A method of identifying error patterns during automated device testing comprises receiving a data pattern from a plurality of capture modules programmed on a programmable logic device, wherein the plurality of capture modules are programmable and operable to selectively capture data traffic to be monitored, and wherein the data traffic comprises a flow of traffic between a DUT and the programmable logic device. The method further comprises comparing the data pattern with known signatures in an error signature database. Also, the method comprises correlating the data pattern with one or more matching known signatures in the error signature database and assigning a score to each of the one or more matching known signatures in the error signature database based a level of correlation.

In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Method, system, storage medium and device for stress test of the baseboard management controllers are provided. In the method, serial numbers of servers under test and physical addresses of baseboard management controllers of the servers under test are acquired and stored. The baseboard management controllers are determined according to the stored serial numbers and the physical addresses, and the stress test is performed on the baseboard management controllers of the servers under test based on multi threads in one-to-one correspondence. Therefore, the technical effect of remotely performing the stress tests on the baseboard management controllers of the servers in batches can be achieved.

A combined data processing unit (DPU) and server solution with DPU operating system (OS) integration is described. A DPU OS is executed on a DPU or other computing device, where the DPU OS exercises secure calls provided by a DPU's trusted firmware component, that may be invoked by DPU OS components to abstract DPU vendor-specific and server vendor-specific integration details. An invocation of one of the secure calls made on the DPU to communicate with its associated server computing device is identified. In an instance in which the one of the secure calls is invoked, the secure call invoked is translated into a call or request specific to an architecture of the server computing device and the call is performed, which may include sending a signal to the server computing device in a format interpretable by the server computing device.

A combined data processing unit (DPU) and server solution with DPU operating system (OS) integration is described. A DPU OS is executed on a DPU or other computing device, where the DPU OS exercises secure calls provided by a DPU's trusted firmware component, that may be invoked by DPU OS components to abstract DPU vendor-specific and server vendor-specific integration details. An invocation of one of the secure calls made on the DPU to communicate with its associated server computing device is identified. In an instance in which the one of the secure calls is invoked, the secure call invoked is translated into a call or request specific to an architecture of the server computing device and the call is performed, which may include sending a signal to the server computing device in a format interpretable by the server computing device.

A method for diagnosing a cause of failure using automated test equipment (ATE) comprises configuring a plurality of capture modules in a programmable logic device using a graphical user interface (GUI) associated with a monitoring application. The method further comprises monitoring data traffic between a device under test (DUT) and the programmable logic device using the plurality of capture modules, wherein the plurality of capture modules are programmable and operable to selectively capture data traffic to be monitored. Further, the method comprises retrieving results associated with the monitoring from respective memories associated with each of the plurality of capture modules into the monitoring application and analyzing the results upon retrieval.

Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes executing a voltage characterization service for a processing device of a computing apparatus to determine at least one supply voltage for the processing device, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, determining at least one resultant supply voltage.

Power reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method includes executing a voltage characterization service for a processing device of a computing apparatus to determine at least one supply voltage for the processing device, the voltage characterization service comprising a functional test that exercises the processing device at iteratively adjusted voltages in context with associated system elements of the computing apparatus. During execution of the voltage characterization service, the method includes monitoring for operational failures of at least the processing device, and responsive to the operational failures, determining at least one resultant supply voltage.

A method of operating a storage device includes sensing a standby current flowing through the storage device, determining based on the sensed standby current and at least one reference value whether a product abnormality has occurred within the storage device, and when it is determined the product abnormality has occurred, performing a step-wise control operation in which two or more control processes associated with an operation of the storage device are sequentially executed.

A method for diagnosing a root cause of failure using automated test equipment is disclosed. The method comprises monitoring data traffic associated with testing a device under test (DUT) in the automated test equipment using a plurality capture modules, wherein the plurality of capture modules are programmed onto a programmable logic device, wherein the programmable logic device is controlled by a system controller and is operable to generate commands and data to test the DUT, wherein the plurality of capture modules are operable to selectively capture the data traffic to be monitored, and wherein the data traffic monitored comprises a flow of traffic between the DUT and the system controller. The method further comprises saving results associated with the monitoring in respective memories associated with each of the plurality of capture modules. Further, the method comprises transmitting the results upon request to an application program executing on the system controller.