G02F1/355

Cavity-enhanced frequency mixer for classical and quantum applications

A cavity-enhanced frequency mixer includes an input optical fiber, a waveguide, and an output optical fiber. The waveguide has an input end and an output end, the input end is connected to the input optical fiber, and a surface of the input end of the waveguide is coated with a highly reflective coating. The output optical fiber is formed with a fiber Bragg grating structure. The highly reflective coating and the fiber Bragg grating structure form a pair of reflective surfaces for resonant optical parametric oscillation under a low threshold situation, so that one of the beams generated by the input beam is reflected inside the partially reflective surfaces. Operated above a pump power threshold, the cavity-enhanced frequency mixer is tantamount to a compact, low-power budget optical parametric oscillator, while below the pump power threshold, it is a bright, compact, single-mode and narrow linewidth single-photon source.

Devices and methods for giant single-photon nonlinearities

A periodically poled microring resonator structure, a method for fabrication of the periodically poled microring resonator structure, and a method to achieve giant single-photon nonlinearity are disclosed. The strong single-photon nonlinearity in the microring resonator structure is achieved through its optimized design and fabrication procedures.

META-MATERIAL, DEVICES AND METHODS OF USE THEREOF

This invention relates to a device for rapid focus control of one or more lasers. The controlled beam, is refracted by the dynamic refraction device whose refractive index is set by its response to the control beam. The invention can be used for rapid focus and re-focus of a laser on a target as might be useful in such industries as flat panel television manufacturing, fuel injector nozzle manufacture, laser material processing/machining, laser scanning and indirect drive inertial confinement fusion.

OPTIMIZED THICK HETEROEPITAXIAL GROWTH OF SEMICONDUCTORS WITH IN-SITU SUBSTRATE PRETREATMENT
20230139650 · 2023-05-04 ·

A method of performing HVPE heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and ternary-forming gasses (V/VI group precursor), to form a heteroepitaxial growth of a binary, ternary, and/or quaternary compound on the substrate; wherein the carrier gas is H.sub.2, wherein the first precursor gas is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the ternary-forming gasses comprise at least two or more of AsH.sub.3 (arsine), PH.sub.3 (phosphine), H.sub.2Se (hydrogen selenide), H.sub.2Te (hydrogen telluride), SbH.sub.3 (hydrogen antimonide, or antimony tri-hydride, or stibine), H.sub.2S (hydrogen sulfide), NH.sub.3 (ammonia), and HF (hydrogen fluoride); flowing the carrier gas over the Group II/III element; exposing the substrate to the ternary-forming gasses in a predetermined ratio of first ternary-forming gas to second ternary-forming gas (1tf:2tf ratio); and changing the 1tf:2tf ratio over time.

Optimized Heteroepitaxial Growth of Semiconductors
20230090724 · 2023-03-23 ·

A method of performing HVPE heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and ternary-forming gasses (V/VI group precursor), to form a heteroepitaxial growth of a binary, ternary, and/or quaternary compound on the substrate; wherein the carrier gas is Hz, wherein the first precursor gas is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the ternary-forming gasses comprise at least two or more of AsH.sub.3 (arsine), PH.sub.3 (phosphine), H.sub.2Se (hydrogen selenide), H.sub.2Te (hydrogen telluride), SbH.sub.3 (hydrogen antimonide, or antimony tri-hydride, or stibine), H.sub.2S (hydrogen sulfide), NH.sub.3 (ammonia), and HF (hydrogen fluoride); flowing the carrier gas over the Group II/III element; exposing the substrate to the ternary-forming gasses in a predetermined ratio of first ternary-forming gas to second ternary-forming gas (1tf:2tf ratio); and changing the 1tf:2tf ratio over time.

Single sideband laser system for atomic devices

Disclosed embodiments include laser systems. An illustrative laser system includes a tunable laser. A beam splitter is operatively couplable to an output of the laser and is configured to split light output from the laser into a first path and a second path. A first modulator is disposed in the first path and is configured to generate first set of sidebands. A bandpass filter circuit includes a fiber Bragg grating filter and is operatively couplable to receive output from the first modulator and to pass a selected sideband of the first set of sidebands. A lock circuit is disposed in the second path, is configured to determine and stabilize wavelength of the laser, and is further configured to cooperate with the fiber Bragg grating filter to maintain a static lock point for the laser while allowing output of the first path to be tunable with respect to the lock point.

Optimized Heteroepitaxial Growth of Semiconductors
20230045019 · 2023-02-09 ·

A method of performing heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and a second precursor gas, to form a heteroepitaxial growth of one of GaAs, AlAs, InAs, GaP, InP, ZnSe, GaSe, CdSe, InSe, ZnTe, CdTe, GaTe, HgTe, GaSb, InSb, AlSb, CdS, GaN, and AlN on the substrate; wherein the substrate comprises one of GaAs, AlAs, InAs, GaP, InP, ZnSe, GaSe, CdSe, InSe, ZnTe, CdTe, GaTe, HgTe, GaSb, InSb, AlSb, CdS, GaN, and AlN; wherein the carrier gas is H.sub.2, wherein the first precursor is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the second precursor is one of AsH.sub.3 (arsine), PH.sub.3 (phosphine), H.sub.2Se (hydrogen selenide), H.sub.2Te (hydrogen telluride), SbH.sub.3 (hydrogen antimonide), H.sub.2S (hydrogen sulfide), and NH.sub.3 (ammonia). The process may be an HVPE (hydride vapor phase epitaxy) process.

Transport system for a laser beam

A wavelength conversion system comprising a transport system for a laser beam comprising: a circular polarization laser beam; an articulated arm comprising a mirror at each of its joints, arranged at 45° with respect to said laser beam; each of said mirrors having a phase shift between the reflected components of less than 10°; means for converting said laser beam from circular polarization to linear polarization and providing a linear polarization output laser beam; a non-linear converter for converting the wavelength of said output laser beam to linear polarization.

Optimized thick heteroepitaxial growth of semiconductors with in-situ substrate pretreatment

A method of performing HVPE heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and ternary-forming gasses (V/VI group precursor), to form a heteroepitaxial growth of a binary, ternary, and/or quaternary compound on the substrate; wherein the carrier gas is H.sub.2, wherein the first precursor gas is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the ternary-forming gasses comprise at least two or more of AsH.sub.3 (arsine), PH.sub.3 (phosphine), H.sub.2Se (hydrogen selenide), H.sub.2Te (hydrogen telluride), SbH.sub.3 (hydrogen antimonide, or antimony tri-hydride, or stibine), H.sub.2S (hydrogen sulfide), NH.sub.3 (ammonia), and HF (hydrogen fluoride); flowing the carrier gas over the Group II/III element; exposing the substrate to the ternary-forming gasses in a predetermined ratio of first ternary-forming gas to second ternary-forming gas (1tf:2tf ratio); and changing the 1tf:2tf ratio over time.

Optimized heteroepitaxial growth of semiconductors

A method of performing HVPE heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and ternary-forming gasses (V/VI group precursor), to form a heteroepitaxial growth of a binary, ternary, and/or quaternary compound on the substrate; wherein the carrier gas is Hz, wherein the first precursor gas is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the ternary-forming gasses comprise at least two or more of AsH.sub.3 (arsine), PH.sub.3 (phosphine), H.sub.2Se (hydrogen selenide), HzTe (hydrogen telluride), SbH.sub.3 (hydrogen antimonide, or antimony tri-hydride, or stibine), H.sub.2S (hydrogen sulfide), NH.sub.3 (ammonia), and HF (hydrogen fluoride); flowing the carrier gas over the Group II/III element; exposing the substrate to the ternary-forming gasses in a predetermined ratio of first ternary-forming gas to second ternary-forming gas (1tf:2tf ratio); and changing the 1tf:2tf ratio over time.