A display device according to various embodiments comprises: a pixel layer comprising a plurality of pixels and having one or more parts of an area of an outer line, on which the plurality of pixels are disposed, depressively formed; and a wiring layer disposed along the depressively-formed one or more parts of the outer line, and comprising detection wiring for detecting cracks on an area adjacent to the pixel layer, wherein the wiring layer can be disposed below the pixel layer. Other various embodiments are possible.

A detection apparatus is for detecting interference on signal paths in a differential voltage measuring system with a signal measuring circuit for measuring bioelectric signals with a number of useful signal paths having at least one shield. In an embodiment, the detection apparatus includes at least one analysis unit, connected to the shield and embodied to detect interference in a useful signal path of the voltage measuring system via a signal measured at the shield in the case of interference.

Circuit test devices and methods are provided. The method includes measuring a voltage between first and second conductor points (CPs) of a circuit under test (CUT), and determining if the measured voltage is less than a low voltage threshold value (LVTV) indicative of electrical continuity (EC) between the first and second CPs. In response to determining that the measured voltage is less than the LVTV, the method includes: transmitting a test signal (TS) to the first or second CP, and determining if the test signal is received after being transmitted. In response to determining that the TS is received, a presence of EC between the first and second conductor points is reported, and in response to determining that the TS is not received, absence of EC between the first and second CPs, or a lack of electrical contact between the VMC and the first and/or second CP(s), is reported.

Circuit test devices and methods are provided. The method includes measuring a voltage between first and second conductor points (CPs) of a circuit under test (CUT), and determining if the measured voltage is less than a low voltage threshold value (LVTV) indicative of electrical continuity (EC) between the first and second CPs. In response to determining that the measured voltage is less than the LVTV, the method includes: transmitting a test signal (TS) to the first or second CP, and determining if the test signal is received after being transmitted. In response to determining that the TS is received, a presence of EC between the first and second conductor points is reported, and in response to determining that the TS is not received, absence of EC between the first and second CPs, or a lack of electrical contact between the VMC and the first and/or second CP(s), is reported.

A method for detecting an electrical arc in an electrical system including analyzing a reflectogram representative of a spatial distribution of impedance in said electrical system and, when an electric arc is identified in the reflectogram, incrementing a detection counter by one unit.

A monitoring set-up to detect supply-line faults for a control unit, including at least two internal current-carrying supply lines, which are redundant with respect to each other, are situated inside of the control unit, and are connected electrically, on one end, to external supply lines, respectively, and, on the other end, to a common, internal supply-potential layer of the control unit; a signal detector, which inductively picks up a flow of current through the individual internal supply lines and outputs at least one corresponding measuring signal; and an evaluation and control unit, which evaluates the at least one measuring signal to detect supply-line faults. A method of detecting supply-line faults for a control unit, using such a monitoring set-up, is also described.

A ring-shaped power supply system includes: a plurality of relays provided apart from each other on a ring-shaped power supply wire; a plurality of detectors, each provided between ones of the relays, for detecting an electrical change caused by a break when such a break has occurred in the ring-shaped power supply wire; and an arithmetic processor that localizes the point of the break in the ring-shaped power supply wire based on electrical changes detected by the plurality of detectors and cuts off ones of the relays located on both sides of the break point.

An electronic device according to certain embodiments comprises a printed circuit board (PCB); a processor mounted on the PCB; and a connection interface configured to connect the PCB to an off-board electronic component, wherein the processor is configured to: output an inspection signal to the connection interface according to a particular bit pattern at a designated bit rate; identify a voltage level of a reception signal input to the processor, during a designated time, in response to the output of the inspection signal particular bit pattern; and determine a connection state of the connection interface based on the identified voltage level of the reception signal.

A system for detecting a connection between two devices includes a first device and a second device. The first device includes a first connection terminal and a first reactance element connected to the first connection terminal. The second device includes a second connection terminal; a first resistance element, and a first frequency generator for allowing a signal to pass through the first resistance element and be applied to the first device via the second connection terminal. The second device further includes a first comparator having both input terminals connected to both ends of the first resistance element, and comparing and outputting a signal of both ends of the first resistance element, and a first control unit for determining whether or not the first connection terminal of the first device is connected to the second connection terminal by means of the output signal of the first comparator.

A system for testing a plurality of electrical circuits includes a first remote cooperative testing device including a testing component and a first transceiver and a second remote cooperative testing device including a conductive component and a second transceiver. In response to receiving instructions from a remote computing device, the first remote cooperative testing device locates a first electrical circuit and a second electrical circuit and selectively positions the testing component to electrically couple a first portion of the first electrical circuit to a first portion of the second electrical circuit at a first node, and the second remote cooperative testing device selectively positions the conductive component to electrically couple a second portion of the first electrical circuit to a second portion of the second electrical circuit at a second node, thereby forming a testing circuit between the first node and the second node.