An electronic device according to an embodiment of the disclosure may include a housing including a front plate, a back plate disposed to the opposite side of the front plate, and a side member surrounding a space between the front plate and the back plate, wherein at least a part of the back plate is constructed of a conductive material, and the side member includes an opening, a touch screen display disposed between the front plate and the back plate, a female connector disposed inside the opening, constructed to house a meal connector an external male connector, and including a plurality of pins, a Printed Circuit Board (PCB) disposed inside the space and including a ground plane, a circuit electrically coupled to the ground plane and/or mounted thereon to cut off leak current from the PCB, a first conductive path constructed between the circuit and a first point of at least part of the back plate, and a second conductive path constructed between at least one of the pins and a second point of at least part of the back plate. In addition, various other embodiments are also possible.

An electronic device according to an embodiment of the disclosure may include a housing including a front plate, a back plate disposed to the opposite side of the front plate, and a side member surrounding a space between the front plate and the back plate, wherein at least a part of the back plate is constructed of a conductive material, and the side member includes an opening, a touch screen display disposed between the front plate and the back plate, a female connector disposed inside the opening, constructed to house a meal connector an external male connector, and including a plurality of pins, a Printed Circuit Board (PCB) disposed inside the space and including a ground plane, a circuit electrically coupled to the ground plane and/or mounted thereon to cut off leak current from the PCB, a first conductive path constructed between the circuit and a first point of at least part of the back plate, and a second conductive path constructed between at least one of the pins and a second point of at least part of the back plate. In addition, various other embodiments are also possible.

Systems, methods, and computer-readable media are disclosed for monitoring and diagnosing power system assets. An example of a power system asset may include an individual circuit breaker, a switchgear that may include multiple circuit breakers, or any other asset that may be included in a power system. A system for monitoring and diagnosing these power system assets may include one or more intelligent protection relay and switchgear monitor device(s) that may be communicatively coupled in a master-slave or peer-peer configuration in a time-synchronized manner of operation.

Apparatus and associated methods relate to predicting failure and/or estimating remaining useful life of an air-data-probe heater. Failure is predicted or useful life is estimated based on an electrical metric of the electrical operating power provided to a resistive heating element of the air-data-probe heater. The electrical metric of the air data probe heater is one or more of: i) phase relation between voltage across the resistive heating element and leakage current, which is conducted from the resistive heating element to a conductive sheath surrounding the resistive heating element; ii) a time-domain profile of leakage current through the heating element insulation during a full power cycle; and/or iii) high-frequency components of the electrical current conducted by the resistive heating element and/or the voltage across the resistive heating element.

Apparatus and associated methods relate to predicting failure and/or estimating remaining useful life of an air-data-probe heater. Failure is predicted or useful life is estimated based on an electrical metric of the electrical operating power provided to a resistive heating element of the air-data-probe heater. The electrical metric of the air data probe heater is one or more of: i) phase relation between voltage across the resistive heating element and leakage current, which is conducted from the resistive heating element to a conductive sheath surrounding the resistive heating element; ii) a time-domain profile of leakage current through the heating element insulation during a full power cycle; and/or iii) high-frequency components of the electrical current conducted by the resistive heating element and/or the voltage across the resistive heating element.

A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.

There are disclosed fault detection circuits and methods for an N-to-1 Dickson topology hybrid DC-DC power converter. A short circuit fault detection circuit comprises: first and second measuring circuits configured to measure first and second voltages, Vsw1, Vsw2, at the switching node in the first and second state; first and second calculation circuits configured to calculate first and second absolute error voltage as an absolute difference of the respective first and second voltages in one operating cycle (Vsw1[n−1], Vsw2[n−1]) and in a next subsequent operating cycle (Vsw1[n], Vsw2[n]); and first and second fault circuits configured to provide first and second fault outputs indicative of a fault in response to the respective first or second absolute error voltage exceeding a short-circuit-trip level. Open circuit fault detection circuits and methods are also disclosed.

There are disclosed fault detection circuits and methods for an N-to-1 Dickson topology hybrid DC-DC power converter. A short circuit fault detection circuit comprises: first and second measuring circuits configured to measure first and second voltages, Vsw1, Vsw2, at the switching node in the first and second state; first and second calculation circuits configured to calculate first and second absolute error voltage as an absolute difference of the respective first and second voltages in one operating cycle (Vsw1[n−1], Vsw2[n−1]) and in a next subsequent operating cycle (Vsw1[n], Vsw2[n]); and first and second fault circuits configured to provide first and second fault outputs indicative of a fault in response to the respective first or second absolute error voltage exceeding a short-circuit-trip level. Open circuit fault detection circuits and methods are also disclosed.

The method determining one or more components of a number of components which can be driven in parallel according to power requirements. A wear value of a respective component is ascertained in dependence on ambient conditions, operating states, the supply voltage, and/or the supply current. An optimal number of components to be operated in parallel is ascertained for a current power requirement and is compared with the currently operated number of components. If the number of currently operated components is greater than the optimal number, the component with the greatest wear value is deactivated. If the number of currently operated components is less than the optimal number, the component or components which can be activated in principle are ascertained and then the activatable component with the lowest wear value is activated.

The method determining one or more components of a number of components which can be driven in parallel according to power requirements. A wear value of a respective component is ascertained in dependence on ambient conditions, operating states, the supply voltage, and/or the supply current. An optimal number of components to be operated in parallel is ascertained for a current power requirement and is compared with the currently operated number of components. If the number of currently operated components is greater than the optimal number, the component with the greatest wear value is deactivated. If the number of currently operated components is less than the optimal number, the component or components which can be activated in principle are ascertained and then the activatable component with the lowest wear value is activated.