Patent classifications
G06F30/38
Method for translation of analog circuit netlist to a digital model and elimination of zero delay loops within the digital model
An analog circuit netlist translation system is disclosed. The analog circuit netlist translation system comprises a model translation module configured to receive an analog circuit netlist; and transform the analog circuit netlist into a digital model. In some embodiments, the digital model comprises a set of zero-delay loops. The analog circuit netlist translation system further comprises a translation methodology module configured to determine a set of closed loop values respectively associated with the set of zero-delay loops, in order to eliminate the set of zero-delay loops within the digital model. In some embodiments, the set of closed loop values are determined by the translation methodology module in a single timeslot.
Method for translation of analog circuit netlist to a digital model and elimination of zero delay loops within the digital model
An analog circuit netlist translation system is disclosed. The analog circuit netlist translation system comprises a model translation module configured to receive an analog circuit netlist; and transform the analog circuit netlist into a digital model. In some embodiments, the digital model comprises a set of zero-delay loops. The analog circuit netlist translation system further comprises a translation methodology module configured to determine a set of closed loop values respectively associated with the set of zero-delay loops, in order to eliminate the set of zero-delay loops within the digital model. In some embodiments, the set of closed loop values are determined by the translation methodology module in a single timeslot.
Mixed-signal simulation for complex design topologies
A computing system implementing a design verification system can elaborate a mixed-signal circuit design having a complex sandwich hierarchy using a standard digital solver and a standard analog solver, as opposed to a tightly coupled custom elaboration engine. The design verification system can parse the mixed-signal circuit design to identify analog design blocks and flatten the analog design blocks into the structural proxy blocks having parameter connections to digital design blocks in the mixed-signal circuit design. The design verification system can replace an analog portion of the mixed-signal circuit design with the structural proxy blocks and elaborate the structural proxy blocks and digital design blocks associated with a digital portion of the mixed-signal circuit design. The design verification system can elaborate the analog portion of the mixed-signal design and simulate the elaborated analog portion with an analog simulator and the elaborated digital portion with a digital simulator.
Mixed-signal simulation for complex design topologies
A computing system implementing a design verification system can elaborate a mixed-signal circuit design having a complex sandwich hierarchy using a standard digital solver and a standard analog solver, as opposed to a tightly coupled custom elaboration engine. The design verification system can parse the mixed-signal circuit design to identify analog design blocks and flatten the analog design blocks into the structural proxy blocks having parameter connections to digital design blocks in the mixed-signal circuit design. The design verification system can replace an analog portion of the mixed-signal circuit design with the structural proxy blocks and elaborate the structural proxy blocks and digital design blocks associated with a digital portion of the mixed-signal circuit design. The design verification system can elaborate the analog portion of the mixed-signal design and simulate the elaborated analog portion with an analog simulator and the elaborated digital portion with a digital simulator.
System, method, and computer program product for mixed signal verification
The present disclosure relates to a computer-implemented method for mixed signal design verification. Embodiments may include receiving, using a processor, an electronic circuit design and compiling and elaborating the electronic circuit design. Embodiments may also include simulating the electronic circuit design and updating, during the simulating, a System Verilog User-Defined Resolution function (“SV-UDR”) associated with the electronic circuit design.
System, method, and computer program product for mixed signal verification
The present disclosure relates to a computer-implemented method for mixed signal design verification. Embodiments may include receiving, using a processor, an electronic circuit design and compiling and elaborating the electronic circuit design. Embodiments may also include simulating the electronic circuit design and updating, during the simulating, a System Verilog User-Defined Resolution function (“SV-UDR”) associated with the electronic circuit design.
HORIZONTAL AND VERTICAL ASSERTIONS FOR VALIDATION OF NEUROMORPHIC HARDWARE
Simulation and validation of neural network systems is provided. In various embodiments, a description of an artificial neural network is read. A directed graph is constructed comprising a plurality of edges and a plurality of nodes, each of the plurality of edges corresponding to a queue and each of the plurality of nodes corresponding to a computing function of the neural network system. A graph state is updated over a plurality of time steps according to the description of the neural network, the graph state being defined by the contents of each of the plurality of queues. Each of a plurality of assertions is tested at each of the plurality of time steps, each of the plurality of assertions being a function of a subset of the graph state. Invalidity of the neural network system is indicated for each violation of one of the plurality of assertions.
System for facilitating secure communication in system-on-chips
A system to facilitate communication of a critical signal between functional circuitries of a system-on-chip utilizes a dynamic pattern to securely communicate the critical signal. The system includes selection and comparison circuits. The selection circuit is configured to select and output a set of dynamic pattern bits or a set of fixed reference bits, based on a logic state of the critical signal that is received from one functional circuitry. The comparison circuit is configured to output an output signal based on the set of dynamic pattern bits, and a set of intermediate bits that is derived from the set of dynamic pattern bits or the set of fixed reference bits. The output signal is provided to the other functional circuitry when a logic state of the output signal matches the logic state of the critical signal, thereby securely communicating the critical signal to the other functional circuitry.
System for facilitating secure communication in system-on-chips
A system to facilitate communication of a critical signal between functional circuitries of a system-on-chip utilizes a dynamic pattern to securely communicate the critical signal. The system includes selection and comparison circuits. The selection circuit is configured to select and output a set of dynamic pattern bits or a set of fixed reference bits, based on a logic state of the critical signal that is received from one functional circuitry. The comparison circuit is configured to output an output signal based on the set of dynamic pattern bits, and a set of intermediate bits that is derived from the set of dynamic pattern bits or the set of fixed reference bits. The output signal is provided to the other functional circuitry when a logic state of the output signal matches the logic state of the critical signal, thereby securely communicating the critical signal to the other functional circuitry.
DEFECT WEIGH FORMULAS FOR ANALOG DEFECT SIMULATION
A method, apparatus, and/or computer program product can performing an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.