Semiconductor devices that include test circuitry to measure internal signal wire propagation delays during memory access operations, and circuity configured to store delay information that is used to configure internal delays based on the measured internal signal propagation circuit delays. The semiconductor device includes a test circuit configured to measure a signal propagation delay between a command decoder and a bank logic circuit based on time between receipt of a test command signal directly from the command decoder and a time of receipt of the test command signal routed through the bank logic circuit.

A detection circuit for detecting a clock signal includes a multiplexer, a digital-to-analog converter, a comparator, and a counter. The multiplexer outputs either a first signal or a second signal as a selection signal. The digital-to-analog converter outputs a reference voltage according to the selection signal. The comparator compares the clock signal to the reference voltage to generate a comparison signal. The counter counts a reference clock signal to generate an overflow signal, and resets the overflow signal according to the comparison signal. The overflow signal indicates the amplitude of the clock signal.

An integrated circuit device may include core circuitry, and a set of external interface buffer circuits coupled to the core circuitry. To improve test time and accuracy, as well as to simplify test procedures during voltage testing of the set of external interface buffer circuits, the integrated circuit device may include a test circuit and a combinational logic circuit coupled to the set of external interface buffer circuits. The combinational logic circuit is configured to combine a logic level of each of the external interface buffer circuits into a test signal, and the test circuit is configured to execute a voltage test on the set of external interface buffer circuits based on a logic level of the test signal.

A method for detecting perturbations in a logic circuit including a plurality of datapaths coordinated by a clock signal and at least one test circuit having a programmable length datapath for varying a test propagation delay. The test circuit further including inputs, an output and an error generator for providing an error in case that the output is different than an expected output for the inputs. The test circuit having a calibration mode including determining a critical propagation delay by varying the programmable length datapath until the error generator outputs an error, adjusting the programmable length datapath to include therein a tolerance delay, and switching into a detection mode configured to detect a perturbation in the logic circuit along the programmable length datapath in case the error generator outputs an error.

The present invention provides a glitch detector including a first inverter, a second inverter, a first capacitor and a second capacitor. The first inverter is connected between a supply voltage and a ground voltage, and is configured to receive a first signal at a first node to generate a second signal to a second node. The second inverter is connected between the supply voltage and the ground voltage, and is configured to receive the second signal at the second node to generate the first signal to the first node. A first electrode of the first capacitor is coupled to the supply voltage, and a second electrode of the first capacitor is coupled to the first node. A first electrode of the second capacitor is coupled to the ground voltage, and a second electrode of the second capacitor is coupled to the second node.

Various embodiments of the present disclosure provide a scan-based architecture for register-transfer-level (RTL) or gate-level designs that improves the security of scan chain-based design-for-testability (DFT) structures. In various embodiments, the scan-based architecture includes invisible scan chains that are hidden in such a way that an attacker cannot easily identify or locate the invisible scan chains for exploitation and revealing internal secure information of the design. The invisible scan chains are dynamically configurable into a scan chain with select flip-flops, such that scan paths of the invisible scan chains may be different between different designs, chips, or testing operations. Various embodiments further employ key-based obfuscation by combining a scan control finite state machine with existing state machines within a design, which improves design security against unauthorized use and increases confidentiality. Specific sequences of key patterns cause the design to transition into a test mode or a normal mode.

Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communication channels adapted to a specific communication task, without separate signal lines, for example. The bidirectional dedicated real-time handler interface can be used to transmit thermal control signals, and the transmitted signals can be test site specific. The real-time signaling advantageously improves testing accuracy and efficiency.

An input device including an input circuit with an input connection point for applying an input signal and with an input signal path which leads from the input connection point to an evaluation input and on which a conversion of the input signal into an evaluation signal is effected, an evaluation device which includes the evaluation input and which is designed to recognise an input signal level of the input signal on the basis of the evaluation signal, wherein the evaluation device is further designed to carry out a functionality test of the input device and within the framework of the functionality test by way of providing a test signal to effect a first change of the evaluation signal and to test the functionality of the input device on the basis of the effected first change of the evaluation signal, wherein the input circuit includes a transistor which is connected into the input signal path, and the input circuit is designed to control a control terminal of the transistor on the basis of the test signal, in order to effect the first change of the evaluation signal.

A device is provided for time measurement of a clock-based signal comprising a sample stage comprising a switching device that is driven by a control signal and a capacitance (Cs), wherein the sample stage is arranged to transform an analog input signal in an analog output signal, the device further comprising an analog-to-digital converter to convert the analog output signal into a digital output signal, wherein the input signal applied to the sample stage is a reference signal and wherein the clock-based signal is applied to the control signal. Also, an according method is suggested.

An integrated circuit is provided that comprise a receive unit to be tested for receiving an input signal and storing the input signal at a predetermined point of time. Additionally, it comprises a processor for applying an error correction to the received input signal, for comparing the error corrected signal with an expectation value and for outputting an error message when the filtered input signal does not correspond to the expectation value. A power source supplies the receive unit to be tested with an adjustable voltage and/or and adjustable current. An adjustment unit varies the predetermined point in time and the adjustable voltage respectively the adjustable current.