Methods and apparatus for characterizing composite materials for manufacturing quality assurance (QA), periodic inspection during the useful life, or for forensic analysis/material testing. System are provided that relate eddy-current sensor responses to the fiber layup of a composite structure, the presence of impact damage on a composite structure with or without a metal liner, volumetric stress within the composite, fiber tow density, and other NDE inspection requirements. Also provided are systems that determine electromagnetic material properties and material dimensions of composite materials from capacitive sensor inspection measurements. These properties are related to the presence of buried defects in non-conductive composite materials, moisture ingress, aging of the material due to service or environmental/thermal exposure, or changes in manufacturing quality.

Methods and apparatus for characterizing composite materials for manufacturing quality assurance (QA), periodic inspection during the useful life, or for forensic analysis/material testing. System are provided that relate eddy-current sensor responses to the fiber layup of a composite structure, the presence of impact damage on a composite structure with or without a metal liner, volumetric stress within the composite, fiber tow density, and other NDE inspection requirements. Also provided are systems that determine electromagnetic material properties and material dimensions of composite materials from capacitive sensor inspection measurements. These properties are related to the presence of buried defects in non-conductive composite materials, moisture ingress, aging of the material due to service or environmental/thermal exposure, or changes in manufacturing quality.

A magnetic particle imaging device is provided. The device includes a magnetic field source configured to produce a magnetic field having a non-saturating magnetic field region, an excitation signal source configured to produce an excitation signal in the non-saturating magnetic field region that produces a detectable signal from magnetic particles in the non-saturating magnetic field region, and a signal processor configured to convert a detected signal into an image of the magnetic particles. Aspects of the present disclosure also include methods of imaging magnetic particles in a sample, and methods of producing an image of magnetic particles in a subject. The subject devices and methods find use in a variety of applications, such as medical imaging applications.

A magnetic particle imaging device is provided. The device includes a magnetic field source configured to produce a magnetic field having a non-saturating magnetic field region, an excitation signal source configured to produce an excitation signal in the non-saturating magnetic field region that produces a detectable signal from magnetic particles in the non-saturating magnetic field region, and a signal processor configured to convert a detected signal into an image of the magnetic particles. Aspects of the present disclosure also include methods of imaging magnetic particles in a sample, and methods of producing an image of magnetic particles in a subject. The subject devices and methods find use in a variety of applications, such as medical imaging applications.

A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the divided regions.

A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the divided regions.

A magnetometry apparatus includes an array of magnetometer pixels. Each magnetometer pixel includes an electron spin defect body including a plurality of lattice point defects, and a microwave field transmitter operable to apply a microwave field to the electron spin defect body. The apparatus may also include an optical source configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect bodies from a ground state to an excited state, and a photodetector arranged to receive photoluminescence of a second wavelength emitted from a first electron spin defect body of a first magnetometer pixel of the array of magnetometer pixels. The second wavelength is different from the first wavelength.

Multiple magnetic field sensors are arranged around a current-containing volume at multiple longitudinal and circumferential positions. Each sensor measures multiple magnetic field components and is characterized by one or more calibration parameters. A longitudinal primary current flows through two end-to-end electrical conductors that are separated by an arc gap, and flows as at least one longitudinal primary electric arc that spans the arc gap and that moves transversely within the arc gap. Estimated transverse position of the primary electric arc is calculated, based on the longitudinal position of the arc gap, and two or more of the measured magnetic field components along with one or more corresponding sensor positions or calibration parameters. In addition, estimated occurrence, position, and magnitude of a transverse secondary current (i.e., a side arc) can be calculated based on those quantities.

A magnetic sensor array device is comprised of an array of magnetic sensors arranged on a common semiconductor substrate to measure the multi-axis magnetic field of an arbitrary sized region at high speed with high spatial resolution and high magnetic resolution. This invention further improves a multi-axis magnetic sensor array device fabricated on a common semiconductor substrate with additional optimizations to provide for variable spatial resolution, variable magnetic resolution, and a novel secret key derivation.

A Magnetic Particle Imaging (MPI) system with a magnet configured to generate a magnetic field with a field free line, the magnet integrated with a flux return designed so that a flux path at approximately the center of the field-free line has a first reluctance and a second flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance to facilitate a high fidelity magnetic field and high fidelity field free line.