An embedded magnetic identification assembly includes a base component formed of a material. Also included is a plurality of elements formed in an array at a surface of the base component, wherein the plurality of elements is formed of a magnetic material.

Embodiments described herein relate to devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet. An example device for determining a magnetic field distribution of a magnet along a main surface of said magnet includes an arrangement of at least two independent magnetic field camera modules being arranged in a fixed relative position with respect to each other, each magnetic field camera module being adapted for measuring a magnetic field distribution to which it is exposed by means of a respective detection surface. The device also includes a means for providing a predetermined relative movement between the main surface and the arrangement to thereby scan the magnetic field distribution of the magnet along the main surface.

Embodiments described herein relate to devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet. An example device for determining a magnetic field distribution of a magnet along a main surface of said magnet includes an arrangement of at least two independent magnetic field camera modules being arranged in a fixed relative position with respect to each other, each magnetic field camera module being adapted for measuring a magnetic field distribution to which it is exposed by means of a respective detection surface. The device also includes a means for providing a predetermined relative movement between the main surface and the arrangement to thereby scan the magnetic field distribution of the magnet along the main surface.

The disclosure relates to a method for calculating surface electric field distribution of nanostructures. The method includes the following steps of: providing a nanostructure sample located on an insulated layer of a substrate; spraying first charged nanoparticles to the insulated surface; blowing vapor to the insulated surface and imaging the first charged nanoparticles via an optical microscope, recording the width w between the first charged nanoparticles and the nanostructure sample, and obtaining the voltage U of the nanostructure sample by an equation.

A position determination device comprises data input circuitry configured to obtain magnetic field sensor data sensed by a magnetic field sensor, separation circuitry configured to separate the obtained magnetic sensor data into low frequency sensor data including frequencies below a frequency threshold and high frequency sensor data including frequencies above the frequency threshold, fingerprint combining circuitry configured to determine a combined magnetic fingerprint based on the low frequency sensor data and the high frequency sensor data, and position determination circuitry configured to determine the sensor position of the magnetic field sensor by comparing the combined magnetic fingerprint with a magnetic map.

A position determination device comprises data input circuitry configured to obtain magnetic field sensor data sensed by a magnetic field sensor, separation circuitry configured to separate the obtained magnetic sensor data into low frequency sensor data including frequencies below a frequency threshold and high frequency sensor data including frequencies above the frequency threshold, fingerprint combining circuitry configured to determine a combined magnetic fingerprint based on the low frequency sensor data and the high frequency sensor data, and position determination circuitry configured to determine the sensor position of the magnetic field sensor by comparing the combined magnetic fingerprint with a magnetic map.

Embodiments of the present disclosure are directed to radiotherapy systems. An exemplary radiotherapy system may comprise a radiotherapy output configured to deliver a charged particle beam to a patient. The system may also comprise a detector array. The detector array may have an axis that extends parallel to an axis along which the charged particle beam is delivered by the radiotherapy output. The detector array may comprise a plurality of detectors configured to detect a magnetic field generated by the charged particle beam during delivery of the charged particle beam from the radiotherapy output.

Embodiments of the present disclosure are directed to radiotherapy systems. An exemplary radiotherapy system may comprise a radiotherapy output configured to deliver a charged particle beam to a patient. The system may also comprise a detector array. The detector array may have an axis that extends parallel to an axis along which the charged particle beam is delivered by the radiotherapy output. The detector array may comprise a plurality of detectors configured to detect a magnetic field generated by the charged particle beam during delivery of the charged particle beam from the radiotherapy output.

The present invention relates to a new method for characterizing magnets, magnetic assemblies (combinations of magnets) and magnetic materials. In what follows, these will be called under the common term ‘magnetic systems’. The method is based on obtaining quantitative properties of the magnetic system by combining magnetic field measurement data and theoretical modeling or simulation data. The input parameters of the theoretical model are optimized using an optimization method in order to obtain a best fit to the measured data. In this method, the present invention involves precalculating magnetic field distributions prior to the optimization execution in order to considerably speed up the process. Combining this advanced data processing with fast magnetic field mapping using e.g. a magnetic field camera, allows real-time measurement and data analysis of magnetic systems for applications in e.g. quality control of such magnetic systems.

The present invention relates to a new method for characterizing magnets, magnetic assemblies (combinations of magnets) and magnetic materials. In what follows, these will be called under the common term ‘magnetic systems’. The method is based on obtaining quantitative properties of the magnetic system by combining magnetic field measurement data and theoretical modeling or simulation data. The input parameters of the theoretical model are optimized using an optimization method in order to obtain a best fit to the measured data. In this method, the present invention involves precalculating magnetic field distributions prior to the optimization execution in order to considerably speed up the process. Combining this advanced data processing with fast magnetic field mapping using e.g. a magnetic field camera, allows real-time measurement and data analysis of magnetic systems for applications in e.g. quality control of such magnetic systems.