A memory module includes a module substrate, a plurality of memory devices, a first power line, and a second power line. The memory devices are mounted on the module substrate. Each of the memory devices includes a power management member. The first power line may be arranged in the module substrate to provide each of the memory devices with power. The second power line may be electrically connected between the power management members of adjacent memory devices to control and share the power provided to the adjacent memory devices.

Methods, systems, and devices for varying a time average for feedback of a memory system are described. An apparatus may include a voltage supply, a memory array, and a regulator coupled with the voltage supply and memory array and configured to supply a first voltage received from the voltage supply to the memory array. The apparatus may also include a voltage sensor configured to measure a second voltage of the memory array and a digital feedback circuit coupled with the memory array and regulator and configured to generate feedback comprising information averaged over a duration based at least in part on the second voltage measured by the voltage sensor and to transmit an analog signal to the regulator based at least in part on the feedback.

A memory device may include a pin for communicating feedback regarding a supply voltage to a power management component, such as a power management integrated circuit (PMIC). The memory device may bias the pin to a first voltage indicating that a supply voltage is within a target range. The memory device may subsequently determine that a supply voltage is outside the target range and transition the voltage at the pin from the first voltage to a second voltage indicating that the supply voltage is outside the target range. The memory device may select the second voltage based on whether the supply voltage is above or below the target range.

Disclosed is a power module which includes a first power module that generates a first output current based on a first input voltage, a second power module that generates a second output voltage based on a second input voltage, generates a second output current based on the second output voltage, and generates the second output current when a level of the first input voltage is smaller than a level of a reference voltage, and a voltage controller that generates a feedback signal for regulating at least one of the level of the first input voltage and a level of the second input voltage based on current information about a current flowing in the power module.

A circuit for monitoring an output voltage of a voltage supply is shown. The circuit comprises a microcontroller for controlling a system, a shift register and a diagnostic circuit. The microcontroller has an input for receiving serial output data of the shift register, wherein the input is connected to the serial output of the shift register. The diagnostic circuit is designed to diagnose the voltage supply and has a diagnostic output which is connected to a data input of the shift register for inputting a diagnostic bit.

System on a Chip (SoC) integrated circuits are configured to reduce Static Random-Access Memory (SRAM) power leakage. For example, SoCs configured to reduce SRAM power leakage may form part of an artificial reality system including at least one head mounted display. Power switching logic on the SoC includes a first power gating transistor that supplies a first, higher voltage to an SRAM array when the SRAM array is in an active state, and a third power gating transistor that isolates a second power gating transistor from the first, higher voltage when the SRAM array is in the active state. The second power gating transistor further supplies a second, lower voltage to the SRAM array when the SRAM array is in a deep retention state, such that SRAM power leakage is reduced in the deep retention state.

A semiconductor device and an operation method capable of operating with high reliability are provided. A voltage monitoring circuit (100) of the disclosure includes: a power-on detection part (110) configurated to detect whether a supply voltage (EXVDD) of an external power supply terminal has reached a power-on voltage level; a timer (120) configurated to measure a predetermined time when the power-on voltage level is detected; a through current generation part (130) configurated to generate a through current between the external power supply terminal and GND during a period when the timer (120) measures the predetermined time; and a power-off detection part (140) configurated to detect whether a drop of the supply voltage (EXVDD) has reached a power-off voltage level when the through current is generated.

A technique for managing undervoltage in a compute system is disclosed. The technique includes a method that further includes: detecting an AC undervoltage condition in the compute system; and upon detecting the AC undervoltage condition: dynamically determining a holdup time as a function of the present load; determining a monitoring period as a function of the dynamically determined holdup time; waiting for the determined monitoring period to expire; and upon expiration of the determined monitoring period, perform a shutdown process if the AC undervoltage condition persists.

Memory devices, systems including memory devices, and methods of operating memory devices and systems are provided, in which at least a subset of a non-volatile memory array is configured to behave as a volatile memory by erasing or degrading data in the event of a changed power condition such as a power-loss event, a power-off event, or a power-on event. In one embodiment of the present technology, a memory device is provided, comprising a non-volatile memory array, and circuitry configured to store one or more addresses of the non-volatile memory array, to detect a changed power condition of the memory device, and to erase or degrade data at the one or more addresses in response to detecting the changed power condition.

Methods, systems, and devices supporting an interface for refreshing non-volatile memory are described. In some examples, a host system may communicate with a memory system, where both the host system and the memory system may be included within a vehicle (e.g., an automotive system). The host system may receive an indication that the vehicle is powering down (e.g., shutting off an engine or lowering power output from a battery). The host system may switch from a first mode corresponding to a first power usage to a second mode corresponding to a second, lower power usage in response to the vehicle powering down, the second mode supporting initiation of a refresh operation at the memory device. The host system may transmit a refresh command to the memory system to refresh non-volatile memory while the vehicle is powered down if the host system is operating in the second mode of operation.