An ODMR member is arranged in a measurement target AC magnetic field. A coil applies a magnetic field of a microwave to the ODMR member. A high frequency power supply causes the coil to conduct a current of the microwave. An irradiating device irradiates the ODMR member with light. A light receiving device detects light that the ODMR member emits. A measurement control unit performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply and the irradiating device and thereby determines a detection light intensity of the light detected by the light receiving device. A magnetic field calculation unit calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.

Disclosed herein is a sensor chip for parallelized magnetic sensing of a plurality of samples, a system for parallelized magnetic sensing of a plurality of samples and a method for probing a plurality of samples using optically addressable solid-state spin systems. The sensor chip comprises an optically transparent substrate comprising a plurality of optically addressable solid-state spin systems arranged in a plurality of sensing regions in a surface layer below a top surface of the substrate. The sensor chip further comprises a plurality of sample sites, wherein each sample site is arranged above a respective sensing region. The sensor chip has a light guiding system configured to provide an optical path through the substrate connecting each of the sensing regions.

Systems and methods for spinwave-based metrology in accordance with embodiments of the disclosure involve generating and detecting spinwaves in a sample having a ferromagnetic material; and determining a material thickness, a material integrity measure, a presence of a manufacturing defect, a categorical type of manufacturing defect, and/or a manufacturing process statistic corresponding to spinwave behavior in the sample. In an embodiment, spinwaves are generated by way of concurrent exposure of a target measurement site of the sample to each of a bias magnetic field and radiation (e.g., microwave or radio frequency radiation) produced by a first set of integrated waveguides. A response signal corresponding to a behavior of spinwaves within the target measurement site can be generated by way of a second set of integrated waveguides. Various embodiments of systems and methods for generating spinwaves, detecting spinwaves, and calculating, analyzing, or monitoring one or more sample properties can be automated.

Systems and methods for spinwave-based metrology in accordance with embodiments of the disclosure involve generating and detecting spinwaves in a sample having a ferromagnetic material; and determining a material thickness, a material integrity measure, a presence of a manufacturing defect, a categorical type of manufacturing defect, and/or a manufacturing process statistic corresponding to spinwave behavior in the sample. In an embodiment, spinwaves are generated by way of concurrent exposure of a target measurement site of the sample to each of a bias magnetic field and radiation (e.g., microwave or radio frequency radiation) produced by a first set of integrated waveguides. A response signal corresponding to a behavior of spinwaves within the target measurement site can be generated by way of a second set of integrated waveguides. Various embodiments of systems and methods for generating spinwaves, detecting spinwaves, and calculating, analyzing, or monitoring one or more sample properties can be automated.

The invention relates to a measuring apparatus for detecting weak electromagnetic signals from a sample at low frequencies, specifically in the frequency range of 1 kHz-10 MHz, in particular, and to a measuring method. The problem addressed by the invention is that of providing an apparatus which can be used to detect weak electromagnetic signals from a sample, in particular in the frequency range of 1 kHz-40 MHz, with a good signal-to-noise ratio. For the solution, the measuring apparatus comprises an electromagnetic resonant circuit having a pick-up coil of low quality, a preferably tunable capacitance and a filter coil; the filter coil and the capacitance have a high quality of at least 100, advantageously at least 200, particularly preferably at least 500. Alternatively or additionally, the quality of the resonant circuit is at least 100, advantageously at least 200, particularly preferably at least 500. The quality of the filter coil and the quality of the capacitance exceed the quality of the pick-up coil, specifically at least by twice the amount. The measurement signal is then available at the two ends of the filter coil with a good signal-to-noise ratio.

The invention relates to a measuring apparatus for detecting weak electromagnetic signals from a sample at low frequencies, specifically in the frequency range of 1 kHz-10 MHz, in particular, and to a measuring method. The problem addressed by the invention is that of providing an apparatus which can be used to detect weak electromagnetic signals from a sample, in particular in the frequency range of 1 kHz-40 MHz, with a good signal-to-noise ratio. For the solution, the measuring apparatus comprises an electromagnetic resonant circuit having a pick-up coil of low quality, a preferably tunable capacitance and a filter coil; the filter coil and the capacitance have a high quality of at least 100, advantageously at least 200, particularly preferably at least 500. Alternatively or additionally, the quality of the resonant circuit is at least 100, advantageously at least 200, particularly preferably at least 500. The quality of the filter coil and the quality of the capacitance exceed the quality of the pick-up coil, specifically at least by twice the amount. The measurement signal is then available at the two ends of the filter coil with a good signal-to-noise ratio.

By producing the proper wave interference using superimposed angularly separate waves that overlap with the proper time-phase relationship (called “Time-Correlated Standing-wave Interference”), wave energy is amplified (by “Coherent Intensity Amplification”) and teleported to precise locations. For instance, in one application, energy is teleported to one or more areas within a living body for such therapeutic applications as destroying cancer cells or plaques within arteries. A system implementing this technique creates amplified constructive interference at one or more selected disease locations, while producing destructive interference at surrounding locations. In this application example, the technique allows energy to be “teleported” to tumor cells, plaques, or other diseased cells, for instance, to destroy them, while surrounding healthy cells receive virtually no energy, obviating collateral damage from the treatment. The same method can be used to diagnose disease by detecting energy teleported to different locations.

In some aspects, a resonator device for spin resonance applications is described. In some examples, the resonator device includes a substrate, terminals, and resonators. The terminals include a first terminal having first terminal segments disposed on a substrate surface, and a second terminal having second terminal segments disposed on the substrate surface opposite the first terminal segments. The resonators include conductors disposed on the substrate surface between the first and second terminals. Each conductor is disposed between one of the first terminal segments and a respective, opposite one of the second terminal segments.

In some aspects, a resonator device for spin resonance applications is described. In some examples, the resonator device includes a substrate, terminals, and resonators. The terminals include a first terminal having first terminal segments disposed on a substrate surface, and a second terminal having second terminal segments disposed on the substrate surface opposite the first terminal segments. The resonators include conductors disposed on the substrate surface between the first and second terminals. Each conductor is disposed between one of the first terminal segments and a respective, opposite one of the second terminal segments.

A precision magnetometer for detecting magnetic fields parallel to a static field B.sub.0 in which the magnetometer itself is immersed; this magnetometer is operative in the frequency range of the field b.sub.1 ranging from 10 MHz to 1 GHz. Another object is a technique for using the presented magnetometer.