Patent classifications
G01R35/007
Point stick device and point stick module
A point stick module has a sensing device, a rank unit and a signal processing device. The sensing device outputs multiple sensing signals in response to operations done by a user. The rank unit provides a rank signal to represent a rank of the sensing device. The signal processing device is coupled to the sensing device and the rank unit to receive the multiple sensing signals and the rank signal, wherein the signal processing device selects a parameter according to the rank signal.
METHOD OF SETTING A MEASUREMENT INSTRUMENT AND SYSTEM FOR SETTING A MEASUREMENT INSTRUMENT
A method of setting a measurement instrument comprises the steps of: Providing a reference measurement instrument that uses at least one instrument parameter; Performing a training phase for a particular signal type to be processed by said reference measurement instrument in order to retrieve an optimal setting for said at least one instrument parameter; and Creating a lookup table for said particular signal type, said lookup table comprising at least said optimal setting for said at least one instrument parameter.
Further, a system for setting a measurement instrument is described.
Accurate and model-based measurement and management systems and methods
Systems and methods for measurement and management are disclosed that provide complex measurements cost-effectively at very high accuracy. These methods and systems in some cases achieve measurement accuracy exceeding the accuracy of the reference standards they rely on, and eliminate expensive and disadvantageous recalibration procedures. The accurate measurements are integrated with management functions, applying the measurement data to meet objectives of the integrated system and workflow goals of its user. The disclosed systems and methods comprise an explicit or expressly represented model both of themselves and of candidate external systems to be measured and managed. The models may be configured and reconfigured by the owner-user through either local or remote means. The system intelligently reconfigures itself to adapt dynamically to the conditions of measurement and the user's and system's goals at each moment. In an embodiment, the system includes high-accuracy and reconfigurable components including a meter or control head adapted for user precision assembly and maintenance that computes and displays or communicates the measurements, displaying measurements in desired units, grouping functions according to ergonomic and cognitive principles based on the activity and workflow of a user in relation to the internal model. The use of models permits the system to compute and provide complex and inferred measurements of ultimate interest to the user, including quantities that cannot be directed measured and only can be determined through reasoning or computation by applying models to raw measurement data. The precision-assembly modular electromechanical design further permits an owner-user to precisely assemble, maintain, modify the apparatus and calibrate the equipment for accuracy.
Method and apparatus for monitoring secondary power device, and electronic system including the apparatus
A method and apparatus for monitoring a secondary power device, for accurately checking a state of the secondary power device, and an electronic system including the apparatus are provided. The method of monitoring a secondary power device includes: setting a first reference parameter by using a voltage of at least one capacitor of the secondary power device; setting a second reference parameter by using the voltage of the at least one capacitor and the first reference parameter; and setting a reference level for checking of the state of the secondary power device by using the second reference parameter, wherein the reference level is used in checking of the state of the secondary power device.
CURRENT MEASUREMENT IN POWER-GATED MICROPROCESSORS
Aspects of the invention include a circuit having a power header configured to couple to a power supply and to provide an output voltage. A sense circuit is coupled to the power header to receive the output voltage, the sense circuit including a replica voltage circuit coupled to a replica power header circuit and a transistor, the replica voltage circuit being configured to provide a replicated output voltage in accordance with the output voltage, the replica power header circuit being configured to couple to the power supply and the replicated output voltage to generate a replica current, the transistor being configured to deliver the replica current.
System for continuous calibration of hall sensors
A system comprises a calibration current generator, which provides a calibration current to a first and a second Hall channel, and a bias current generator, which determines a difference between a calibration signal from the Hall channels and a threshold and adjusts a biasing current for the Hall channels based on the difference. In some embodiments, the bias current generator comprises a subtractor coupled to an ADC and a controller coupled between the ADC and a DAC. The subtractor obtains a first and a second signal from the first and second Hall channels, respectively, and subtracts the first from the second to obtain the calibration signal. The controller determines the difference between a sampled signal from the ADC and the threshold and an adjustment to the biasing current based on the difference. The DAC adjusts the biasing current based on a control signal from the controller indicating the adjustment.
SENSOR MEASUREMENT VERIFICATION IN QUASI REAL-TIME
A method and system to perform the verification of measures done by a sensor in quasi real-time. The sensor verification may be implemented at two different levelsa functionality level and a measurement level. At the functionality level, a consistency check of information from different variables may be processed at sensor level depending on the functionality of the physical system being measured. At the measurement level, diagnostics may be performed of the circuits present in the measurement path by specific circuitry and at suitable instants of time to guarantee a Fault Tolerant Time Interval while minimizing sample loss. This may be achieved, at least in part, by increasing the measuring sample rate.
SYSTEM FOR CONTINUOUS CALIBRATION OF HALL SENSORS
A system comprises a calibration current generator, which provides a calibration current to a first and a second Hall channel, and a bias current generator, which determines a difference between a calibration signal from the Hall channels and a threshold and adjusts a biasing current for the Hall channels based on the difference. In some embodiments, the bias current generator comprises a subtractor coupled to an ADC and a controller coupled between the ADC and a DAC. The subtractor obtains a first and a second signal from the first and second Hall channels, respectively, and subtracts the first from the second to obtain the calibration signal. The controller determines the difference between a sampled signal from the ADC and the threshold and an adjustment to the biasing current based on the difference. The DAC adjusts the biasing current based on a control signal from the controller indicating the adjustment.
Method for calibrating channel delay skew of automatic test equipment
The present invention relates to a method for calibrating a channel delay skew of automatic test equipment (ATE), the method comprising: providing multiple calibration reference devices, wherein the calibration reference devices have a second plurality of delay paths each having a predetermined path delay value and coupling a pair of pins of one of the calibration reference devices together, wherein each pin is coupled to at most one delay path; coupling each of the calibration reference devices with the ATE, respectively, wherein the test probe of each of the first plurality of test channels is coupled with a pin of one of the calibration reference devices; testing the calibration reference devices to obtain multiple delay measurements from one or more transmitting channels of the first plurality of test channels to one or more receiving channels of the first plurality of test channels using the ATE; and calculating based on the delay measurements.
JOSEPHSON VOLTAGE STANDARD
A Josephson voltage standard includes: electrical conductors that receive bias currents and radiofrequency biases; a first Josephson junction array that: includes a first Josephson junction and produces a first voltage reference from the first bias current and the third bias current; a second Josephson junction array in electrical communication with the first Josephson junction array and that: includes a second Josephson junction; receives the second bias current; receives the third bias current; receives the second radiofrequency bias; and produces a second voltage reference from the second bias current and the third bias current; a first voltage reference output tap in electrical communication with the first Josephson junction array and that receives the first voltage reference from the first Josephson junction array such that the first voltage reference is electrically available at the first voltage reference output tap; and a second voltage reference output tap.