G11C5/147

MEMORY MODULE INCLUDING MODULE SUBSTRATE

A memory module includes a module substrate, a plurality of memory devices, a first power line, and a second power line. The memory devices are mounted on the module substrate. Each of the memory devices includes a power management member. The first power line may be arranged in the module substrate to provide each of the memory devices with power. The second power line may be electrically connected between the power management members of adjacent memory devices to control and share the power provided to the adjacent memory devices.

POWER MANAGEMENT INTEGRATED CIRCUIT WITH CHARGE PUMP

In an embodiment, an apparatus is disclosed that includes a power management integrated circuit (PMIC). The PMIC includes a voltage regulator supplied by a first power source and configured to generate a first output and a charge pump supplied by a second power source and configured to generate a second output. A bias voltage output of the power management integrated circuit is generated based at least in part on the first output and the second output. The charge pump is configured to adjust the second output based at least in part on a comparison between the bias voltage output and a reference voltage.

Systems And Methods For Generating A Temperature Dependent Supply Voltage
20230008041 · 2023-01-12 · ·

An integrated circuit includes a diode for generating a temperature dependent voltage, a resistor divider for generating divided voltages by dividing the temperature dependent voltage, and a multiplexer circuit for selecting one of the divided voltages as a reference voltage used for setting a supply voltage.

VARYING A TIME AVERAGE FOR FEEDBACK OF A MEMORY SYSTEM
20230215488 · 2023-07-06 ·

Methods, systems, and devices for varying a time average for feedback of a memory system are described. An apparatus may include a voltage supply, a memory array, and a regulator coupled with the voltage supply and memory array and configured to supply a first voltage received from the voltage supply to the memory array. The apparatus may also include a voltage sensor configured to measure a second voltage of the memory array and a digital feedback circuit coupled with the memory array and regulator and configured to generate feedback comprising information averaged over a duration based at least in part on the second voltage measured by the voltage sensor and to transmit an analog signal to the regulator based at least in part on the feedback.

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY DEVICE
20230215497 · 2023-07-06 · ·

In a semiconductor device 100, at least one of a first transistor and a second transistor that supply a second voltage in a step-down circuit stepping down a first voltage to the second voltage and outputting the second voltage from an output portion is configured such that the number of second contacts of a source electrode which is connected to a ground voltage or is supplied with the first voltage is larger than the number of first contacts connecting a diffusion layer and a first metal layer of a drain electrode connected to the output portion, and the number of second vias of the source electrode connected to the ground voltage or supplied with the first voltage is larger than the number of first vias connecting the first metal layer and a second metal layer of the drain electrode connected to the output portion.

Apparatuses and methods for internal voltage generating circuits

An apparatus is described. The apparatus according to an embodiment includes a voltage dividing resistor circuit formed on a semiconductor substrate and including first and second resistors and first and second selector switches. The first and second resistors and the first and second selector switches are arranged with one of first and second layouts. The first layout is such that the first and second selector switches are placed between the first and second resistors. The second layout is such that the first and second resistors are placed between the first and second selector switches.

Internal voltage generation circuit and semiconductor memory apparatus including the same
11694741 · 2023-07-04 · ·

An internal voltage generation circuit includes an enable control circuit configured to generate a final enable signal by limiting an activation time point of an enable signal to a point in time after a reset time, after the enable signal is inactivated. The internal voltage generation circuit also includes a start-up control circuit configured to perform a reset operation during the reset time and generate a start-up signal based on the final enable signal, a reference voltage generation circuit configured to generate a reference voltage based on the start-up signal, a current generation circuit configured to generate a reference current based on the reference voltage, and a voltage generation circuit configured to generate an internal voltage based on the reference current.

TEMPERATURE MANAGEMENT OF MEMORY ELEMENTS OF AN INFORMATION HANDLING SYSTEM
20230005564 · 2023-01-05 ·

Managing a temperature of a memory element of an information handling system, the method comprising: identifying a lower temperature boundary of the memory element; determining an initial temperature of the memory element; determining whether the initial temperature is less than the lower temperature boundary; in response to determining that the initial temperature is less than the lower temperature boundary: performing a series of repeated burst refresh operations at the memory element; after performing the series of repeated burst refreshes operations, determining an updated temperature of memory element; determining whether the updated temperature is less than the lower temperature boundary; and in response to determining that the updated temperature is greater than the lower temperature boundary, performing a normal boot of the memory element.

FEEDBACK FOR POWER MANAGEMENT OF A MEMORY DIE USING A DEDICATED PIN
20250231607 · 2025-07-17 ·

A memory device may include a pin for communicating feedback regarding a supply voltage to a power management component, such as a power management integrated circuit (PMIC). The memory device may bias the pin to a first voltage indicating that a supply voltage is within a target range. The memory device may subsequently determine that a supply voltage is outside the target range and transition the voltage at the pin from the first voltage to a second voltage indicating that the supply voltage is outside the target range. The memory device may select the second voltage based on whether the supply voltage is above or below the target range.

Charge pump with wide current range
11545984 · 2023-01-03 · ·

A charge pump has a first branch that includes a first node connected between a first pull-up switch and a first pull-down switch and a second branch that includes a second node connected between a second pull-up switch and a second pull-down switch. The second branch is connected in parallel with the first branch. The charge pump has a voltage equalization circuit to equalize a first voltage at the first node and a second voltage at the second node. A third branch includes a third node that is connected between a third pull-up switch and a third pull-down switch. The third node is connected to the second node. The third pull-up switch and the first pull-up switch are controlled by a common pull-up signal. The third pull-down switch and the first pull-down switch are controlled by a common pull-down signal.