A quantum-technological, micro-electro-optical or micro-electronic or photonic system includes a planar substrate of a direct or indirect semiconductor material. The system includes a microelectronic circuit including at least one transistor or diode. The system further includes a micro-optical subdevice and one or more nanoparticles, having one or more color centers. The surface of the of the planar substrate has a portion of a solidified colloidal film which is firmly bonded to the surface of the substrate. The portion of the solidified colloidal film includes the one or more nanoparticles. The system further includes a light-emitting electro-optical component. The light-emitting electro-optical component interacts optically with the micro-optical subdevice. The light-emitting electro-optical component interacts electrically and/or optically with the electrical component through the micro-optical subdevice. The interaction between the light-emitting electro-optical component and the electrical component takes place with an involvement of the color center or a plurality of color centers.

A magnetometry apparatus includes an array of magnetometer pixels. Each magnetometer pixel includes an electron spin defect body including a plurality of lattice point defects, and a microwave field transmitter operable to apply a microwave field to the electron spin defect body. The apparatus may also include an optical source configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect bodies from a ground state to an excited state, and a photodetector arranged to receive photoluminescence of a second wavelength emitted from a first electron spin defect body of a first magnetometer pixel of the array of magnetometer pixels. The second wavelength is different from the first wavelength.

A magnetometry apparatus includes an array of magnetometer pixels. Each magnetometer pixel includes an electron spin defect body including a plurality of lattice point defects, and a microwave field transmitter operable to apply a microwave field to the electron spin defect body. The apparatus may also include an optical source configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect bodies from a ground state to an excited state, and a photodetector arranged to receive photoluminescence of a second wavelength emitted from a first electron spin defect body of a first magnetometer pixel of the array of magnetometer pixels. The second wavelength is different from the first wavelength.

The disclosure relates to a receiving unit configured for acquiring MR signals from an examination object in a magnetic resonance device. The receiving unit may include a detector unit comprising a light source and a first optical detector, a sensor unit comprising a first optical magnetometer, a first optical waveguide connecting the sensor unit to the light source, and a second optical waveguide connecting the sensor unit to the first optical detector.

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

A fully distributed magnetic adsorption multi-parameter sensing cable, which is configured to be installed on the wall of a metal pipeline, includes an outer sheath, a sensing component arranged in the outer sheath, and a fully distributed magnetic adsorption reinforcement (FDMAR) arranged in the outer sheath and on a peripheral side of the sensing component. The outer sheath is attached to the wall of the metal pipeline by the FDMAR. A magnetic adsorption force between the FDMAR and the wall of the metal pipeline is able to be adjusted by changing the size of the FDMAR and the distance between the FDMAR reinforcement and the wall of the metal pipeline. The fully distributed magnetic adsorption multi-parameter sensing cable has the advantages of good adsorption effect and high sensitivity.

Disclosed is an optical fiber winding for measuring the current circulating through a conductor. According to one embodiment the optical fiber winding includes a central support core extending in a longitudinal direction, a first optical fiber cable arranged around the central support core, a second optical fiber cable arranged around the central support core, the first and second optical fiber cables extend in a helical manner around the central support core. According to one embodiment the first optical fiber cable is twisted about its longitudinal axis in a first twist direction, and the second optical fiber cable is twisted about its longitudinal axis in a second twist direction, the first twist direction being opposite the second twist direction. Optical fiber-based current measuring equipment is also disclosed.

An exemplary magnetic field measurement system includes a wearable sensor unit that includes a magnetometer and a twisted pair cable interface assembly electrically connected to the magnetometer.

An exemplary magnetic field measurement system includes a wearable sensor unit that includes a magnetometer and a twisted pair cable interface assembly electrically connected to the magnetometer.