A radiation imaging apparatus comprising an imaging region where conversion elements used for an imaging operation of obtaining a radiation image corresponding to incident radiation are arranged, detecting portions in each of which a detecting element used to detect a radiation dose entering the imaging region is arranged, and a controller is provided. The controller is configured to perform, before the imaging operation, an offset readout operation of reading out offset signals of the detecting elements from the detecting portions, detect, in the imaging operation, the radiation dose entering the imaging region by using signals output from the detecting elements during irradiation with radiation and the offset signals, and be capable of changing, during a period of the offset readout operation, an order of reading out the offset signals from the detecting portions.

Provided herein is a dosimetry device for quantifying the dosage of radiation emitted from a radiation source, the device comprising: (i) a radiation dose indicator; (ii) an optical means to capture the color change; and (iii) a software means to compare the optical density of the dose indicator as compared to a predetermined calibration curve. Also provided herein is a method of quantifying the dosage of radiation emitted from the radiation source. Further provided herein is use of said dosimetry device in various medical, food and industrial applications.

Provided herein is a dosimetry device for quantifying the dosage of radiation emitted from a radiation source, the device comprising: (i) a radiation dose indicator; (ii) an optical means to capture the color change; and (iii) a software means to compare the optical density of the dose indicator as compared to a predetermined calibration curve. Also provided herein is a method of quantifying the dosage of radiation emitted from the radiation source. Further provided herein is use of said dosimetry device in various medical, food and industrial applications.

This present disclosure provides a multi-ply radiation dosage indicator, which includes a first ply having two visible readable indicia thereon. The dual radiation sensitive zones are capable of changing opacity in response to exposure radiation. Each radiation sensitive zone can respond to an irradiation dose in tandem or independent of one another. Once the radiation sensitive zone exceeds the design exposure threshold, the visibility of the indicia is altered thereby providing an indication of irradiation exposure. The radiation sensitive zone may either be transparent or opaque and can change its opacity in response to exposure to radiation exceeding a predetermined threshold so as to change the visibility of the indicia.

This present disclosure provides a multi-ply radiation dosage indicator, which includes a first ply having two visible readable indicia thereon. The dual radiation sensitive zones are capable of changing opacity in response to exposure radiation. Each radiation sensitive zone can respond to an irradiation dose in tandem or independent of one another. Once the radiation sensitive zone exceeds the design exposure threshold, the visibility of the indicia is altered thereby providing an indication of irradiation exposure. The radiation sensitive zone may either be transparent or opaque and can change its opacity in response to exposure to radiation exceeding a predetermined threshold so as to change the visibility of the indicia.

The invention relates to a system (1) for detecting image parameters during the exposure of films (2), in particular X-ray films. It is an object of the invention to provide a system which allows a simple and fast production of optimally exposed recordings. For this purpose, the system (1) comprises a detector element (3) which can be detachably attached to a film (2) and which detects in a spatially resolved manner the radiation (4) impinging on the film (2) during exposure or the radiation (4) transmitted through the film and thereby generates a signal from which image parameters generated by the current film exposure can be derived.

The invention relates to a system (1) for detecting image parameters during the exposure of films (2), in particular X-ray films. It is an object of the invention to provide a system which allows a simple and fast production of optimally exposed recordings. For this purpose, the system (1) comprises a detector element (3) which can be detachably attached to a film (2) and which detects in a spatially resolved manner the radiation (4) impinging on the film (2) during exposure or the radiation (4) transmitted through the film and thereby generates a signal from which image parameters generated by the current film exposure can be derived.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.

A semiconductor module includes a substrate; a plurality of semiconductor packages provided on the substrate; and an environment information indicator configured to display information related to an environment surrounding the plurality of semiconductor packages.