A method of monitoring operations of a set of ICs. The method loads a first set of configuration data into a first IC for configuring a group of configurable circuits of the first IC to perform operations of a user design. The method receives a definition of an event based on values of a set of signals in the user design and a set of corresponding actions to take when the event occurs. The set of signals includes at least one signal received from a second IC. The method generates an incremental second set of configuration data based on the definition of the event and the set of corresponding actions. While the first IC is performing the operations of the user design, the method loads the incremental second set of configuration data into the first IC and monitors the signals received from the second IC at the first IC.

In an approach for testing the operations of a host system during a host system migration, a terminal agent exchanges messages already exchanged between the current host system and a terminal with the new host system. A manual operation replay unit replays messages generated by manual operations among the messages sent to the current host system by the terminal. An automatic response unit automatically generates a response message for messages received from the new host system. The automatic response unit also generates screen data for a screen displayed on the terminal on the basis of messages received from the new host system. A comparison unit compares and evaluates screen data generated by the automatic response unit and screen data from a screen generated by the terminal on the basis of messages received from the current host system.

Efficient and effective testing systems and methods are presented. In one embodiment, a system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester is configured to enable hot add of one of the plurality of DUTs without interfering with testing of the other DUTS. In one exemplary implementation, the DUTs are memory devices and the DUTs can operate as extended memory. An added DUT can be automatically recognized by a host in a way that is transparent to users (e.g., BIOS can direct detection of characteristics of an added DUT, etc.). The tester automatically can direct the hot add in response to a user trigger.

Efficient and effective testing systems and methods are presented. In one embodiment, a testing system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester manages testing of the plurality of DUTs, including managing CXL protocol aspects of the testing. In one exemplary implementation, the tester prevents testing of a first one of the plurality of DUTs from detrimentally interfering with testing of a second one of the plurality of DUTs.

A server management method, apparatus and system, an electronic device and a non-transitory readable storage medium are provided by the present application. The server management system includes a target physical interface, a baseboard management controller (BMC) monitoring management chip, and a state control switcher, wherein the BMC monitoring management chip includes a serial port function interface and a network function interface; the BMC monitoring management chip is connected to the target physical interface through the serial port function interface, and the target physical interface operates in a serial port management mode; the BMC monitoring management chip is connected to the target physical interface through the network function interface, and the target physical interface operates in a network management mode.

The present disclosure generally relates to improved host memory buffer (HMB) segment selection at the initialization phase. Rather than selecting an HMB segment strictly on one parameter, the selection process will consider multiple factors of the HMB segments. Instead of just selecting a HMB segments based on the size of the HMB segment, the data storage device will perform some basic performance measurements on the provided HMB segments before selecting HMB segments. The selection will be based also on the performance results from the various experiments. The experiments are performed in the initialization phase so the performance of the solid state drive (SSD) will not be impacted. The basic experiments include read, write, and mixed operations toward the HMB segments while measuring the performance and QoS.

Systems and methods include an Information Handling System (IHS) that is adapted to diagnose root causes of issues reported by hardware and/or software of the IHS. Telemetry is monitored that specifies operating status information for hardware components of the IHS. Stress event are detected that are related to the hardware components. One or more stress tests are identified for evaluation of each hardware component that is related to stress event. While monitoring the telemetry, the stress tests are conducted in order to replicate the detected stress event. When the detected stress event is replicated, a root cause hardware component of the IHS is determined based on machine learning evaluation of the telemetry generated during replication of the stress event.

Efficient and effective testing systems and methods are presented. In one embodiment, a test system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester includes a direct access device (DAX) interface that prevents corruption of DUTs. In one exemplary implementation, the tester isolates testing of a particular CXL enabled DUT from undesirable interference and corruption. The tester can prevent inappropriate writing over the DUT's memory. The DUTs reside in the separate per-device space of a Linux operating system rather than an extension of memory space. One of the plurality of DUTs can be a CXL type 3 memory expander device. In one exemplary implementation, the direct access device (DAX) interface creates a unique DAX instance for each individual DUT included in the plurality of DUTs

Embodiments of the present invention provide a fast correlation (FASTCO) extension module that can couple various components for device testing and quickly correlate measurements of bench equipment with measurements of ATEs for more accurate and efficient device testing. Moreover, the FASTCO modules disclosed herein allow the same test fixtures and load board to be used by both the ATE and bench equipment, which significantly simplifies the correlation process. Moreover, a high-level programming language can be used to generate commands and data to control the FASTCO modules for routing signals to various components, such as the automated test equipment (ATE), any bench equipment (e.g., a signal generator, spectrum analyzer, etc.), DUTs, etc., and the routing can be managed automatically by the ATE according to a test program, for example.

Methods, apparatus, and processor-readable storage media for determining configurations to be used in system testing processes using machine learning techniques are provided herein. An example computer-implemented method includes obtaining, from multiple data sources, configuration information associated with at least one system; filtering out a subset of the configuration information based at least in part on at least one user request related to testing of at least a portion of the at least one system; determining at least a portion of the subset of the configuration information to be used in the testing of the at least a portion of the at least one system by processing the subset of the configuration information using one or more machine learning techniques; and performing one or more automated actions based on the determined at least a portion of the subset of the configuration information to be used in the testing.