Methods and systems for automated slide handling for imaging applications are described herein. In certain aspects, an automated slide handler may be operatively coupled to a slide hotel and/or one or more imaging systems described herein. The automated slide handler may be a robotic arm with up to 6 degrees of freedom. Automated slide handling may include sample preparation, such as sectioning and staining. Suitable imaging systems include a fluorescence microscope or an imaging mass cytometer. Methods and systems disclosed herein enable high throughput profiling of tissue sections.

Apparatuses and methods are described for detecting inclusions in glass. The apparatuses and methods employ a laser that is configured to project a laser sheet at a first angle from one side of a glass sheet, and a camera configured to capture images from a second angle from another side of the glass sheet. The glass sheet is moved thorough the laser sheet while the camera captures images. One or more processing devices execute image processing algorithms to identify areas of the glass sheet containing inclusions based on the captured images. In some examples, the identified areas of the glass sheet are revisited to confirm they contain inclusions.

Apparatuses and methods are described for detecting inclusions in glass. The apparatuses and methods employ a laser that is configured to project a laser sheet at a first angle from one side of a glass sheet, and a camera configured to capture images from a second angle from another side of the glass sheet. The glass sheet is moved thorough the laser sheet while the camera captures images. One or more processing devices execute image processing algorithms to identify areas of the glass sheet containing inclusions based on the captured images. In some examples, the identified areas of the glass sheet are revisited to confirm they contain inclusions.

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber, the microscope stage having a top surface for receiving a sample carrier in an examining position, in which a sample arranged on the sample carrier is microscopically examinable; a sample carrier storing unit arranged within the sample chamber for receiving the sample carrier in at least one storing position; and a sample carrier handling device for moving the sample carrier between the storing position and the examination position.

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber, the microscope stage having a top surface for receiving a sample carrier in an examining position, in which a sample arranged on the sample carrier is microscopically examinable; a sample carrier storing unit arranged within the sample chamber for receiving the sample carrier in at least one storing position; and a sample carrier handling device for moving the sample carrier between the storing position and the examination position.

A method for scanning object carriers using at least two microscope slide scanners includes a) loading a feed unit for microscope slides with a plurality of microscope slides, each of which is part of one of a plurality of sample series, b) transferring one microscope slide from the feed unit to every microscope slide scanner not loaded with a microscope slide, c) carrying out a scanning process for each loaded microscope slide scanner, d) transferring each scanned microscope slide from the microscope slide scanner to an intermediate storage rack, e) providing a data set for every scanning process for analysis, and f) transferring all microscope slides of a sample series from the intermediate storage rack to a final storage rack.

A method for scanning object carriers using at least two microscope slide scanners includes a) loading a feed unit for microscope slides with a plurality of microscope slides, each of which is part of one of a plurality of sample series, b) transferring one microscope slide from the feed unit to every microscope slide scanner not loaded with a microscope slide, c) carrying out a scanning process for each loaded microscope slide scanner, d) transferring each scanned microscope slide from the microscope slide scanner to an intermediate storage rack, e) providing a data set for every scanning process for analysis, and f) transferring all microscope slides of a sample series from the intermediate storage rack to a final storage rack.

A specimen machining device includes an illumination system that illuminates a specimen; a camera that photographs the specimen; and a processing unit that controls the illumination system and the camera, and acquires a machining control image which is used for controlling an ion source and a display image which is displayed on a display unit. The processing unit controls the illumination system to illuminate the specimen under a machining illumination condition; acquires the machining control image by controlling the camera to photograph the specimen illuminated under the machining control illumination condition; controls the ion source based on the machining control image; controls the illumination system to illuminate the specimen under a display illumination condition which is different from the machining control illumination condition; acquires the display image by controlling the camera to photograph the specimen illuminated under the display illumination condition; and displays the display image on the display unit.

A specimen machining device includes an illumination system that illuminates a specimen; a camera that photographs the specimen; and a processing unit that controls the illumination system and the camera, and acquires a machining control image which is used for controlling an ion source and a display image which is displayed on a display unit. The processing unit controls the illumination system to illuminate the specimen under a machining illumination condition; acquires the machining control image by controlling the camera to photograph the specimen illuminated under the machining control illumination condition; controls the ion source based on the machining control image; controls the illumination system to illuminate the specimen under a display illumination condition which is different from the machining control illumination condition; acquires the display image by controlling the camera to photograph the specimen illuminated under the display illumination condition; and displays the display image on the display unit.

In a sample observation device, an image acquisition unit 6 acquires a plurality of pieces of image data of a sample in a Y-axis direction, and an image generation unit generates luminance image data on luminance of the sample on the basis of the plurality of pieces of image data, binarizes luminance values of each of the plurality of pieces of image data to generate a plurality of pieces of binarized image data, and generates area image data on an existing area of the sample on the basis of the plurality of pieces of binarized image data.