault detection of a system using a test input including a linear combination of inputs of the system is presented herein. A test signal component generates, via a test procedure, a test input signal including a first linear combination of at least two input signals of the system, and applies the test input signal to the system during a phase of respective phases of the test procedure; and a fault detection component detects a fault of the system based on a test output signal corresponding to the test input signal and a second linear combination of respective output signals of the system corresponding to the at least two input signals.

This application discloses an electrical control device detection circuit, a detection method, and an electric vehicle. The detection circuit includes a drive circuit configured to detect an electrical control device. The drive circuit includes a drive power module, a high-side switch unit, and a low-side switch unit. The detection circuit includes: a detection power module, a first switch module, a second switch module, a first detection module, a second detection module, and a control module. The control module is configured to obtain an electrical signal at a third end of the first detection module and/or an electrical signal at a second end of the second detection module; and determine, based on the electrical signal at the third end of the first detection module and/or the electrical signal at the second end of the second detection module, whether a fault occurs in the drive circuit of the electrical control device.

An apparatus performs methods for device diagnostics based on signals from digital outputs. The apparatus includes an input/output module with a digital output module to be coupled to a device. The input/output module measures one or more characteristics of a digital signal provided by the digital output module, where at least one of the one or more characteristics of the digital signal is associated with an output current of the digital output module. The input/output module also performs one or more diagnostics using the one or more measured characteristics of the digital signal.

A sampling clock testing circuit includes a clock circuit, a processing circuit and a phase determining circuit. The clock circuit generates a clock signal and switches phases of the clock signal according to a horizontal synchronous signal. The processing circuit samples a data signal according to the clock signal with the phases to generate pixel data groups each of which is corresponding to one phase. The phase determining circuit generates calculated values according to the pixel data groups, in which each phase is corresponding to one calculated value. The phase determining circuit selects a specific calculated value from the calculated values according to a predetermined condition, and determines a specific phase corresponding to the specific calculated value. The processing circuit samples a subsequent data signal according to the clock signal switched to the specific phase to generate subsequent pixel data.

Disclosed are a reliability test fixture and an online test device (100) for a flexible display component. The fixture comprises a support (110) and a rotating shaft (120) rotatably mounted on the support. A engagement recess (122) for fixing a flexible display component is provided in an axial direction on the surface of the rotating shaft (120). A test module (130) used to detect an electrical parameter of an internal circuit of the flexible display component is disposed inside the rotating shaft (120). The test module (130) has a test contact (132) for electrically connecting to the flexible display component. During a test, the flexible display component is fixed in the engagement recess (122) and is electrically connected to the test module (130). In this way, each time the rotating shaft (120) bents the flexible display component, the test module (130) can timely detect the electrical parameter of the internal circuit of the bent flexible display component. The reliability test fixture and online device can form an online reliability test device of a flexible display component, so as to test in real time the change of the internal circuit of the flexible display component.