Efficient production testing of integrated circuits. A first production test is implemented on a group of integrated circuits and failures among the test group are assessed. Specifically, the results of the first test are analyzed such that integrated circuits having a recoverable fail and integrated circuits having a non-recoverable fail are differentiated. The integrated circuits are integrated based on the analyzed results and a second production test is implemented. The second production test tests the integrated circuits responsive to the segregation, such that the second production test is limited only to integrated circuits with a recoverable fail. The next succeeding production test will then use the new test program in the second production test with the handler bin designated as having integrated circuits not to be re-tested.

Integrated test fixtures, universal test fixtures, integrated test systems, and method for testing electronic devices. In some aspects, an integrated test fixture is configured to perform both Hi-pot testing and functional testing on a unit-under-test, i.e., while the unit-under-test remains in place in the test fixture. In some aspects, a universal test fixture comprises a processor and/or a non-transitory tangible medium that is configured to provide instructions to carry out such testing. Also, methods of testing.

A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

A test system measures parameters of a device under test (DUT), including a transistor. The test system includes a first voltage source unit for supplying a gate voltage; a second voltage source unit for supplying one of a drain voltage or a source voltage, the second voltage source having a current measurement device for detecting one of a drain current or a source current flowing through the transistor, respectively; a feedback unit for outputting a feedback current, based on the one of the drain or source currents; and an error amplifier for outputting a feedback control signal, based on comparison of the feedback current and a target current value. The first voltage source unit adjusts the gate voltage based on the feedback control signal so that the one of the drain or source currents converges to match the target current value.

A method and an apparatus for measuring linearity of a tested circuit are provided. The method includes: utilizing a signal generator to output a first tone signal and a second tone signal, wherein the tested circuit generates an intermodulation signal according to the first tone signal and the second tone signal; utilizing a signal analyzing device to detect an intermodulation power of the intermodulation signal; utilizing the signal generator to further output a cancel tone signal and control a cancel power of the cancel tone signal according to the intermodulation power; and utilizing the signal analyzing device to detect a total power of the intermodulation signal and the cancel tone signal, and controlling a phase of the cancel tone signal according to the total power, in order to minimize the total power in response to the phase of the cancel tone signal being modified to a target phase.

A method and system for controlling a power supply rail. The method includes adjusting a power supply rail for circuit component(s) to a first setting. The method includes determining voltage sample(s) by sampling an input voltage corresponding to an input signal. The method also includes determining whether the voltage sample(s) breach a first or second voltage threshold. Additionally, the method includes adjusting the power supply rail to a second setting if a predetermined quantity of the voltage sample(s) breach the first voltage threshold, wherein a magnitude of the second setting equals or is greater than a magnitude of the first setting; and adjusting the power supply rail to a third setting if the voltage sample(s) are captured during at least a threshold amount of time and do not breach the second voltage threshold. The magnitude of the first setting is greater than a magnitude of the third setting.

A method for performing a diagnostic test on a multilevel converter is provided. The method can include: selectively switching (S1) at least one first module into series positive or into series negative with at least one second module; connecting (S2) at least one third module of remaining modules into series positive and/or into series negative and/or in parallel to one another; and charging or discharging (S3) the at least one first module from or to the at least one or more of the remaining modules at a first predefined charge or discharge rate until a first predefined criterion is reached. When the first predefined criterion is reached, the at least one first module N1 can be discharged or charged from or to the at least one or more of the remaining modules Nnd at a second predefined discharge or charge rate until a second predefined criterion is reached.

An integrated circuit may operate voltage monitoring of one or more electronic components using hierarchical techniques. An apparatus may include digital controllers implemented in a hierarchal structure that may be instantiated closer to a group of sensors which are then indirectly monitored by other digital controllers.

A display panel includes pixel units, data lines, first fan-out lines located in an active area, second fan-out lines, test circuit units, and test signal lines located in a non-active area. A first fan-out line is electrically connected to a corresponding first data line. Each test circuit unit includes switches including first switches and second switches. First ends of the first switches are electrically connected to the first fan-out lines through corresponding second fan-out lines. First ends of second switches are electrically connected to corresponding second data lines through corresponding second fan-out lines. Second ends of switches electrically connected to corresponding pixel units in the same column are electrically connected to the same test signal line. Second ends of switches electrically connected to corresponding pixel units in two adjacent columns are electrically connected to different test signal lines.

The subject disclosure relates to a system and method for testing units-under-test (UUT) with a thermal shock. The thermal shock testing system can include a chamber having an inlet and an outlet, the chamber being configured to provide a thermal shock to a unit-under-test (UUT), a pump configured to fluidly connect to the inlet of the chamber and direct a temperature controlled liquid through a channel embedded in the chamber, and a boiler and a chiller fluidly connected to the pump, the temperature of the liquid being controlled by at least one valve configured to alternatively direct hot or cold fluid to the inlet of the chamber.