G03F7/70058

Exposure apparatus and exposure method, and device manufacturing method
10852639 · 2020-12-01 · ·

In corner sections of first to fourth quadrants whose origin point is a center of an upper surface of a stage, three each of two-dimensional heads are provided. The three each of two-dimensional heads include one first head and two second heads. The stage is driven, while measuring a position of the stage using three first heads that face a two-dimensional grating of a scale plate provided above the stage from the four first heads, and during the driving, difference data of measurement values of the two second heads with respect to the first head in a measurement direction are taken in for head groups to which the three first heads belong, respectively, and using the difference data, grid errors are calibrated.

Light source apparatus, optical apparatus, exposure apparatus, device manufacturing method, illuminating method, exposure method, and method for manufacturing optical apparatus
10831106 · 2020-11-10 · ·

An optical apparatus, which illuminates a first area with light from a light source while the first area is longer in a second direction intersecting a first direction than in the first direction, includes a collector optical member which is arranged in an optical path between the light source and the first area, and condenses the light from the light source to form a second area in a predetermined plane, the second area being longer in a fourth direction intersecting a third direction than in the third direction; and a first fly's eye optical member which is provided within the predetermined plane including the second area, and has a plurality of first optical elements guiding the light of the collector optical member to the first area.

Chemistries for Biocompatible Additive Nanolithography
20200347267 · 2020-11-05 ·

A mixed acrylate-siloxane polymer can be used to create three-dimensional (3D) structures of arbitrary shape via nanolithography. Treatment of such structures with amine (such as diamine) makes them permissive for neuronal cell adhesion and growth without need of additional modification such as poly-lysine (D or L) nor laminin.

Systems and methods for electrodepositing manganese oxide with improved rate capabilities for electrical energy storage

Systems and methods that facilitate enhancing the energy storage capabilities of MnO.sub.2 in nanowire energy storage devices such as nanowire-based capacitors or batteries.

Semiconductor Featuring Ridged Architecture
20240014262 · 2024-01-11 ·

A semiconductor, such as crystallized silicon or germanium, features top-mounted ridges. Circuits are capable of being integrated onto the ridges using modified photolithographic processes. The ridged architecture increases the usable surface area per given footprint of semiconductors. Specifically, if the preferred embodiment is adopted, the ridges increase relative surface area by 41.42%. Such an increase in surface area has numerous advantages. One advantage is that microchip footprints can be 29.29% smaller, allowing 1.41 times more microchips to be produced per wafer. Another advantage is that solar panels can contain 1.41 times more electron-shuttling junctions, thereby increasing overall sunlight harnessing, electrical conversion, and panel efficiency by 41.42%.

LITHOGRAPHY SYSTEM AND METHOD THEREOF

A method includes providing a plurality of fuel droplets into an EUV source vessel by a fuel droplet generator, in which the fuel droplet generator has a first portion inside the EUV source vessel and a second portion outside the EUV source vessel; generating a plurality of output signals respectively from a plurality of oscillation sensors on the fuel droplet generator; determining whether the output signals are acceptable; and determining whether an unwanted oscillation originates from the first portion of the fuel droplet generator or the second portion of the fuel droplet generator when the output signals is determined as unacceptable.

Method and system for nanoscale data recording

A super-resolution system for nano-patterning is disclosed, comprising an exposure head that enables a super-resolution patterning exposures. The super-resolution exposures are carried out using electromagnetic radiation and plasmonic structures, and in some embodiments, plasmonic structures having specially designed super-resolution apertures, of which the bow-tie and C-aperture are examples. These apertures create small but bright images in the near-field transmission pattern. A writing head comprising one or more of these apertures is held in close proximity to a medium for patterning. In some embodiments, a data processing system is provided to re-interpret the data to be patterned into a set of modulation signals used to drive the multiple individual channels and multiple exposures, and a detection means is provided to verify the data as written.

APPARATUS AND METHOD FOR REPAIRING A PHOTOLITHOGRAPHIC MASK
20200249564 · 2020-08-06 ·

The present application relates to an apparatus for processing a photolithographic mask, said apparatus comprising: (a) at least one time-varying particle beam, which is embodied for a local deposition reaction and/or a local etching reaction on the photolithographic mask; (b) at least one first means for providing at least one precursor gas, wherein the precursor gas is embodied to interact with the particle beam during the local deposition reaction and/or the local etching reaction; and (c) at least one second means, which reduces a mean angle of incidence () between the time-varying particle beam and a surface of the photolithographic mask.

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
20200233312 · 2020-07-23 ·

A method of manufacturing a semiconductor device includes: providing a first photoresist pattern on a wafer; measuring an overlay of the first photoresist pattern; generating a first overlay model function by a first overlay regression analysis of the measured overlay; and generating a second overlay model function by a second overlay regression analysis of a difference between the measured overlay and the first overlay model function.

Pellicle for photomask and exposure apparatus including the pellicle

Provided are a pellicle for a photomask, which protects the photomask from external contamination and an exposure apparatus including the pellicle for the photomask. The pellicle for the photomask includes a pellicle membrane provided spaced apart from the photomask. The pellicle membrane includes a semiconductor having a two-dimensional (2D) crystalline structure.