A microscope for examining a sample received in a sample carrier having a lid includes: a sample chamber for receiving the sample carrier; a microscope stage arranged below the sample chamber, the microscope stage being arranged to have the sample carrier arranged thereon; and a sample carrier handling device that is at least partially arranged within the sample chamber and that removes the lid from the sample carrier to provide access to the sample.

A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Some implementations of the disclosure relate to an imaging system, including: a sample holder to support a sample container having multiple sample locations; an optical stage having; an assembly comprising one or more actuators physically coupled to the sample holder to tilt the sample holder relative to the optical stage during imaging of the multiple sample locations to focus the optical stage onto a current sample location; a first light source to project a first pair of spots on the sample container; and a controller to control, based on a sample tilt determined from a first separation measurement of the first pair of spots from one or more images taken by an image sensor at one or more of the sample locations, the one or more actuators to tilt the sample holder along a first direction of the imaging or a second direction substantially perpendicular to the first direction.

Some implementations of the disclosure relate to an imaging system, including: a sample holder to support a sample container having multiple sample locations; an optical stage having; an assembly comprising one or more actuators physically coupled to the sample holder to tilt the sample holder relative to the optical stage during imaging of the multiple sample locations to focus the optical stage onto a current sample location; a first light source to project a first pair of spots on the sample container; and a controller to control, based on a sample tilt determined from a first separation measurement of the first pair of spots from one or more images taken by an image sensor at one or more of the sample locations, the one or more actuators to tilt the sample holder along a first direction of the imaging or a second direction substantially perpendicular to the first direction.

A scanning stage with opposing edges to secure a slide during scanning and guide the slide during unloading. In an embodiment, the system includes a reference edge with a surface facing a first edge of the slide and an opposing edge with a surface facing a second edge of the slide. The opposing edge is controlled by a processor to engage the second edge of the slide and press the first edge of the slide against the reference edge surface. The opposing edge surface is parallel to a side of a slide rack slot into which the slide will be inserted during unloading. The system also includes an assembly having a pull bar configured to pull the glass slide from the scanning stage into the slide rack slot while the first edge of the slide is simultaneously being pressed against the reference edge surface by the opposing edge surface.

A scanning stage with opposing edges to secure a slide during scanning and guide the slide during unloading. In an embodiment, the system includes a reference edge with a surface facing a first edge of the slide and an opposing edge with a surface facing a second edge of the slide. The opposing edge is controlled by a processor to engage the second edge of the slide and press the first edge of the slide against the reference edge surface. The opposing edge surface is parallel to a side of a slide rack slot into which the slide will be inserted during unloading. The system also includes an assembly having a pull bar configured to pull the glass slide from the scanning stage into the slide rack slot while the first edge of the slide is simultaneously being pressed against the reference edge surface by the opposing edge surface.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

An adjusting device is provided for positioning an object. The adjusting device includes a base and a supply line. The base is configured to move an object that is connectable to the base in the connected state along a path of motion in a position-controlled manner. The supply line supplies the energy and/or signal transmission to and/or from the base. The supply line is coupled to the base in a reversibly detachable manner.