An apparatus includes operational circuitry and Hardware Diagnostics Circuitry (HDC). The HDC is configured to receive a definition of multiple trigger rules, each trigger rule specifying a respective trigger event as a function of trigger data sources in the operational circuitry, to receive a definition of (i) a pre-trigger logging set selected from among a plurality of diagnostics data sources in the operational circuitry, and (ii) for each trigger rule, a respective post-trigger logging set including a set of one or more of the diagnostics data sources, and, during operation of the operational circuitry, to log the diagnostics data sources in the pre-trigger logging set, to log the trigger data sources and to repeatedly evaluate the trigger rules, and, in response to triggering of a given trigger event by a given trigger rule, to start logging the diagnostics data sources in the post-trigger logging set of the given trigger rule.

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system comprises pre-qualifying test components, functional test components, a controller, a transceiver, and a switch. The pre-qualifying test components are configured to perform pre-qualifying testing on a device under test. The functional test components are configured to perform functional testing on the device under test. The controller is configured to direct selection between the pre-qualifying testing and functional testing. The transceiver is configured to transmit and receive signals to/from the device under test. The switch is configured to selectively couple the transceiver to the pre-qualifying test components and functional test components.

A storage device reclassification system includes a storage device reclassification subsystem coupled to a storage device that has a NAND storage subsystem and that is configured to perform first storage operations associated with a first storage device classification. The storage device reclassification subsystem performs testing operations on the NAND storage subsystem and, based on the testing operations, identifies at least one reduced capability of the NAND storage subsystem. Based on the at least one reduced capability of the NAND storage subsystem, the storage device reclassification subsystem determines at least one storage device operation modification and performs the at least one storage device operation modification on the storage device in order to configure the storage device to perform second storage operations that are different than the first storage operations and that are associated with a second storage device classification that is different than the first storage device classification.

Manufacturers perform tests on chips before the chips are shipped to customers. However, defects can occur on a chip after the manufacturer testing and when the chips are used in a system or device. The defects can occur due to aging or the environment in which the chip is employed and can be critical; especially when the chips are used in systems such as autonomous vehicles. To verify the structural integrity of the IC during the lifetime of the product, an in-system test (IST) is disclosed. The IST enables self-testing mechanisms for an IC in working systems. The IST mechanisms provide structural testing of the ICs when in a functional system and at a manufacturer's level of testing. Unlike ATE tests that are running on a separate environment, the IST provides the ability to go from a functional world view to a test mode.

Techniques for testing semiconductor devices include a semiconductor device having a plurality of components, a test bus, and a test data transfer unit. The test data transfer unit receives, from a host computer, configuration information for performing a test of the semiconductor device, reads, via a high-speed data transfer link, test data associated with the test from memory of the host computer using direct memory access, sends the test data to the plurality of components via the test bus, causes one or more operations to be performed on the semiconductor device to effect at least a portion of the test, and after the one or more operations have completed, retrieves test results of the at least a portion of the test from the test bus and stores, via the high-speed data transfer link, the test results in the memory of the host computer using direct memory access.

A data processing system comprises a plurality of reconfigurable processors including a first reconfigurable processor and additional reconfigurable processors, a plurality of buffers in a shared memory accessible to the first reconfigurable processor and the additional reconfigurable processors, and runtime logic configured to execute one or more configuration files for applications using the first reconfigurable processor and the additional reconfigurable processors. Execution of the configuration files includes receiving data from the first reconfigurable processor and providing the data to at least one of the additional reconfigurable processors, and receiving data from the at least one of the additional reconfigurable processors and providing the data to the first reconfigurable processor.

A data processing system may include: a host; and a memory system including a plurality of memory units and a controller coupled to the plurality of memory units. The controller may include a memory manager suitable for acquiring characteristic data from serial presence detect (SPD) components in the plurality of memory units when power is supplied, providing the characteristic data to the host, setting an operation mode of each of the plurality of memory units based on the characteristic data, and performing memory training, and the host may perform interface training with the controller.

A method for testing a technical system. The method includes: tests are carried out with the aid of a simulation of the system, the tests are evaluated with respect to a fulfillment measure of a quantitative requirement on the system and an error measure of the simulation, on the basis of the fulfillment measure and error measure, a classification of the tests as either reliable or unreliable is carried out, and a test database is improved on the basis of the classification.

An automated test platform is disclosed for use in developing and troubleshooting customized software for multimedia content receivers. The automated test platform allows developers to script test cases that permit interaction with multiple content receivers at the same time. The test platform can be applied generally to any client-server system. The automated test platform is used to create scripts, run the scripts on multiple content receivers, and view test results. A graphical user interface (GUI) is provided that allows technicians without any programming experience to build and run complex interactive test sequences in a modular fashion. Such an automated test platform can be used to test cable and satellite television set top boxes, as well as DVD players, streaming media receivers, and game consoles.

A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.