Manufacturers perform tests on chips before the chips are shipped to customers. However, defects can occur on a chip after the manufacturer testing and when the chips are used in a system or device. The defects can occur due to aging or the environment in which the chip is employed and can be critical; especially when the chips are used in systems such as autonomous vehicles. To verify the structural integrity of the IC during the lifetime of the product, an in-system test (IST) is disclosed. The IST enables self-testing mechanisms for an IC in working systems. The IST mechanisms provide structural testing of the ICs when in a functional system and at a manufacturer's level of testing. Unlike ATE tests that are running on a separate environment, the IST provides the ability to go from a functional world view to a test mode.

Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.

An automated evaluation of test logs for the testing of telecommunications equipment includes a probabilistic model that links possible events in a test log with possible causes for the event. Probability values for possible causes are calculated from the probabilistic model and a search result, and a reference to a possible cause is provided in an output based upon the calculated probability values.

A system and method for inspecting system state during testing includes determining one or more inspection modules for examining respective portions of a state of the system using a test inspector, initializing each of the inspection modules, saving the respective portions of the state of the system using the inspection modules, executing a test of the system, checking the respective portions of the state of the system using the inspection modules, and repeating the saving, executing, and checking for each additional test of the system. The test inspector is executed by one or more processors of the system. In some examples, saving a first one of the respective portions of the state of the system includes determining state variables and corresponding values associated with the first respective portion of the state of the system and saving the state variables and corresponding values in a state repository.

An information processing device includes a processor configured to perform a diagnosis of hardware of the information processing device. The processor is configured to generate plural pieces of failure information. The plural pieces of failure information are classified into groups corresponding to different importance levels. The processor is configured to store the plural pieces of failure information in consecutive storage areas. The consecutive storage areas are divided into storage sections corresponding to the respective groups in order of importance level. The processor is configured to store first piece of failure information in a head of a second storage section in absence of free areas in first storage section. The first storage section is secured for a first group including the first piece of failure information. The second storage section is secured for a second group corresponding to a second importance level lower than the first importance level by one level.

A method, system, and computer program product for performing user-initiated logging and auto-correction in hardware/software systems. Embodiments commence upon identifying a set of test points and respective instrumentation components, then determining logging capabilities of the instrumentation components. The nature and extent of the capabilities and configuration of the components aid in generating labels to describe the various logging capabilities. The labels are then used in a user interface so as to obtain user-configurable settings which are also used in determining auto-correction actions. A measurement taken at a testpoint may result in detection of an occurrence of a certain condition, and auto-correction steps can be taken by retrieving a rulebase comprising a set of conditions corresponding to one or more measurements, and corrective actions corresponding to the one or more conditions. Detection of a condition can automatically invoke any number of processes to apply a corrective action and/or emit a recommendation.

A device configured to periodically monitor operational activity of hardware components within a computing system infrastructure. The device is further configured to detect an issue that is associated with a hardware component, to identify commands that are sent to the hardware component to resolve the first issue, and to identify a test environment configuration for simulating the effect of sending the commands to the hardware component on the computing system infrastructure. The device is further configured to generate a solution script based on the identified commands and a testing script based on the identified test environment configuration, and to store an association between the first issue, the solution script, and the testing script in a script map.

A system includes a host and a display. The host includes a programmable logic device (PIP), a baseboard management controller (BMC) and a switch. The PLD performs a power-on procedure based on a power-on sequence code, generates variable character information in the power-on procedure, and fills the variable character information into a variable field in a preset log text file to result in an updated log text file. When it is determined that the power-on procedure is not normally completed, the PLD controls the switch to switch to a debug mode, and transmits a video signal containing debug information corresponding to the updated log text file to the switch so that the video signal is outputted to the display.

Systems and methods for replacing and testing a data storage device are disclosed. In disclosed embodiments, a system including a data storage array (DSA) including a plurality of data storage devices (DSDs) in an enclosure. The system further includes an I/O server coupling the DSA to a client node and configured to provide data access between the client node and the DSA. The system further includes a management server coupled to the DSA, configured to detect a failed DSD in the DSA, detect a replacement DSD in the enclosure that replaces the failed DSD, and add the replacement DSD to a logical path of the DSA. The management server is further configured to display an indication of a state of the DSA based on the comparing.