A method for calibrating a device under test, DUT, comprising the steps of displaying a reference calibration image, oRCI, having at least one marker, M; capturing the displayed reference calibration image, oRCI, to generate a captured reference calibration image, cRCI; and calculating a calibration transformation matrix, CTM, for said device under test, DUT, on the basis of the markers, M, of the original reference calibration image, oRCI, and on the basis of the markers, M, of the captured reference calibration image, cRCI.

A compound may include a set of integrated circuits. An integrated circuit, of the set of integrated circuits, may include calibration standards integrated at a silicon layer of the integrated circuit. The integrated circuit may be included in a package, and a calibration standard, of the calibration standards, may be available to at least one port of a set of ports of the integrated circuit.

A measurement system includes: n measurement paths that output measurement data of one or more measurement objects, where n is an integer of four or greater; m reference signal generation circuits that output reference signals to be referenced by the n measurement paths, each of the m reference signal generation circuits outputting the reference signal to two or more measurement paths among the n measurement paths, where m is an integer of two or greater; k path anomaly detection circuits that detect/confirm presence or absence of anomalies by comparing the measurement data output from two measurement paths among the n measurement paths, where k is an integer of two or greater; and a processing circuit that receives the measurement data output from the n measurement paths and outputs from the k path anomaly detection circuits as its inputs.

The present disclosure relates to a test and/or measurement system. The test and/or measurement system comprises a base unit which comprises: an LO signal source configured to generate an LO signal, a first LO port and a second LO port, wherein the LO signal source is connected to the first LO port and the second LO port, and an LO measurement device. The test and/or measurement system further comprises: a first external frontend which is connected to the first LO port of the base unit via a first cable, and which is configured to receive a first fraction of the LO signal from the first LO port, wherein the first external frontend comprises one or more calibration standards; and a second external frontend which is connected to the second LO port of the base unit via a second cable, and which is configured to receive a second fraction of the LO signal from the second LO port, wherein the second external frontend comprises one or more calibration standards. The test and/or measurement system is operable in a calibration mode in which: the first external frontend is configured to connect the first LO port with one of its one or more calibration standards, the second external frontend is configured to connect the second LO port with one of its one or more calibration standards, and the LO measurement device is configured to measure: the LO signal which is generated by the LO signal source, a reflection of the first fraction of the LO signal received at the first LO port, and a reflection of the second fraction of the LO signal received at the second LO port.

A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.

A magnetic field sensing device can include two or more magnetic field sensors configured to detect a magnetic field in a current carrying conductor. The magnetic field sensing device also can include a phase detector electrically coupled to outputs of the two or more magnetic field sensors. The magnetic field sensing device further can include a phase indicator electrically coupled to the phase detector. The phase indictor can include a display that indicates when the two or more magnetic field sensors are in a position in relation to the current carrying conductor. Other embodiments are provided.

A system and method sequentially measure phases of selected comb teeth of a comb signal using a local oscillator (LO) signal whose frequency and phase are changed for each sequential measurement, and adjust the measured phases to account for the change of phase in the LO signal from measurement of one selected comb tooth to the next to ascertain reference phase differences between the selected comb teeth. The measured phases of the selected comb teeth are adjusted by applying a phase offset determined from a first phase and a second phase of a pilot tone which are measured using the LO signal, respectively, before and after the frequency and phase of the LO signal change from measurement of one comb tooth to the next. The frequency of the pilot tone is maintained to be substantially the same when measuring the first phase and the second phase of the pilot tone.

In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. A voltage divider network is coupled to the second stage. The circuit includes an output transistor having first and second terminals, in which the first terminal of the output transistor is coupled to the first stage, and the second terminal of the output transistor is coupled to the voltage divider network.

The present disclosure relates to a calibration system for a vector network analyzer (VNA), having a plurality of N ports. The calibration system comprises a distribution unit having a plurality of DN ports; and a plurality of DN calibration units, respectively comprising a calibration circuit having first, second and third ports and an isolation circuit having first, second and third ports. For the respective calibration unit, the calibration circuit is configured to provide at least three different one-port calibration standards, such as open, short and match; the first port of the calibration circuit is arranged for being connected to a respective port of the VNA, the second port of the calibration circuit is connected to the first port of the isolation circuit, the third port of the calibration circuit is connected to a first matched load; the second port of the isolation circuit is connected to a respective port of the distribution unit, and the third port of the isolation circuit is connected to a second matched load. The distribution unit is configured to connect any one of its ports with all other of its ports.

A power vector analyzer to analyze power from a device under test (DUT) includes one or more channels to measure a reference voltage signal from a power line connected to the DUT, one or more channels to measure a reference current signal from the power line, a user interface comprising a display and one or more controls, and a quadrature synchronous detector (QSD) for each phase of apparent power being measured, the QSD configured to use a reference voltage signal from the one or more channels and a reference current signal from the one or more channels to determine the apparent power for each phase of power being measured by the DUT and display the apparent power for each phase on the display.