A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

One embodiment of the present invention sets forth a technique for testing microservices in distributed computing systems. The technique includes routing a first traffic sample associated with request traffic from one or more client devices to a first instance of a first service implemented in a distributed computing system, wherein the first instance generates a first plurality of request responses in response to a first plurality of data requests included in the first traffic sample and transmits the first plurality of request responses to a second service included in the sequence of services, and routing a second traffic sample associated with the request traffic to a second instance of the first service, wherein the second instance generates a second plurality of request responses in response to a second plurality of data requests included in the second traffic sample and transmits the second plurality of request responses to the second service.

One embodiment of the present invention sets forth a technique for testing microservices in distributed computing systems. The technique includes routing a first traffic sample associated with request traffic from one or more client devices to a first instance of a first service implemented in a distributed computing system, wherein the first instance generates a first plurality of request responses in response to a first plurality of data requests included in the first traffic sample and transmits the first plurality of request responses to a second service included in the sequence of services, and routing a second traffic sample associated with the request traffic to a second instance of the first service, wherein the second instance generates a second plurality of request responses in response to a second plurality of data requests included in the second traffic sample and transmits the second plurality of request responses to the second service.

A technique includes receiving, by a cluster management controller, data representing results of a plurality of performance tests that are conducted on a plurality of processors that are associated with the plurality of computing nodes of a cluster. The technique includes, pursuant to block, based on the data representing the results, selecting a lead processor of the plurality of processors; and communicating, by the cluster management controller, with the plurality of computing nodes to regulate core and un-core operating frequencies of the plurality of processors. Communicating with the plurality of computer nodes includes communicating data representing a core operating frequency of the lead processor and an un-core operating frequency of the lead processor.

In one embodiment, an apparatus includes a controller to couple between a system on chip (SoC) and an external connector of a platform. The controller may include: a digitizer to digitize platform telemetry information of the platform; and a control circuit to receive a command from a debug test system and direct the platform telemetry information to a destination in response to the command. Other embodiments are described and claimed.

In one embodiment, an apparatus includes a controller to couple between a system on chip (SoC) and an external connector of a platform. The controller may include: a digitizer to digitize platform telemetry information of the platform; and a control circuit to receive a command from a debug test system and direct the platform telemetry information to a destination in response to the command. Other embodiments are described and claimed.

Embodiments of information handling systems (IHSs) and methods are provided herein to automatically detect failure(s) on one or more power rails provided on a system motherboard of an IHS. One embodiment of such a method may include determining if a power rail test should be performed each time an information handling system (IHS) is powered on or rebooted. If a power rail test is performed, the method may perform a current measurement for each of the power rails separately to obtain actual current values for each power rail, compare the actual current values obtained for each power rail to expected current values stored for each power rail, and detect a failure on at least one of the power rails if the actual current value obtained for the at least one power rail differs from the expected current value stored for the at least one power rail by more than a predetermined percentage or amount.

Disclosed herein are methods, systems, and processes for burn process data retrieval and notification. A burn process that is ongoing and that is initiated to generate burn data associated with a testing computing device is detected at a computing device. A determination is made that the burn data has been generated by the testing computing device as part of the burn process. The burn data associated with the burn process generated by the testing computing device is then retrieved.

Embodiments are directed to identifying intermittent faults in a unit under test (UUT), and to mapping interconnections between connection points in a UUT. In one scenario, a testing apparatus includes an interface for electrically attaching the UUT to a testing module and an input circuit for supplying an individual stimulus signal to each unpowered connection point in the UUT. The testing apparatus also includes an active intermittence detecting circuit electronically connected to each connecting point in the UUT. A stimulus signal is applied simultaneously to each connecting line, so that an intermittent fault on any line will generate a trigger on those connection lines that have an intermittent fault. The testing apparatus also includes a logic circuit that determines when a trigger has been generated on the UUT, determines the connection point of the trigger, assigns a timestamp to the intermittent fault, and generates reporting data for the intermittent fault.